DE69213789D1 - Spektralapparat - Google Patents

Spektralapparat

Info

Publication number
DE69213789D1
DE69213789D1 DE69213789T DE69213789T DE69213789D1 DE 69213789 D1 DE69213789 D1 DE 69213789D1 DE 69213789 T DE69213789 T DE 69213789T DE 69213789 T DE69213789 T DE 69213789T DE 69213789 D1 DE69213789 D1 DE 69213789D1
Authority
DE
Germany
Prior art keywords
spectral apparatus
spectral
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69213789T
Other languages
English (en)
Other versions
DE69213789T2 (de
Inventor
Michel Delhaye Michel Delhaye
Jacques Barbillat
Silva Edouard Da
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dilor
Original Assignee
Dilor
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dilor filed Critical Dilor
Application granted granted Critical
Publication of DE69213789D1 publication Critical patent/DE69213789D1/de
Publication of DE69213789T2 publication Critical patent/DE69213789T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G01N2021/653—Coherent methods [CARS]
    • G01N2021/656—Raman microprobe
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE1992613789 1991-03-04 1992-01-20 Spektralapparat Expired - Fee Related DE69213789T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9102558A FR2673718B1 (fr) 1991-03-04 1991-03-04 Appareil de spectrometrie raman.

Publications (2)

Publication Number Publication Date
DE69213789D1 true DE69213789D1 (de) 1996-10-24
DE69213789T2 DE69213789T2 (de) 1997-03-27

Family

ID=9410300

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1992613789 Expired - Fee Related DE69213789T2 (de) 1991-03-04 1992-01-20 Spektralapparat

Country Status (3)

Country Link
EP (1) EP0502752B1 (de)
DE (1) DE69213789T2 (de)
FR (1) FR2673718B1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1207414B1 (de) * 1997-10-29 2016-05-04 Motic China Group Co., Ltd. Gerät und Verfahren zur Mikroskopie unter Verwendung räumlich modulierten Lichtes
DE19923822A1 (de) * 1999-05-19 2000-11-23 Zeiss Carl Jena Gmbh Scannende Anordnung, vorzugsweise zur Erfassung von Fluoreszenzlicht
FR2797495B1 (fr) * 1999-08-11 2003-01-31 Dilor Appareil d'imagerie spectrometrique
DE102004006391A1 (de) * 2004-02-10 2005-09-01 Universität Leipzig Lichtstarke, kompakte in-situ Raman-Sonde
US8179526B2 (en) 2007-01-25 2012-05-15 Renishaw Plc Spectroscopic apparatus with dispersive device for collecting sample data in synchronism with relative movement of a focus
GB0708582D0 (en) 2007-05-03 2007-06-13 Renishaw Plc Spectroscope apparatus and methods
DE102011018725A1 (de) * 2011-04-20 2012-10-25 Carl Zeiss Jena Gmbh Optische Anordnung zur Erfassung der Lumineszenz von Proben
CN105181669B (zh) * 2015-08-13 2018-04-24 苏州优谱德精密仪器科技有限公司 液体检测装置
CN105004708B (zh) * 2015-08-13 2018-03-06 苏州优谱德精密仪器科技有限公司 液体检测装置
CN105181668B (zh) * 2015-08-13 2018-04-24 苏州优谱德精密仪器科技有限公司 液体检测系统

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2356931A1 (fr) * 1976-07-02 1978-01-27 Anvar Microsonde microscope optique moleculaire a effet raman excitee par laser
JPS53135660A (en) * 1977-04-30 1978-11-27 Olympus Optical Co Ltd Fluorescent photometric microscope using laser light
FR2449275A1 (fr) * 1979-02-13 1980-09-12 Dilor Perfectionnements a l'eclairage des monochromateurs
DE3037983C2 (de) * 1980-10-08 1983-03-31 Fa. Carl Zeiss, 7920 Heidenheim Verfahren und Vorrichtung zur lichtinduzierten rastermikroskopischen Darstellung von Probenparametern in ihrer räumlichen Verteilung
DE3422143A1 (de) * 1984-06-14 1985-12-19 Josef Prof. Dr. Bille Geraet zur wafer-inspektion
GB8531011D0 (en) * 1985-12-17 1986-01-29 Medical Res Council Confocal scanning microscope
DD279962B5 (de) * 1989-02-02 2000-11-30 Zeiss Carl Jena Gmbh Konfokales Laserrastermikroskop
US5091652A (en) * 1990-01-12 1992-02-25 The Regents Of The University Of California Laser excited confocal microscope fluorescence scanner and method

Also Published As

Publication number Publication date
EP0502752A1 (de) 1992-09-09
DE69213789T2 (de) 1997-03-27
FR2673718A1 (fr) 1992-09-11
FR2673718B1 (fr) 1993-05-14
EP0502752B1 (de) 1996-09-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee