DE69110138T2 - Verfahren zur Diagnose der Verschlechterung der Isolierung eines elektrischen Gerätes. - Google Patents

Verfahren zur Diagnose der Verschlechterung der Isolierung eines elektrischen Gerätes.

Info

Publication number
DE69110138T2
DE69110138T2 DE69110138T DE69110138T DE69110138T2 DE 69110138 T2 DE69110138 T2 DE 69110138T2 DE 69110138 T DE69110138 T DE 69110138T DE 69110138 T DE69110138 T DE 69110138T DE 69110138 T2 DE69110138 T2 DE 69110138T2
Authority
DE
Germany
Prior art keywords
diagnosing
deterioration
insulation
procedure
electrical device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69110138T
Other languages
English (en)
Other versions
DE69110138D1 (de
Inventor
Kenichiro Soma
Kazuo Kotani
Nobuju Takaoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Publication of DE69110138D1 publication Critical patent/DE69110138D1/de
Application granted granted Critical
Publication of DE69110138T2 publication Critical patent/DE69110138T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
    • G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Relating To Insulation (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
DE69110138T 1990-01-09 1991-01-02 Verfahren zur Diagnose der Verschlechterung der Isolierung eines elektrischen Gerätes. Expired - Fee Related DE69110138T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002186A JPH0619416B2 (ja) 1990-01-09 1990-01-09 絶縁診断法

Publications (2)

Publication Number Publication Date
DE69110138D1 DE69110138D1 (de) 1995-07-13
DE69110138T2 true DE69110138T2 (de) 1995-10-19

Family

ID=11522334

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69110138T Expired - Fee Related DE69110138T2 (de) 1990-01-09 1991-01-02 Verfahren zur Diagnose der Verschlechterung der Isolierung eines elektrischen Gerätes.

Country Status (3)

Country Link
EP (1) EP0437214B1 (de)
JP (1) JPH0619416B2 (de)
DE (1) DE69110138T2 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112009002541B4 (de) * 2008-10-13 2017-02-23 Lg Chem. Ltd. Vorrichtung und Verfahren zum Prüfen der Isolierung einer Zellmodulanordnung und Tester dafür

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5485151A (en) * 1993-05-06 1996-01-16 Adb-Alnaco, Inc. Airfield lighting system
US5448176A (en) * 1993-12-30 1995-09-05 The University Of Connecticut Cable fault detection using a high voltage alternating polarity DC signal superposed with a system frequency AC signal
US5648723A (en) * 1994-05-09 1997-07-15 Adb-Alnaco, Inc. Method and apparatus for separating and analyzing composite AC/DC waveforms
US5638057A (en) * 1994-05-09 1997-06-10 Adb-Alnaco, Inc. Ground fault detection and measurement system for airfield lighting system
EP0768810A1 (de) * 1995-10-09 1997-04-16 Adb-Alnaco, Inc. Erdschluss Überwachung und Messanlage für eine Flugplatzbeleuchtung
US6087836A (en) * 1997-11-18 2000-07-11 Emerson Electric Co. Apparatus for and method of monitoring the status of the insulation on the wire in a winding
US6340891B1 (en) * 1998-04-14 2002-01-22 Furukawa Electric Co., Ltd. Method of diagnosing deterioration of the insulation of an electric power cable
KR101142459B1 (ko) * 2008-10-14 2012-05-08 에스케이이노베이션 주식회사 절연파괴 측정회로
JP2019138864A (ja) * 2018-02-15 2019-08-22 東京電力ホールディングス株式会社 Ｏｆケーブルの劣化診断方法
CN109580463B (zh) * 2018-11-22 2021-08-20 国网天津市电力公司电力科学研究院 一种测量接地网腐蚀程度的方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59202073A (ja) * 1983-04-30 1984-11-15 Hitachi Cable Ltd 電力ケ−ブルの絶縁劣化診断法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112009002541B4 (de) * 2008-10-13 2017-02-23 Lg Chem. Ltd. Vorrichtung und Verfahren zum Prüfen der Isolierung einer Zellmodulanordnung und Tester dafür

Also Published As

Publication number Publication date
EP0437214B1 (de) 1995-06-07
DE69110138D1 (de) 1995-07-13
JPH0619416B2 (ja) 1994-03-16
EP0437214A2 (de) 1991-07-17
EP0437214A3 (en) 1992-05-06
JPH03206976A (ja) 1991-09-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee