DE69033932D1 - Verfahren zum selektiven Ätzen - Google Patents

Verfahren zum selektiven Ätzen

Info

Publication number
DE69033932D1
DE69033932D1 DE69033932T DE69033932T DE69033932D1 DE 69033932 D1 DE69033932 D1 DE 69033932D1 DE 69033932 T DE69033932 T DE 69033932T DE 69033932 T DE69033932 T DE 69033932T DE 69033932 D1 DE69033932 D1 DE 69033932D1
Authority
DE
Germany
Prior art keywords
etching method
selective etching
selective
etching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69033932T
Other languages
English (en)
Inventor
Jaya Bilakanti
Edward John Laskowski
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
AT&T Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AT&T Corp filed Critical AT&T Corp
Application granted granted Critical
Publication of DE69033932D1 publication Critical patent/DE69033932D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/30604Chemical etching
    • H01L21/30612Etching of AIIIBV compounds

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Weting (AREA)
  • Bipolar Transistors (AREA)
DE69033932T 1989-08-24 1990-08-17 Verfahren zum selektiven Ätzen Expired - Lifetime DE69033932D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/398,116 US4923564A (en) 1989-08-24 1989-08-24 Selective etching process

Publications (1)

Publication Number Publication Date
DE69033932D1 true DE69033932D1 (de) 2002-04-18

Family

ID=23574047

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69033932T Expired - Lifetime DE69033932D1 (de) 1989-08-24 1990-08-17 Verfahren zum selektiven Ätzen

Country Status (5)

Country Link
US (1) US4923564A (de)
EP (1) EP0414457B1 (de)
JP (1) JPH0666309B2 (de)
CA (1) CA2023712C (de)
DE (1) DE69033932D1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5406194A (en) * 1992-09-21 1995-04-11 At&T Corp. Alx Ga1-x as probe for use in electro-optic sampling
US6187515B1 (en) * 1998-05-07 2001-02-13 Trw Inc. Optical integrated circuit microbench system
TWI629720B (zh) 2015-09-30 2018-07-11 東京威力科創股份有限公司 用於濕蝕刻製程之溫度的動態控制之方法及設備

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7505134A (nl) * 1975-05-01 1976-11-03 Philips Nv Werkwijze voor het vervaardigen van een half- geleiderinrichting.

Also Published As

Publication number Publication date
JPH0666309B2 (ja) 1994-08-24
EP0414457B1 (de) 2002-03-13
JPH0391242A (ja) 1991-04-16
US4923564A (en) 1990-05-08
EP0414457A1 (de) 1991-02-27
CA2023712A1 (en) 1991-02-25
CA2023712C (en) 1993-04-06

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Legal Events

Date Code Title Description
8332 No legal effect for de