DE69026124D1 - Apparat und Methode zum gleichzeitigen Messen von elektrochemischen und Tunnel-Effekten und dazugehörige Tunnelsonde - Google Patents

Apparat und Methode zum gleichzeitigen Messen von elektrochemischen und Tunnel-Effekten und dazugehörige Tunnelsonde

Info

Publication number
DE69026124D1
DE69026124D1 DE69026124T DE69026124T DE69026124D1 DE 69026124 D1 DE69026124 D1 DE 69026124D1 DE 69026124 T DE69026124 T DE 69026124T DE 69026124 T DE69026124 T DE 69026124T DE 69026124 D1 DE69026124 D1 DE 69026124D1
Authority
DE
Germany
Prior art keywords
tunnel
electrochemical
simultaneous measurement
effects
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69026124T
Other languages
English (en)
Other versions
DE69026124T2 (de
Inventor
Eisuke Tomita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Science Corp
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Application granted granted Critical
Publication of DE69026124D1 publication Critical patent/DE69026124D1/de
Publication of DE69026124T2 publication Critical patent/DE69026124T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
    • G01Q60/16—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/02—Multiple-type SPM, i.e. involving more than one SPM techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/60—SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/875—Scanning probe structure with tip detail
    • Y10S977/879—Material

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Electrolytic Production Of Metals (AREA)
DE69026124T 1989-01-31 1990-01-18 Apparat und Methode zum gleichzeitigen Messen von elektrochemischen und Tunnel-Effekten und dazugehörige Tunnelsonde Expired - Fee Related DE69026124T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1021550A JP2814256B2 (ja) 1989-01-31 1989-01-31 電気化学測定トンネル電流同時測定装置およびトンネル探針

Publications (2)

Publication Number Publication Date
DE69026124D1 true DE69026124D1 (de) 1996-05-02
DE69026124T2 DE69026124T2 (de) 1996-08-14

Family

ID=12058105

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69026124T Expired - Fee Related DE69026124T2 (de) 1989-01-31 1990-01-18 Apparat und Methode zum gleichzeitigen Messen von elektrochemischen und Tunnel-Effekten und dazugehörige Tunnelsonde

Country Status (5)

Country Link
US (1) US5120959A (de)
EP (1) EP0381337B1 (de)
JP (1) JP2814256B2 (de)
CA (1) CA2008941C (de)
DE (1) DE69026124T2 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5155361A (en) * 1991-07-26 1992-10-13 The Arizona Board Of Regents, A Body Corporate Acting For And On Behalf Of Arizona State University Potentiostatic preparation of molecular adsorbates for scanning probe microscopy
US5476006A (en) * 1992-07-07 1995-12-19 Matsushita Electronics Corporation Crystal evaluation apparatus and crystal evaluation method
US5383354A (en) * 1993-12-27 1995-01-24 Motorola, Inc. Process for measuring surface topography using atomic force microscopy
US5440920A (en) * 1994-02-03 1995-08-15 Molecular Imaging Systems Scanning force microscope with beam tracking lens
US5753814A (en) * 1994-05-19 1998-05-19 Molecular Imaging Corporation Magnetically-oscillated probe microscope for operation in liquids
US5513518A (en) * 1994-05-19 1996-05-07 Molecular Imaging Corporation Magnetic modulation of force sensor for AC detection in an atomic force microscope
US5515719A (en) * 1994-05-19 1996-05-14 Molecular Imaging Corporation Controlled force microscope for operation in liquids
US5866805A (en) * 1994-05-19 1999-02-02 Molecular Imaging Corporation Arizona Board Of Regents Cantilevers for a magnetically driven atomic force microscope
US5750989A (en) * 1995-02-10 1998-05-12 Molecular Imaging Corporation Scanning probe microscope for use in fluids
US5675154A (en) * 1995-02-10 1997-10-07 Molecular Imaging Corporation Scanning probe microscope
US5621210A (en) * 1995-02-10 1997-04-15 Molecular Imaging Corporation Microscope for force and tunneling microscopy in liquids
US5495109A (en) * 1995-02-10 1996-02-27 Molecular Imaging Corporation Electrochemical identification of molecules in a scanning probe microscope
WO1996028837A1 (en) * 1995-03-10 1996-09-19 Molecular Imaging Corporation Hybrid control system for scanning probe microscopes
US5630932A (en) * 1995-09-06 1997-05-20 Molecular Imaging Corporation Tip etching system and method for etching platinum-containing wire
US5874668A (en) * 1995-10-24 1999-02-23 Arch Development Corporation Atomic force microscope for biological specimens
US5821545A (en) * 1995-11-07 1998-10-13 Molecular Imaging Corporation Heated stage for a scanning probe microscope
US5654546A (en) * 1995-11-07 1997-08-05 Molecular Imaging Corporation Variable temperature scanning probe microscope based on a peltier device
JP3016129B2 (ja) * 1996-04-02 2000-03-06 セイコーインスツルメンツ株式会社 微細加工方法
SE0004334D0 (sv) * 2000-11-24 2000-11-24 Sahltech Ab Electron spectroscopy
US20070023283A1 (en) * 2003-01-30 2007-02-01 Chun-Mu Huang Method for manufacturing electrochemical sensor and structure thereof
JP5097742B2 (ja) * 2009-04-07 2012-12-12 株式会社日立製作所 プローブ顕微鏡及びそれを用いた測定方法
JP2010276488A (ja) * 2009-05-29 2010-12-09 Hitachi Ltd プローブ顕微鏡
CN111157769A (zh) * 2020-01-06 2020-05-15 广州大学 一种电致化学发光成像系统及其成像方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU837712A1 (ru) * 1979-10-26 1981-06-15 Предприятие П/Я А-3724 Материал дл электрода-инструмента
JPS63256138A (ja) * 1987-04-14 1988-10-24 Tanaka Kikinzoku Kogyo Kk 白金担持触媒及びその製造方法
US4868396A (en) * 1987-10-13 1989-09-19 Arizona Board Of Regents, Arizona State University Cell and substrate for electrochemical STM studies
JPH06105262B2 (ja) * 1987-11-27 1994-12-21 セイコー電子工業株式会社 電気化学測定およびトンネル電流同時測定方法および装置
GB8818445D0 (en) * 1988-08-03 1988-09-07 Jones B L Stm probe

Also Published As

Publication number Publication date
CA2008941C (en) 1999-12-07
EP0381337B1 (de) 1996-03-27
EP0381337A3 (de) 1991-02-27
DE69026124T2 (de) 1996-08-14
JPH02201252A (ja) 1990-08-09
CA2008941A1 (en) 1990-07-31
US5120959A (en) 1992-06-09
JP2814256B2 (ja) 1998-10-22
EP0381337A2 (de) 1990-08-08

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: SII NANO TECHNOLOGY INC., CHIBA, JP

8339 Ceased/non-payment of the annual fee