DE69004860D1 - Vorrichtung zur Umrechnung von Einheiten für eine interferometrische Messmaschine mit Laser. - Google Patents

Vorrichtung zur Umrechnung von Einheiten für eine interferometrische Messmaschine mit Laser.

Info

Publication number
DE69004860D1
DE69004860D1 DE90110371T DE69004860T DE69004860D1 DE 69004860 D1 DE69004860 D1 DE 69004860D1 DE 90110371 T DE90110371 T DE 90110371T DE 69004860 T DE69004860 T DE 69004860T DE 69004860 D1 DE69004860 D1 DE 69004860D1
Authority
DE
Germany
Prior art keywords
laser
measuring machine
converting units
interferometric measuring
interferometric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE90110371T
Other languages
English (en)
Other versions
DE69004860T2 (de
Inventor
Akira Kuwabara
Yasufumi C O Dainippon Koyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Application granted granted Critical
Publication of DE69004860D1 publication Critical patent/DE69004860D1/de
Publication of DE69004860T2 publication Critical patent/DE69004860T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • G01D3/0365—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves the undesired influence being measured using a separate sensor, which produces an influence related signal

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
DE90110371T 1989-05-31 1990-05-31 Vorrichtung zur Umrechnung von Einheiten für eine interferometrische Messmaschine mit Laser. Expired - Fee Related DE69004860T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1140100A JPH0749923B2 (ja) 1989-05-31 1989-05-31 レーザ測長器のための単位変換装置

Publications (2)

Publication Number Publication Date
DE69004860D1 true DE69004860D1 (de) 1994-01-13
DE69004860T2 DE69004860T2 (de) 1994-04-14

Family

ID=15260944

Family Applications (1)

Application Number Title Priority Date Filing Date
DE90110371T Expired - Fee Related DE69004860T2 (de) 1989-05-31 1990-05-31 Vorrichtung zur Umrechnung von Einheiten für eine interferometrische Messmaschine mit Laser.

Country Status (4)

Country Link
US (1) US5184313A (de)
EP (1) EP0400649B1 (de)
JP (1) JPH0749923B2 (de)
DE (1) DE69004860T2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6687013B2 (en) * 2000-03-28 2004-02-03 Hitachi, Ltd. Laser interferometer displacement measuring system, exposure apparatus, and electron beam lithography apparatus
JP2005511093A (ja) * 2001-10-31 2005-04-28 ブリストル−マイヤーズ　スクイブ　カンパニー 被験化合物の毒性についてのスクリーニング方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3573805A (en) * 1968-02-29 1971-04-06 Gen Electric Conversion apparatus for converting nonstandard pulse count to standard measurement count
JPS5569004A (en) * 1978-11-18 1980-05-24 Toshiba Corp Measuring unit of amount of movement
FR2468099A1 (fr) * 1979-10-17 1981-04-30 Anvar Procede et appareil d'interferometrie laser a deux longueurs d'ondes
US4583856A (en) * 1983-06-27 1986-04-22 Gca Corporation Resolution system for interferometer
US4643577A (en) * 1983-07-15 1987-02-17 Wero Ohg Roth & Co. Length measuring apparatus based on the dual laser beam interferometer principle
US4803646A (en) * 1984-10-01 1989-02-07 Ford Motor Company Electronic odometer
KR900002117B1 (ko) * 1985-03-28 1990-04-02 시부야 고오교오 가부시끼가이샤 레이저 광선을 이용한 거리측정방법과 장치
JPS626116A (ja) * 1985-07-03 1987-01-13 Koito Mfg Co Ltd 積算計
DE3532768A1 (de) * 1985-09-13 1987-03-19 Bosch Gmbh Robert Schaltungsanordnung zur addition, speicherung und wiedergabe elektrischer zaehlimpulse
US4879732A (en) * 1986-09-22 1989-11-07 Zbigniew Dorosz Odometer with distance traveled and distance remaining displays
JPS63292002A (ja) * 1987-05-25 1988-11-29 Nippon Telegr & Teleph Corp <Ntt> レ−ザ測長装置
JPH01118702A (ja) * 1987-10-30 1989-05-11 Showa Electric Wire & Cable Co Ltd 測長装置の計測値処理方法およびその回路
DE3737435A1 (de) * 1987-11-04 1989-05-24 Duerrwaechter E Dr Doduco Verfahren zum bestimmen der drehwinkelstellung einer drehbahr gelagerten elektrischen wicklung
US4989222A (en) * 1989-05-22 1991-01-29 Stemco Inc. Electronic hubodometer

Also Published As

Publication number Publication date
US5184313A (en) 1993-02-02
DE69004860T2 (de) 1994-04-14
JPH0749923B2 (ja) 1995-05-31
JPH034104A (ja) 1991-01-10
EP0400649A3 (de) 1992-06-03
EP0400649A2 (de) 1990-12-05
EP0400649B1 (de) 1993-12-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee