DE69001692D1 - Sensor mit freitragendem ausleger. - Google Patents

Sensor mit freitragendem ausleger.

Info

Publication number
DE69001692D1
DE69001692D1 DE9090105035T DE69001692T DE69001692D1 DE 69001692 D1 DE69001692 D1 DE 69001692D1 DE 9090105035 T DE9090105035 T DE 9090105035T DE 69001692 T DE69001692 T DE 69001692T DE 69001692 D1 DE69001692 D1 DE 69001692D1
Authority
DE
Germany
Prior art keywords
sensor
cantilever boom
boom
cantilever
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE9090105035T
Other languages
English (en)
Other versions
DE69001692T2 (de
Inventor
Tsugiko Takase
Hideo Adachi
Takao Okada
Hisanari Shimazu
Hideo Tomabechi
Hiroshi Kajimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP6556589A external-priority patent/JPH02245632A/ja
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Publication of DE69001692D1 publication Critical patent/DE69001692D1/de
Application granted granted Critical
Publication of DE69001692T2 publication Critical patent/DE69001692T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G01Q10/06—Circuits or algorithms therefor
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/02—Monitoring the movement or position of the probe by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
    • G01Q60/16—Probes, their manufacture, or their related instrumentation, e.g. holders
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/852—Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property
DE90105035T 1989-03-17 1990-03-16 Sensor mit freitragendem Ausleger. Expired - Fee Related DE69001692T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP6556589A JPH02245632A (ja) 1989-03-17 1989-03-17 局部真空計
JP6556689 1989-03-17

Publications (2)

Publication Number Publication Date
DE69001692D1 true DE69001692D1 (de) 1993-07-01
DE69001692T2 DE69001692T2 (de) 1993-12-23

Family

ID=26406708

Family Applications (1)

Application Number Title Priority Date Filing Date
DE90105035T Expired - Fee Related DE69001692T2 (de) 1989-03-17 1990-03-16 Sensor mit freitragendem Ausleger.

Country Status (3)

Country Link
US (1) US5079958A (de)
EP (1) EP0387906B1 (de)
DE (1) DE69001692T2 (de)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5260824A (en) * 1989-04-24 1993-11-09 Olympus Optical Co., Ltd. Atomic force microscope
JP2741629B2 (ja) * 1990-10-09 1998-04-22 キヤノン株式会社 カンチレバー型プローブ、それを用いた走査型トンネル顕微鏡及び情報処理装置
JPH05196458A (ja) * 1991-01-04 1993-08-06 Univ Leland Stanford Jr 原子力顕微鏡用ピエゾ抵抗性片持ばり構造体
US5375087A (en) * 1991-02-04 1994-12-20 The United States Of America As Represented By The Secretary Of Commerce Tunneling-stabilized magnetic reading and recording
JP3198355B2 (ja) * 1991-05-28 2001-08-13 キヤノン株式会社 微小変位素子及びこれを用いた走査型トンネル顕微鏡、情報処理装置
US5262643A (en) * 1992-06-12 1993-11-16 International Business Machines Corp. Automatic tip approach method and apparatus for scanning probe microscope
US5424241A (en) * 1992-08-21 1995-06-13 Smiths Industries Aerospace & Defense Systems, Inc. Method of making a force detecting sensor
US5526703A (en) * 1992-08-21 1996-06-18 Smiths Industries Aerospace & Defense Systems, Inc. Force detecting sensor and method of making
JP2639308B2 (ja) * 1992-11-19 1997-08-13 富士電機株式会社 力センサ，温度センサおよび温度・力センサ装置
US5503018A (en) * 1992-12-08 1996-04-02 Alliedsignal Inc. Tunnel current sensor with force relief protection
US5377545A (en) * 1992-12-08 1995-01-03 Alliedsignal Inc. Servo accelerometer with tunnel current sensor and complementary electrostatic drive
US5420688A (en) * 1992-12-14 1995-05-30 Farah; John Interferometric fiber optic displacement sensor
DE4310349C2 (de) * 1993-03-30 2000-11-16 Inst Mikrotechnik Mainz Gmbh Sensorkopf und Verfahren zu seiner Herstellung
US5444244A (en) * 1993-06-03 1995-08-22 Park Scientific Instruments Corporation Piezoresistive cantilever with integral tip for scanning probe microscope
US5454260A (en) * 1993-12-20 1995-10-03 General Motors Corporation Non destructive adhesion testing
US6386053B1 (en) * 1997-09-08 2002-05-14 Ngk Insulators, Ltd. Mass sensor and mass detection method
US6455000B1 (en) * 1999-07-12 2002-09-24 Fantom Technologies Inc. Method and apparatus for measuring the concentration of a gas
US20030144096A1 (en) * 2002-01-29 2003-07-31 Ming-Hsin Lee Inflatable device
DE10235370A1 (de) * 2002-08-02 2004-02-12 Robert Bosch Gmbh Mikromechanisches Bauelement
EP1625349A2 (de) * 2003-05-21 2006-02-15 Secretary Of State For Trade And Industry Federkonstant-kalibrationsvorrichtung
US7309866B2 (en) * 2004-06-30 2007-12-18 Intel Corporation Cosmic ray detectors for integrated circuit chips
US8800390B2 (en) * 2006-02-07 2014-08-12 Michelin Recherche Et Technique S.A. Contact detector with piezoelectric sensor
JP5122775B2 (ja) 2006-08-23 2013-01-16 株式会社ミツトヨ 測定装置
KR100806960B1 (ko) * 2006-08-31 2008-02-22 한국표준과학연구원 발열판과 캔틸레버를 이용한 진공계
DE102007033441B4 (de) * 2007-07-18 2013-04-18 SIOS Meßtechnik GmbH Vorrichtung zur gleichzeitigen Messung von Kräften
US8544324B2 (en) * 2007-08-24 2013-10-01 Pilsne Research Co., L.L.C. Quantum tunnelling sensor device and method
JP5164743B2 (ja) * 2008-08-27 2013-03-21 エスアイアイ・ナノテクノロジー株式会社 カンチレバー、カンチレバーシステム及びプローブ顕微鏡並びに吸着質量センサ
EP2406517B1 (de) * 2008-09-23 2012-10-17 Robert Bosch GmbH Haltebolzen
JP2011169748A (ja) * 2010-02-18 2011-09-01 Olympus Corp 光テコ方式カンチレバー変位検出機構
EP2773941A1 (de) 2011-11-04 2014-09-10 Danmarks Tekniske Universitet Sensor und verfahren auf resonanzfaserbasis für aerosolpartikel
JP5778619B2 (ja) * 2012-05-02 2015-09-16 セイコーインスツル株式会社 圧力センサ
US9267963B2 (en) * 2012-11-08 2016-02-23 The Board Of Trustees Of The Leland Stanford Junior University Interferometric atomic-force microscopy device and method
CA3006938C (en) * 2014-12-10 2023-08-15 Paul D. Okulov Micro electro-mechanical strain displacement sensor and usage monitoring system

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3561253A (en) * 1969-03-26 1971-02-09 Thermo Systems Inc Apparatus and method of measurement of particulate mass
US3653253A (en) * 1970-01-05 1972-04-04 Thermo Systems Inc Aerosol mass concentration spectrometer
US3723778A (en) * 1972-02-07 1973-03-27 Inficon Inc Thickness sensor for sputtering systems utilizing magnetic deflection of electrons for thermal protection
US4157661A (en) * 1978-03-07 1979-06-12 Milltronics Limited Flowmeters
DE3412724A1 (de) * 1984-04-04 1985-10-17 Siemens AG, 1000 Berlin und 8000 München Verfahren und anordnung zum messen der schichtdicke und/oder der konzentration von auf substraten abgeschiedenen duennen schichten waehrend ihrer herstellung
US4638669A (en) * 1985-05-07 1987-01-27 Massachusetts Institute Of Technology Quantum tunneling cantilever accelerometer
US4724318A (en) * 1985-11-26 1988-02-09 International Business Machines Corporation Atomic force microscope and method for imaging surfaces with atomic resolution
EP0262253A1 (de) * 1986-10-03 1988-04-06 International Business Machines Corporation Mikromechanische Fühlervorrichtung für atomare Kräfte
DE3752269T2 (de) * 1986-12-24 1999-09-30 Canon Kk Aufzeichnungsgerät und Wiedergabegerät
EP0290647B1 (de) * 1987-05-12 1991-07-24 International Business Machines Corporation Atomares Kräftemikroskop mit oscillierendem Quarz
DE3750406T2 (de) * 1987-05-12 1995-03-30 Ibm Atomarer Kräftesensor mit interferometrischer Messung der Eigenschaften eines Datenträgers.
JP2756254B2 (ja) * 1988-03-25 1998-05-25 キヤノン株式会社 記録装置及び再生装置

Also Published As

Publication number Publication date
EP0387906A2 (de) 1990-09-19
EP0387906A3 (de) 1991-02-13
US5079958A (en) 1992-01-14
EP0387906B1 (de) 1993-05-26
DE69001692T2 (de) 1993-12-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee