DE68919525T2 - Vorrichtung zur Erfassung der Verteilung eines elektrischen Oberflächenpotentials. - Google Patents

Vorrichtung zur Erfassung der Verteilung eines elektrischen Oberflächenpotentials.

Info

Publication number
DE68919525T2
DE68919525T2 DE68919525T DE68919525T DE68919525T2 DE 68919525 T2 DE68919525 T2 DE 68919525T2 DE 68919525 T DE68919525 T DE 68919525T DE 68919525 T DE68919525 T DE 68919525T DE 68919525 T2 DE68919525 T2 DE 68919525T2
Authority
DE
Germany
Prior art keywords
distribution
detecting
surface potential
electrical surface
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68919525T
Other languages
English (en)
Other versions
DE68919525D1 (de
Inventor
Itsuo Takanashi
Shintaro Nakagaki
Tsutuo Asakura
Masato Furuya
Hirohiko Shinonaga
Hiromichi Tai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Victor Company of Japan Ltd
Original Assignee
Victor Company of Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP63113305A external-priority patent/JPH01284769A/ja
Priority claimed from JP63129847A external-priority patent/JPH01299472A/ja
Priority claimed from JP63185101A external-priority patent/JPH0235639A/ja
Application filed by Victor Company of Japan Ltd filed Critical Victor Company of Japan Ltd
Publication of DE68919525D1 publication Critical patent/DE68919525D1/de
Application granted granted Critical
Publication of DE68919525T2 publication Critical patent/DE68919525T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12—Measuring electrostatic fields or voltage-potential
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12—Measuring electrostatic fields or voltage-potential
    • G01R29/14—Measuring field distribution

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Control Or Security For Electrophotography (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Solid State Image Pick-Up Elements (AREA)
DE68919525T 1988-05-10 1989-05-09 Vorrichtung zur Erfassung der Verteilung eines elektrischen Oberflächenpotentials. Expired - Fee Related DE68919525T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP63113305A JPH01284769A (ja) 1988-05-10 1988-05-10 表面電位分布と対応する電気信号の発生装置
JP63129847A JPH01299472A (ja) 1988-05-27 1988-05-27 表面電位分布と対応する電気信号の発生装置
JP63185101A JPH0235639A (ja) 1988-07-25 1988-07-25 電荷潜像による記録再生装置

Publications (2)

Publication Number Publication Date
DE68919525D1 DE68919525D1 (de) 1995-01-12
DE68919525T2 true DE68919525T2 (de) 1995-05-04

Family

ID=27312479

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68919525T Expired - Fee Related DE68919525T2 (de) 1988-05-10 1989-05-09 Vorrichtung zur Erfassung der Verteilung eines elektrischen Oberflächenpotentials.

Country Status (7)

Country Link
US (1) US5065102A (de)
EP (1) EP0341669B1 (de)
KR (1) KR920009911B1 (de)
BR (1) BR8902529A (de)
CA (1) CA1326880C (de)
DE (1) DE68919525T2 (de)
IL (1) IL90175A0 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5323115A (en) * 1992-05-05 1994-06-21 Xerox Corporation Electrostatic voltmeter producing a low voltage output
US5488301A (en) * 1994-12-19 1996-01-30 Xerox Corporation Electrostatic voltmeter employing a differential cascode
JP3085209B2 (ja) * 1996-09-12 2000-09-04 株式会社村田製作所 表面電位センサ
US6150824A (en) * 1997-10-30 2000-11-21 Xerox Corporation Contactless system for detecting subtle surface potential charge patterns
US6008653A (en) * 1997-10-30 1999-12-28 Xerox Corporation Contactless system for detecting microdefects on electrostatographic members
US6249847B1 (en) * 1998-08-14 2001-06-19 Compaq Computer Corporation Computer system with synchronous memory arbiter that permits asynchronous memory requests
EP1227496A1 (de) * 2001-01-17 2002-07-31 Cavendish Kinetics Limited Nichtflüchtiger speicher
US7109698B2 (en) * 2001-03-14 2006-09-19 The Board Of Regents, University Of Oklahoma Electric-field meter having current compensation
JP4082947B2 (ja) * 2002-07-09 2008-04-30 パイオニア株式会社 記録再生ヘッド及びその製造方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3590343A (en) * 1969-01-31 1971-06-29 Westinghouse Electric Corp Resonant gate transistor with fixed position electrically floating gate electrode in addition to resonant member
US3828256A (en) * 1971-05-13 1974-08-06 C Liu Self contained test probe employing high input impedance
US4084134A (en) * 1975-07-11 1978-04-11 Hideo Nagano Voltage detector with field effect transistor and high input impedance
US4150389A (en) * 1976-09-29 1979-04-17 Siemens Aktiengesellschaft N-channel memory field effect transistor
US4330749A (en) * 1978-12-25 1982-05-18 Ricoh Company, Ltd. Electrometer apparatus
JPS5793782A (en) * 1980-12-02 1982-06-10 Canon Inc Solid-state image pickup device having storage time controlling function
US4423371A (en) * 1981-09-03 1983-12-27 Massachusetts Institute Of Technology Methods and apparatus for microdielectrometry
JPS5925269A (ja) * 1982-08-03 1984-02-09 Nec Corp 電荷転送装置
JPS59186481A (ja) * 1983-04-08 1984-10-23 Citizen Watch Co Ltd 撮像装置
JPH0616059B2 (ja) * 1983-05-10 1994-03-02 キヤノン株式会社 表面電位計
FR2555000B1 (fr) * 1983-11-15 1986-01-17 Thomson Csf Dispositif photosensible pour l'infrarouge
JPS60120267A (ja) * 1983-12-02 1985-06-27 Murata Mfg Co Ltd 非接触型表面電位検出装置
JPS60189372A (ja) * 1984-03-08 1985-09-26 Dainippon Screen Mfg Co Ltd 画像入力装置
US4646002A (en) * 1984-05-10 1987-02-24 Regents Of The University Of Minnesota Circuit for high impedance broad band probe
FR2569510B1 (fr) * 1984-08-21 1986-11-21 Thomson Csf Dispositif de correction de signaux video pour systeme d'acquisition et d'analyse de signaux rapides utilisant une camera a fente
DE3434542A1 (de) * 1984-09-20 1986-04-03 Philips Patentverwaltung Gmbh, 2000 Hamburg Elektrometerverstaerker, insbesondere fuer eine ionisationsmesskammer
DE3712473A1 (de) * 1986-04-14 1987-10-15 Canon Kk Bildaufzeichnungs- und/oder bildwiedergabeeinrichtung

Also Published As

Publication number Publication date
DE68919525D1 (de) 1995-01-12
BR8902529A (pt) 1990-03-01
CA1326880C (en) 1994-02-08
EP0341669B1 (de) 1994-11-30
KR920009911B1 (ko) 1992-11-06
EP0341669A2 (de) 1989-11-15
EP0341669A3 (de) 1991-06-05
KR900002630A (ko) 1990-02-28
IL90175A0 (en) 1989-12-15
US5065102A (en) 1991-11-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee