DE68918501D1 - Einrichtung zur Steuerung von Gewinn und Offsetspannung in Strahlungsmessapparaten. - Google Patents

Einrichtung zur Steuerung von Gewinn und Offsetspannung in Strahlungsmessapparaten.

Info

Publication number
DE68918501D1
DE68918501D1 DE68918501T DE68918501T DE68918501D1 DE 68918501 D1 DE68918501 D1 DE 68918501D1 DE 68918501 T DE68918501 T DE 68918501T DE 68918501 T DE68918501 T DE 68918501T DE 68918501 D1 DE68918501 D1 DE 68918501D1
Authority
DE
Germany
Prior art keywords
offset voltage
measuring devices
radiation measuring
controlling gain
gain
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE68918501T
Other languages
English (en)
Other versions
DE68918501T2 (de
Inventor
Tsutomu Intellectulal Yamakawa
Hiroaki Intellectula Kobayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP15091388A external-priority patent/JP2698611B2/ja
Priority claimed from JP63150914A external-priority patent/JPH01318988A/ja
Priority claimed from JP63206081A external-priority patent/JPH0619451B2/ja
Priority claimed from JP20608288A external-priority patent/JPH0619446B2/ja
Priority claimed from JP21892088A external-priority patent/JPH0619447B2/ja
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of DE68918501D1 publication Critical patent/DE68918501D1/de
Application granted granted Critical
Publication of DE68918501T2 publication Critical patent/DE68918501T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/18—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors using comparison with a reference electric value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • G01J2001/086—Calibrating drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4406—Plural ranges in circuit, e.g. switchable ranges; Adjusting sensitivity selecting gain values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/4453—PMT

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Measurement Of Radiation (AREA)
  • Nuclear Medicine (AREA)
DE68918501T 1988-06-17 1989-06-14 Einrichtung zur Steuerung von Gewinn und Offsetspannung in Strahlungsmessapparaten. Expired - Lifetime DE68918501T2 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP15091388A JP2698611B2 (ja) 1988-06-17 1988-06-17 放射線計測装置
JP63150914A JPH01318988A (ja) 1988-06-17 1988-06-17 放射線計測装置
JP63206081A JPH0619451B2 (ja) 1988-08-19 1988-08-19 シンチレーションカメラ
JP20608288A JPH0619446B2 (ja) 1988-08-19 1988-08-19 シンチレーションカメラの調整方法
JP21892088A JPH0619447B2 (ja) 1988-08-31 1988-08-31 ガンマカメラ

Publications (2)

Publication Number Publication Date
DE68918501D1 true DE68918501D1 (de) 1994-11-03
DE68918501T2 DE68918501T2 (de) 1995-01-26

Family

ID=27527936

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68918501T Expired - Lifetime DE68918501T2 (de) 1988-06-17 1989-06-14 Einrichtung zur Steuerung von Gewinn und Offsetspannung in Strahlungsmessapparaten.

Country Status (4)

Country Link
US (1) US5004904A (de)
EP (1) EP0346878B1 (de)
CA (1) CA1333638C (de)
DE (1) DE68918501T2 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE460506B (sv) * 1988-08-31 1989-10-16 Wallac Oy Fotomultiplikator med foerstaerkningsstabiliseringsorgan
FR2651331B1 (fr) * 1989-08-22 1991-10-25 Thomson Tubes Electroniques Procede de correction des signaux d'un detecteur lineaire de radiations et dispositif de correction mettant en óoeuvre ce procede.
US5220589A (en) * 1991-07-18 1993-06-15 General Electric Company Correction circuit for a floating-point amplifier
US5179423A (en) * 1991-07-26 1993-01-12 Kollmorgen Corporation Gain stabilized self-scanning photo-diode array
US5412215A (en) * 1991-10-08 1995-05-02 Kabushiki Kaisha Toshiba Method and system capable of tuning scintillation camera by small number of light references
US5237173A (en) * 1992-04-01 1993-08-17 Independent Scintillation Imaging Systems, Inc. Gain calibration in a scintillation camera
FR2700859B1 (fr) * 1993-01-27 1995-03-31 Sopha Medical Gamma-caméra à compensation de gain.
US5376797A (en) * 1993-09-03 1994-12-27 Siemens Medical Systems, Inc. Method and apparatus for producing and utilizing flashes of light which simulate scintillation events
FR2711792B1 (fr) * 1993-10-21 1996-12-20 Instruments Sa Dispositif de mesure de flux lumineux.
US5453610A (en) * 1994-05-20 1995-09-26 Summit World Trade Corporation Electronic gain control for photomultiplier used in gamma camera
US5512755A (en) * 1994-05-20 1996-04-30 Summit World Trade Corp. Gamma camera device
US5550377A (en) * 1994-09-20 1996-08-27 Picker International, Inc. Technique for balancing anger cameras using an externally irradiated crystal and single tube data
US5449897A (en) * 1994-10-03 1995-09-12 Adac Laboratories Automatic gain calibration for gamma camera system
DE69528949T2 (de) * 1994-10-03 2003-08-28 Koninkl Philips Electronics Nv Verbessertes Gammakamera-System
US5548111A (en) * 1995-02-22 1996-08-20 Wallac Oy Photomultiplier having gain stabilization means
US5677536A (en) * 1996-06-19 1997-10-14 Smv America Gamma camera with on the fly calibration for PMT drift
US5795784A (en) 1996-09-19 1998-08-18 Abbott Laboratories Method of performing a process for determining an item of interest in a sample
US5856194A (en) 1996-09-19 1999-01-05 Abbott Laboratories Method for determination of item of interest in a sample
CA2212196A1 (en) 1997-08-01 1999-02-01 Is2 Research Inc. Medical diagnostic apparatus and method
US5859429A (en) * 1997-08-20 1999-01-12 Abbott Laboratories Optical system with test/calibration
SE9703360D0 (sv) * 1997-09-17 1997-09-17 Btg Kaelle Inventing Ab Sätt och anordning för bestämning av nivån för en vätska i en behållande
JP4696172B2 (ja) * 2009-06-15 2011-06-08 古河機械金属株式会社 信号光検出装置及び信号光検出方法
WO2012077218A1 (ja) 2010-12-09 2012-06-14 株式会社リガク 放射線検出器
US9507049B2 (en) 2013-10-04 2016-11-29 Banner Engineering Object sensing using dynamic demodulation
WO2015126386A1 (en) * 2014-02-19 2015-08-27 Halliburton Energy Services Inc. Integrated computational element designed for multi-characteristic detection
CN106052861B (zh) * 2016-07-27 2017-08-29 武汉京邦科技有限公司 一种硅光电倍增器测试系统及测试方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3487222A (en) * 1967-11-03 1969-12-30 Bausch & Lomb Automatic gain control for self-calibrating a detection system
US3515878A (en) * 1967-12-28 1970-06-02 Ball Brothers Res Corp Gain control system for photomultiplier using standardization pulses
US3714441A (en) * 1971-12-13 1973-01-30 Servo Corp Photomultiplier gain control circuit
FR2168849B1 (de) * 1972-01-24 1976-09-03 Schlumberger Prospection
US3864573A (en) * 1973-08-20 1975-02-04 Bethlehem Steel Corp Wide-range radiation gage for determining a material property
FR2286393A1 (fr) * 1974-09-27 1976-04-23 Labo Electronique Physique Systeme automatique de reetalonnage permanent pour camera a scintillation
FR2328207A1 (fr) * 1975-10-17 1977-05-13 Labo Electronique Physique Systeme de regulation automatique pour camera a scintillations
US4071762A (en) * 1976-10-12 1978-01-31 General Electric Company Scintillation camera with improved output means
US4279510A (en) * 1979-10-19 1981-07-21 Beckman Instruments, Inc. Spectrophotometer with improved photomultiplier tube dark signal compensation
US4310243A (en) * 1979-10-19 1982-01-12 Beckman Instruments, Inc. Spectrophotometer with photomultiplier tube dark signal compensation
US4413183A (en) * 1980-12-29 1983-11-01 Raytheon Company Gamma camera
DK230481A (da) * 1981-05-26 1982-11-27 Gen Electric Nuclear Medical A Anordning ved et gammakamera til automatisk forstaerkningsregulering
US4466075A (en) * 1981-11-23 1984-08-14 Siemens Gammasonics, Inc. Motion correction circuitry and method for a radiation imaging device
JPS58129378A (ja) * 1982-01-29 1983-08-02 Shimadzu Corp シンチレ−シヨンカメラの光検出器の調整方法
JPH065280B2 (ja) * 1985-04-17 1994-01-19 株式会社東芝 シンチレ−シヨンカメラ

Also Published As

Publication number Publication date
EP0346878A2 (de) 1989-12-20
DE68918501T2 (de) 1995-01-26
US5004904A (en) 1991-04-02
CA1333638C (en) 1994-12-20
EP0346878B1 (de) 1994-09-28
EP0346878A3 (de) 1991-05-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)