DE68918006T2 - Deformationsmessverfahren und Vorrichtung mit Photoelementdetektoren. - Google Patents

Deformationsmessverfahren und Vorrichtung mit Photoelementdetektoren.

Info

Publication number
DE68918006T2
DE68918006T2 DE68918006T DE68918006T DE68918006T2 DE 68918006 T2 DE68918006 T2 DE 68918006T2 DE 68918006 T DE68918006 T DE 68918006T DE 68918006 T DE68918006 T DE 68918006T DE 68918006 T2 DE68918006 T2 DE 68918006T2
Authority
DE
Germany
Prior art keywords
measuring method
deformation measuring
photo element
element detectors
detectors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68918006T
Other languages
English (en)
Other versions
DE68918006D1 (de
Inventor
Tamiki Takemori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of DE68918006D1 publication Critical patent/DE68918006D1/de
Application granted granted Critical
Publication of DE68918006T2 publication Critical patent/DE68918006T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
DE68918006T 1988-06-22 1989-06-22 Deformationsmessverfahren und Vorrichtung mit Photoelementdetektoren. Expired - Fee Related DE68918006T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63154297A JPH01320411A (ja) 1988-06-22 1988-06-22 変形の測定方法

Publications (2)

Publication Number Publication Date
DE68918006D1 DE68918006D1 (de) 1994-10-13
DE68918006T2 true DE68918006T2 (de) 1995-01-05

Family

ID=15581054

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68918006T Expired - Fee Related DE68918006T2 (de) 1988-06-22 1989-06-22 Deformationsmessverfahren und Vorrichtung mit Photoelementdetektoren.

Country Status (4)

Country Link
US (1) US5061860A (de)
EP (1) EP0347911B1 (de)
JP (1) JPH01320411A (de)
DE (1) DE68918006T2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5907152A (en) * 1992-10-05 1999-05-25 Logitech, Inc. Pointing device utilizing a photodetector array
US5426498A (en) * 1994-04-04 1995-06-20 University Of New Mexico Method and apparatus for real-time speckle interferometry for strain or displacement of an object surface
AU6276696A (en) * 1995-06-15 1997-01-15 Regents Of The University Of Michigan, The Method and apparatus for composition and display of three-dimensional image from two-dimensional ultrasound
DE19650325A1 (de) * 1996-12-04 1998-06-10 Ettemeyer Gmbh & Co Mes Und Pr Verfahren und Vorrichtung zur Ermittlung von Verformungen und Dehnungen an gekrümmten Körpern
US6529184B1 (en) 2000-03-22 2003-03-04 Microsoft Corporation Ball pattern architecture
US7773070B2 (en) * 2004-05-21 2010-08-10 Cypress Semiconductor Corporation Optical positioning device using telecentric imaging
CN104964647A (zh) * 2015-04-10 2015-10-07 李跃伟 阵列光敏电阻激光准直变形测量方法及其装置
CN112200785B (zh) * 2020-10-14 2023-12-29 北京科技大学 基于随机散点关系拓扑匹配函数的改进数字图像相关方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5952963B2 (ja) * 1979-08-09 1984-12-22 理化学研究所 変形の測定方法
JPS58225303A (ja) * 1982-06-25 1983-12-27 Yokogawa Hokushin Electric Corp 光学式機械量測定装置
US4678920A (en) * 1985-06-17 1987-07-07 General Motors Corporation Machine vision method and apparatus
US4794262A (en) * 1985-12-03 1988-12-27 Yukio Sato Method and apparatus for measuring profile of three-dimensional object
JPS62191704A (ja) * 1986-02-18 1987-08-22 Mitsubishi Heavy Ind Ltd レ−ザスペツクル歪計測装置
KR900006577B1 (ko) * 1986-10-03 1990-09-13 엔티티 기쥬쯔이덴 가부시끼가이샤 형상 측정기

Also Published As

Publication number Publication date
US5061860A (en) 1991-10-29
DE68918006D1 (de) 1994-10-13
EP0347911B1 (de) 1994-09-07
EP0347911A3 (en) 1990-07-25
JPH01320411A (ja) 1989-12-26
EP0347911A2 (de) 1989-12-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee