DE68917822T2 - Verriegelungsmechanismus einer Befestigung. - Google Patents

Verriegelungsmechanismus einer Befestigung.

Info

Publication number
DE68917822T2
DE68917822T2 DE68917822T DE68917822T DE68917822T2 DE 68917822 T2 DE68917822 T2 DE 68917822T2 DE 68917822 T DE68917822 T DE 68917822T DE 68917822 T DE68917822 T DE 68917822T DE 68917822 T2 DE68917822 T2 DE 68917822T2
Authority
DE
Germany
Prior art keywords
fastening
locking mechanism
locking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68917822T
Other languages
English (en)
Other versions
DE68917822D1 (de
Inventor
Michael L Christensen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Application granted granted Critical
Publication of DE68917822D1 publication Critical patent/DE68917822D1/de
Publication of DE68917822T2 publication Critical patent/DE68917822T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
DE68917822T 1988-07-21 1989-07-10 Verriegelungsmechanismus einer Befestigung. Expired - Fee Related DE68917822T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/222,437 US4857009A (en) 1988-07-21 1988-07-21 Fixture latching mechanism

Publications (2)

Publication Number Publication Date
DE68917822D1 DE68917822D1 (de) 1994-10-06
DE68917822T2 true DE68917822T2 (de) 1994-12-22

Family

ID=22832210

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68917822T Expired - Fee Related DE68917822T2 (de) 1988-07-21 1989-07-10 Verriegelungsmechanismus einer Befestigung.

Country Status (4)

Country Link
US (1) US4857009A (de)
EP (1) EP0352001B1 (de)
JP (1) JP3091465B2 (de)
DE (1) DE68917822T2 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5068601A (en) * 1991-02-11 1991-11-26 Credence Systems Corporation Dual function cam-ring system for DUT board parallel electrical inter-connection and prober/handler docking
TW227644B (de) * 1992-12-18 1994-08-01 Tesukon Kk
US5436567A (en) * 1993-02-08 1995-07-25 Automated Test Engineering, Inc. Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts
US5459407A (en) * 1993-12-09 1995-10-17 Motorola, Inc. Apparatus and method of correcting loss of test contact continuity
US5600259A (en) * 1993-12-17 1997-02-04 International Business Machines Corporation Method and apparatus for reducing interference in a pin array
US5823737A (en) * 1995-10-31 1998-10-20 Lucent Technologies Probemat handler
US6051983A (en) 1997-11-03 2000-04-18 International Business Machines Corporation Positive side support test assembly
US6333637B1 (en) 1998-10-09 2001-12-25 International Business Machines Corporation Electronic card assembly fixture
US6940297B2 (en) * 2003-05-27 2005-09-06 James Hall Top plate release mechanism
US7733081B2 (en) 2007-10-19 2010-06-08 Teradyne, Inc. Automated test equipment interface
US7847570B2 (en) 2007-10-19 2010-12-07 Teradyne, Inc. Laser targeting mechanism
CN104868269A (zh) * 2015-05-26 2015-08-26 张国强 一种带输气管的电路板插接组件
CN105137323B (zh) * 2015-08-14 2019-01-29 深圳创维－Rgb电子有限公司 一种pcb板自动测试装置及其测试方法
CN108680774B (zh) * 2018-07-18 2024-02-13 珠海市运泰利自动化设备有限公司 Zif排线先翻后隐可视互锁防呆机构

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1309088A (en) * 1969-11-20 1973-03-07 Power Jacks Ltd Workpiece clamping devices
US3804398A (en) * 1972-04-17 1974-04-16 Babcock & Wilcox Co Pallet clamp
GB1435027A (en) * 1973-11-26 1976-05-12 Spenklin Ltd Power-operated work clamping devices
CH560392A5 (en) * 1973-12-19 1975-03-27 Siemens Ag Albis Testing conductor plates having numerous soldered points etc. - plates are mounted on insulated carrier block
US3970934A (en) * 1974-08-12 1976-07-20 Akin Aksu Printed circuit board testing means
US4230985A (en) * 1978-01-12 1980-10-28 Fairchild Camera And Instrument Corporation Fixturing system
US4540227A (en) * 1984-03-21 1985-09-10 Grumman Aerospace Corporation Test equipment interconnection system
US4620761A (en) * 1985-01-30 1986-11-04 Texas Instruments Incorporated High density chip socket
US4618131A (en) * 1985-05-24 1986-10-21 Zenith Electronics Corporation PC board hold down system
DE8633580U1 (de) * 1986-12-16 1987-02-05 Weber, Herbert, 8211 Breitbrunn, De

Also Published As

Publication number Publication date
JPH0274875A (ja) 1990-03-14
EP0352001A2 (de) 1990-01-24
US4857009A (en) 1989-08-15
DE68917822D1 (de) 1994-10-06
JP3091465B2 (ja) 2000-09-25
EP0352001B1 (de) 1994-08-31
EP0352001A3 (en) 1990-12-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8339 Ceased/non-payment of the annual fee