DE60336471D1 - Verfahren und einrichtung zur messung von waferpotential oder -temperatur - Google Patents
Verfahren und einrichtung zur messung von waferpotential oder -temperaturInfo
- Publication number
- DE60336471D1 DE60336471D1 DE60336471T DE60336471T DE60336471D1 DE 60336471 D1 DE60336471 D1 DE 60336471D1 DE 60336471 T DE60336471 T DE 60336471T DE 60336471 T DE60336471 T DE 60336471T DE 60336471 D1 DE60336471 D1 DE 60336471D1
- Authority
- DE
- Germany
- Prior art keywords
- temperature
- measuring wafer
- wafer potential
- potential
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67248—Temperature monitoring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Drying Of Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002175247A JP3861030B2 (ja) | 2002-06-17 | 2002-06-17 | ウェーハ電位の測定方法及び装置 |
JP2002184160A JP2004031554A (ja) | 2002-06-25 | 2002-06-25 | ウェーハ温度の検出方法及び装置 |
PCT/JP2003/007649 WO2003107415A1 (ja) | 2002-06-17 | 2003-06-17 | ウェーハ電位又は温度の測定方法及び装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60336471D1 true DE60336471D1 (de) | 2011-05-05 |
Family
ID=29738413
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60336471T Expired - Lifetime DE60336471D1 (de) | 2002-06-17 | 2003-06-17 | Verfahren und einrichtung zur messung von waferpotential oder -temperatur |
Country Status (6)
Country | Link |
---|---|
US (1) | US7335315B2 (de) |
EP (1) | EP1515363B1 (de) |
KR (1) | KR100603169B1 (de) |
DE (1) | DE60336471D1 (de) |
TW (1) | TW200404334A (de) |
WO (1) | WO2003107415A1 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4928817B2 (ja) * | 2006-04-07 | 2012-05-09 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置 |
TWI475594B (zh) | 2008-05-19 | 2015-03-01 | Entegris Inc | 靜電夾頭 |
US8861170B2 (en) | 2009-05-15 | 2014-10-14 | Entegris, Inc. | Electrostatic chuck with photo-patternable soft protrusion contact surface |
CN102449754B (zh) | 2009-05-15 | 2015-10-21 | 恩特格林斯公司 | 具有聚合物突出物的静电吸盘 |
KR101731136B1 (ko) | 2010-05-28 | 2017-04-27 | 엔테그리스, 아이엔씨. | 표면저항이 높은 정전 척 |
JP5875775B2 (ja) * | 2011-03-30 | 2016-03-02 | 東京エレクトロン株式会社 | 基板除去方法及び記憶媒体 |
JP6407694B2 (ja) * | 2014-12-16 | 2018-10-17 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置 |
US10969370B2 (en) * | 2015-06-05 | 2021-04-06 | Semilab Semiconductor Physics Laboratory Co., Ltd. | Measuring semiconductor doping using constant surface potential corona charging |
JP6522180B1 (ja) | 2018-02-08 | 2019-05-29 | Sppテクノロジーズ株式会社 | 基板載置台及びこれを備えたプラズマ処理装置及びプラズマ処理方法 |
CN112735965B (zh) * | 2020-12-25 | 2024-02-27 | 北京北方华创微电子装备有限公司 | 半导体设备及其承载装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06151568A (ja) * | 1992-11-02 | 1994-05-31 | Nippon Steel Corp | 静電チャック装置 |
JPH1014266A (ja) * | 1996-06-21 | 1998-01-16 | Sony Corp | 静電チャック装置及び静電チャックを用いたウエハの保持方法及び静電チャックからのウエハの脱着方法 |
US6198616B1 (en) | 1998-04-03 | 2001-03-06 | Applied Materials, Inc. | Method and apparatus for supplying a chucking voltage to an electrostatic chuck within a semiconductor wafer processing system |
JP2000021964A (ja) * | 1998-07-06 | 2000-01-21 | Ngk Insulators Ltd | 静電チャックのパーティクル発生低減方法および半導体製造装置 |
JP2000332075A (ja) | 1999-05-24 | 2000-11-30 | Hitachi Ltd | 温度測定用ウエハ |
JP2002009140A (ja) * | 2000-06-22 | 2002-01-11 | Mitsubishi Electric Corp | 静電チャック装置 |
US7208067B2 (en) * | 2003-03-27 | 2007-04-24 | Tokyo Electron Limited | Method and system for monitoring RF impedance to determine conditions of a wafer on an electrostatic chuck |
-
2003
- 2003-06-17 KR KR1020047020471A patent/KR100603169B1/ko not_active IP Right Cessation
- 2003-06-17 TW TW092116393A patent/TW200404334A/zh not_active IP Right Cessation
- 2003-06-17 DE DE60336471T patent/DE60336471D1/de not_active Expired - Lifetime
- 2003-06-17 EP EP03733471A patent/EP1515363B1/de not_active Expired - Fee Related
- 2003-06-17 US US10/513,396 patent/US7335315B2/en not_active Expired - Fee Related
- 2003-06-17 WO PCT/JP2003/007649 patent/WO2003107415A1/ja active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
WO2003107415A1 (ja) | 2003-12-24 |
KR20050010517A (ko) | 2005-01-27 |
US20050174135A1 (en) | 2005-08-11 |
EP1515363B1 (de) | 2011-03-23 |
US7335315B2 (en) | 2008-02-26 |
KR100603169B1 (ko) | 2006-07-24 |
TW200404334A (en) | 2004-03-16 |
EP1515363A4 (de) | 2007-05-09 |
EP1515363A1 (de) | 2005-03-16 |
TWI300242B (de) | 2008-08-21 |
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