DE60322716D1 - Brechungsindexbestimmung mittels mikro-interferometrischer reflexionsmessungen - Google Patents

Brechungsindexbestimmung mittels mikro-interferometrischer reflexionsmessungen

Info

Publication number
DE60322716D1
DE60322716D1 DE60322716T DE60322716T DE60322716D1 DE 60322716 D1 DE60322716 D1 DE 60322716D1 DE 60322716 T DE60322716 T DE 60322716T DE 60322716 T DE60322716 T DE 60322716T DE 60322716 D1 DE60322716 D1 DE 60322716D1
Authority
DE
Germany
Prior art keywords
micro
index determination
reflection measurements
intensity
refractive index
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60322716T
Other languages
English (en)
Inventor
Darryl J Bornhop
Peter Andersen
Henrik S Sorensen
Henrik Pranov
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Danmarks Tekniskie Universitet
Texas Tech University TTU
Original Assignee
Danmarks Tekniskie Universitet
Texas Tech University TTU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Danmarks Tekniskie Universitet, Texas Tech University TTU filed Critical Danmarks Tekniskie Universitet
Application granted granted Critical
Publication of DE60322716D1 publication Critical patent/DE60322716D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Micromachines (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
DE60322716T 2002-09-05 2003-09-04 Brechungsindexbestimmung mittels mikro-interferometrischer reflexionsmessungen Expired - Lifetime DE60322716D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0220684.5A GB0220684D0 (en) 2002-09-05 2002-09-05 Refractive index determination by micro interferometric reflection detection
PCT/US2003/025849 WO2004023115A1 (en) 2002-09-05 2003-09-04 Refractive index determination by micro interferometric reflection detection

Publications (1)

Publication Number Publication Date
DE60322716D1 true DE60322716D1 (de) 2008-09-18

Family

ID=9943572

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60322716T Expired - Lifetime DE60322716D1 (de) 2002-09-05 2003-09-04 Brechungsindexbestimmung mittels mikro-interferometrischer reflexionsmessungen

Country Status (7)

Country Link
EP (1) EP1535048B1 (de)
AT (1) ATE403857T1 (de)
AU (1) AU2003263900A1 (de)
DE (1) DE60322716D1 (de)
DK (1) DK1535048T3 (de)
GB (1) GB0220684D0 (de)
WO (1) WO2004023115A1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2584824A1 (en) 2004-10-22 2006-05-04 Vanderbilt University On-chip polarimetry for high-throughput screening of nanoliter and smaller sample volumes
US7623218B2 (en) 2004-11-24 2009-11-24 Carl Zeiss Smt Ag Method of manufacturing a miniaturized device
FI20060439L (fi) * 2006-05-08 2007-11-09 Kari Myller Menetelmä ja laite taitekertoimen ja sameuden määrittämiseksi
EP2160590A4 (de) 2007-05-18 2012-11-21 Univ Vanderbilt Verbessertes interferometrisches nachweissystem und -verfahren
US8445217B2 (en) 2007-09-20 2013-05-21 Vanderbilt University Free solution measurement of molecular interactions by backscattering interferometry
WO2009076372A2 (en) 2007-12-10 2009-06-18 Molecular Sensing, Inc. Temperature-stable interferometer
US8450118B2 (en) 2009-05-04 2013-05-28 Molecular Sensing, Inc. Method for detecting binding interactions between membrane proteins and analytes in a homogenous assay
WO2011156713A1 (en) 2010-06-11 2011-12-15 Vanderbilt University Multiplexed interferometric detection system and method
US9562853B2 (en) 2011-02-22 2017-02-07 Vanderbilt University Nonaqueous backscattering interferometric methods
US9273949B2 (en) 2012-05-11 2016-03-01 Vanderbilt University Backscattering interferometric methods
WO2014147088A1 (en) 2013-03-21 2014-09-25 Technical University Of Denmark Refractive index based measurements
EP2976625A1 (de) * 2013-03-21 2016-01-27 The Technical University of Denmark Brechungsindexbasierte messungen
EP2976623A1 (de) 2013-03-21 2016-01-27 The Technical University of Denmark Auf dem brechungsindex basierte messungen
EP3247988A4 (de) 2015-01-23 2018-12-19 Vanderbilt University Robustes interferometer und verfahren zur verwendung davon
US10627396B2 (en) 2016-01-29 2020-04-21 Vanderbilt University Free-solution response function interferometry
CN113959950B (zh) * 2021-10-28 2024-04-12 绍兴泊盛科技有限公司 一种基于光流控芯片检测液体折射率的检测装置

Also Published As

Publication number Publication date
AU2003263900A8 (en) 2004-03-29
EP1535048B1 (de) 2008-08-06
DK1535048T3 (da) 2008-12-01
GB0220684D0 (en) 2002-10-16
ATE403857T1 (de) 2008-08-15
EP1535048A1 (de) 2005-06-01
WO2004023115A1 (en) 2004-03-18
AU2003263900A1 (en) 2004-03-29

Similar Documents

Publication Publication Date Title
DE60322716D1 (de) Brechungsindexbestimmung mittels mikro-interferometrischer reflexionsmessungen
DE602005018818D1 (de) Erkennung einer störung bei der ausbreitung von licht in einem optischen wellenleiter
CY1107541T1 (el) Διαδικασια χρησης μιας πλατφορμας ανιχνευσης
DE60024863D1 (de) System und verfahren zur ultraschall-laseruntersuchung mit einem laser abstimmbarer wellenlänge zur ultraschallerzeugung
WO2005070166A3 (en) Method and system for optically tracking a target using an interferometric technique
KR20210072715A (ko) 서브-샘플링으로 인한 왜곡 하에서 저간섭성 광학 간섭계 기법들에 의해 물체의 표면과 몸체 사이의 분리 거리를 결정하기 위한 방법 및 시스템
WO2005088241A8 (de) Niederkohärenz-interferometrisches verfahren und gerät zur lichtoptischen abtastung von oberflächen
WO2009008010A3 (en) Method and apparatus for the simultaneous generation and detection of optical diffraction interference pattern on a detector
ATE451866T1 (de) Messung der oberflächentopographie und wellenaberration eines linsensystems
WO2009078616A3 (en) Three-dimensional shape measuring apparatus
DE602004006833D1 (de) Verfahren und vorrichtung zur bestimmung der entfernung zwischen dem mantelring und der schaufelspitze einer turbine
RU2005101407A (ru) Способ и устройство для поточного измерения характеристик поверхностного слоя металлургического изделия
WO2004029545A3 (en) Method and apparatus for determining the wavelength of an input light beam
DE60140690D1 (de) Verfahren und gerät zur messung der eigenmoden von vibrationen eines auges, mit einem laserinterferometer und dessen anwendung bei der messung des augeninnendruckes
ATE450789T1 (de) Vorrichtung und verfahren zur bestimmung des brechungsindex eines fluids
DE50115284D1 (de) Optischer sensor zur messung des abstands und der neigung einer fläche
GB2377754A (en) Movement detection using speckle interferometer
DE60304222D1 (de) VERFAHREN ZUR MESSUNG VON KONTURVERuNDERUNGEN
Brinkmeyer et al. Fiber optic CW doppler lidar using a synthetic broadband source
KR20040076251A (ko) 삼차원 대상의 형태를 검파하는 방법 및 장치
RU2007137507A (ru) Способ обеспечения точности и однозначности измерений высоты микрорельефа поверхности интерференционными методами на основе использования эффекта генерации отраженной гигантской второй гармоники
ES2079282B1 (es) Dispositivo interferometrico y metodo para medir y para estabilizar la longitud de onda de diodo laser.
RU2224267C2 (ru) Способ обнаружения объектов и определения их местоположения и устройство для его осуществления
TW200615505A (en) Apparatus for measuring displacement
CN204807036U (zh) 反馈控制式移相干涉仪

Legal Events

Date Code Title Description
8364 No opposition during term of opposition