DE60320171D1 - Verfahren zum Detektieren von Fehlern in elektronischen Bauteilen, basierend auf Ruhestrom-Messungen - Google Patents

Verfahren zum Detektieren von Fehlern in elektronischen Bauteilen, basierend auf Ruhestrom-Messungen

Info

Publication number
DE60320171D1
DE60320171D1 DE60320171T DE60320171T DE60320171D1 DE 60320171 D1 DE60320171 D1 DE 60320171D1 DE 60320171 T DE60320171 T DE 60320171T DE 60320171 T DE60320171 T DE 60320171T DE 60320171 D1 DE60320171 D1 DE 60320171D1
Authority
DE
Germany
Prior art keywords
sub
electronic components
components based
quiescent current
current measurements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60320171T
Other languages
English (en)
Other versions
DE60320171T2 (de
Inventor
Hans Manhaeve
Pauw Piet De
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Star Test N V Q
Original Assignee
Star Test N V Q
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Star Test N V Q filed Critical Star Test N V Q
Publication of DE60320171D1 publication Critical patent/DE60320171D1/de
Application granted granted Critical
Publication of DE60320171T2 publication Critical patent/DE60320171T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE60320171T 2002-05-23 2003-05-23 Verfahren zum Detektieren von Fehlern in elektronischen Bauteilen, basierend auf Ruhestrom-Messungen Expired - Lifetime DE60320171T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP02447094 2002-05-23
EP02447094 2002-05-23

Publications (2)

Publication Number Publication Date
DE60320171D1 true DE60320171D1 (de) 2008-05-21
DE60320171T2 DE60320171T2 (de) 2009-07-09

Family

ID=29797369

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60320171T Expired - Lifetime DE60320171T2 (de) 2002-05-23 2003-05-23 Verfahren zum Detektieren von Fehlern in elektronischen Bauteilen, basierend auf Ruhestrom-Messungen

Country Status (3)

Country Link
US (1) US7315974B2 (de)
AT (1) ATE391927T1 (de)
DE (1) DE60320171T2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6941235B2 (en) * 2003-10-28 2005-09-06 International Business Machines Corporation Method and system for analyzing quiescent power plane current (IDDQ) test data in very-large scale integrated (VLSI) circuits
JP4256328B2 (ja) 2003-12-05 2009-04-22 株式会社東芝 電界効果トランジスタ、半導体装置及びフォトリレー
US20150061711A1 (en) * 2013-09-03 2015-03-05 United States Of America As Represented By The Secretary Of The Navy Overclocking as a Method for Determining Age in Microelectronics for Counterfeit Device Screening

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5731700A (en) * 1994-03-14 1998-03-24 Lsi Logic Corporation Quiescent power supply current test method and apparatus for integrated circuits
US5519333A (en) * 1994-09-09 1996-05-21 Sandia Corporation Elevated voltage level IDDQ failure testing of integrated circuits
US6043662A (en) * 1996-09-18 2000-03-28 Alers; Glenn Baldwin Detecting defects in integrated circuits
US5889409A (en) * 1996-09-27 1999-03-30 Intel Corporation Leakage tracking device sample for IDDQ measurement and defect resolution
US6342790B1 (en) * 2000-04-13 2002-01-29 Pmc-Sierra, Inc. High-speed, adaptive IDDQ measurement
US6812724B2 (en) * 2002-02-22 2004-11-02 Lan Rao Method and system for graphical evaluation of IDDQ measurements

Also Published As

Publication number Publication date
US20040006731A1 (en) 2004-01-08
US7315974B2 (en) 2008-01-01
ATE391927T1 (de) 2008-04-15
DE60320171T2 (de) 2009-07-09

Similar Documents

Publication Publication Date Title
ATE553977T1 (de) Vorrichtung zum erkennen von anomalien für eine überwachungsanlage eines schienenfahrzeugs sowie entsprechende anlage und entsprechendes verfahren
DE60320427D1 (de) Zubehörsidentifizierungsalgorithmus für Systemstecker
TW200515357A (en) Inspection method and inspection device for display device and active matrix substrate used for display device
DE50305905D1 (de) Vorrichtung und verfahren zum prüfen von leiterplatten, und prüfsonde für diese vorrichtung und dieses verfahren
TW200615556A (en) Electronic component testing apparatus and method for configuring electronic component testing apparatus
ATE445846T1 (de) System und verfahren zur erkennung elektrischer fehler
ATE483186T1 (de) Verfahren und vorrichtung zum prüfen von halbleitern
TW200638052A (en) Method and apparatus for detecting shorts on inaccessible pins using capacitive measurements
TW200717682A (en) Method for inspecting microelectronic components on a substrate and apparatus for testing same
TW200615560A (en) Methods and apparatus for non-contact testing and diagnosing of inaccessible shorted connections
MY124258A (en) Method of testing electronic components and testing apparatus for electronic components
Gielen et al. Design and test of analog circuits towards sub-ppm level
ATE322022T1 (de) Verfahren und vorrichtung zum prüfen von leiterplatten mit einem paralleltester
DE60320171D1 (de) Verfahren zum Detektieren von Fehlern in elektronischen Bauteilen, basierend auf Ruhestrom-Messungen
ATE504846T1 (de) VERFAHREN ZUM TESTEN VON UNBESTÜCKTEN, GROßFLÄCHIGEN LEITERPLATTEN MIT EINEM FINGERTESTER
JP4824319B2 (ja) 故障検出装置及び方法、並びに信号抽出回路
Hamzah et al. Harmonic source location at the point of common coupling based on voltage magnitude
DE50310768D1 (de) Verfahren und Vorrichtung zum Überprüfen eines Umrichters
ATE317129T1 (de) Verfahren und vorrichtung zum ermitteln der qualität eines kabels
EP1367403A3 (de) Verfahren zum Detektieren von Fehlern in elektronischen Bauteilen, basierend auf Ruhestrom-Messungen
CN213210440U (zh) 一种用于集成电路自动测试机的小电流量测校准架构
JP2001330644A (ja) スクリーニング方法、スクリーニング装置及び記録媒体
JP2008298641A (ja) 回路基板検査方法及び装置
JP4416310B2 (ja) 電子デバイスの試験装置
JP3372488B2 (ja) 半導体ｃｍｏｓ集積回路の試験装置

Legal Events

Date Code Title Description
8332 No legal effect for de
8370 Indication related to discontinuation of the patent is to be deleted
8364 No opposition during term of opposition