DE60306290D1 - Interface zum Durchbrennen von Schmelzsicherungen für ein Speicherchip - Google Patents

Interface zum Durchbrennen von Schmelzsicherungen für ein Speicherchip

Info

Publication number
DE60306290D1
DE60306290D1 DE60306290T DE60306290T DE60306290D1 DE 60306290 D1 DE60306290 D1 DE 60306290D1 DE 60306290 T DE60306290 T DE 60306290T DE 60306290 T DE60306290 T DE 60306290T DE 60306290 D1 DE60306290 D1 DE 60306290D1
Authority
DE
Germany
Prior art keywords
interface
memory chip
blowing out
out fuses
fuses
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60306290T
Other languages
English (en)
Other versions
DE60306290T2 (de
Inventor
Yannis Jallamion-Grive
Jean-Patrice Coste
Michel Collura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from EP20020022312 external-priority patent/EP1408512B1/de
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Publication of DE60306290D1 publication Critical patent/DE60306290D1/de
Application granted granted Critical
Publication of DE60306290T2 publication Critical patent/DE60306290T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
    • G11C29/848—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by adjacent switching
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
    • G11C29/846—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by choosing redundant lines at an output stage
DE60306290T 2002-10-07 2003-05-28 Interface zum Durchbrennen von Schmelzsicherungen für ein Speicherchip Expired - Fee Related DE60306290T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
EP20020022312 EP1408512B1 (de) 2002-10-07 2002-10-07 Verfahren zum Speichern von Fehlern einer Speichervorrichtung in einem Diagnosefeld mit minimaler Speicherkapazität
EP02022312 2002-10-10
EP20020292946 EP1408513A1 (de) 2002-10-07 2002-11-28 Übertragsdekoder für einen Speicher
EP02292946 2002-11-28

Publications (2)

Publication Number Publication Date
DE60306290D1 true DE60306290D1 (de) 2006-08-03
DE60306290T2 DE60306290T2 (de) 2007-06-06

Family

ID=32031767

Family Applications (2)

Application Number Title Priority Date Filing Date
DE60306290T Expired - Fee Related DE60306290T2 (de) 2002-10-07 2003-05-28 Interface zum Durchbrennen von Schmelzsicherungen für ein Speicherchip
DE60302747T Expired - Lifetime DE60302747T2 (de) 2002-10-07 2003-05-28 Schaltkreis zur Reparatur von Subspalten

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE60302747T Expired - Lifetime DE60302747T2 (de) 2002-10-07 2003-05-28 Schaltkreis zur Reparatur von Subspalten

Country Status (2)

Country Link
EP (1) EP1408513A1 (de)
DE (2) DE60306290T2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1408516B1 (de) 2002-10-07 2006-06-21 Infineon Technologies AG Interface zum Durchbrennen von Schmelzsicherungen für ein Speicherchip
US7236418B2 (en) * 2004-06-25 2007-06-26 Qualcomm Incorporated Reduced area, reduced programming voltage CMOS eFUSE-based scannable non-volatile memory bitcell
CN113874943A (zh) 2019-05-31 2021-12-31 美光科技公司 实现互连冗余的嵌入式快闪存储器体系结构

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5301153A (en) * 1992-06-03 1994-04-05 Mips Computer Systems, Inc. Redundant element substitution apparatus
US6249465B1 (en) * 2000-02-18 2001-06-19 Hewlett-Packard Company Redundancy programming using addressable scan paths to reduce the number of required fuses

Also Published As

Publication number Publication date
DE60302747D1 (de) 2006-01-19
DE60302747T2 (de) 2006-08-17
EP1408513A1 (de) 2004-04-14
DE60306290T2 (de) 2007-06-06

Similar Documents

Publication Publication Date Title
DE10393094D2 (de) Schaltungsanordnung für eine Photovoltaikanlage -
ATE469037T1 (de) Bodenkonstruktion für eine flasche
DE60217591D1 (de) Speicher-Steuerung für Mehrpegel-Speicherzelle
DE60210416D1 (de) Speicherkarte
IL156854A0 (en) A multiple use memory chip
ATE309149T1 (de) Drehverschluss für einen behälter
DE50308451D1 (de) Gassack für ein Airbagmodul
DE60314068D1 (de) Nichtflüchtiger Halbleiterspeicher
DE60233985D1 (de) Testverfahren für Halbleiterspeicher
DE60315613D1 (de) Schreibschaltung für Phasenwechsel-Speicher
DE60302709D1 (de) Antikollisionsverfahren für drahtloses elektronisches Modul
DE60321569D1 (de) Sockel für automatisierten geldautomat
DE60316462D1 (de) Speicherkarte mit mehreren Speicherchips und einem Umschalter
DE60309860D1 (de) Ic-etikett
DE60304801D1 (de) Kurzschlusssteckverbindung für eine Zündpille
DE102004033444B8 (de) Integrierter Speicherschaltungsbaustein
DE50205481D1 (de) Gasstromverteiler für ein seitenairbagmodul
DE60129269D1 (de) Speicherschaltung für eine programmierbare logische integrierte Schaltungsanordnung
ITMI20020793A1 (it) Memoria a semiconduttore feram
DE60305752D1 (de) SpeicherKarte
DE60318284D1 (de) Motor-Steuerschaltung für eine Spiegelverstell-Anordnung
DE69928514D1 (de) Lesungsschaltung für einen Halbleiterspeicher
AU2003201101A8 (en) Reading circuit for reading a memory cell
DE60037559D1 (de) Herstellungsverfahren für ein Halbleiter-Bauelement
DE60314687D1 (de) Herstellungsverfahren für einen Flüssigkeitsausstosskopf

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee