DE60302747D1 - Schaltkreis zur Reparatur von Subspalten - Google Patents

Schaltkreis zur Reparatur von Subspalten

Info

Publication number
DE60302747D1
DE60302747D1 DE60302747T DE60302747T DE60302747D1 DE 60302747 D1 DE60302747 D1 DE 60302747D1 DE 60302747 T DE60302747 T DE 60302747T DE 60302747 T DE60302747 T DE 60302747T DE 60302747 D1 DE60302747 D1 DE 60302747D1
Authority
DE
Germany
Prior art keywords
repair
columns
sub
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60302747T
Other languages
English (en)
Other versions
DE60302747T2 (de
Inventor
Yann Tellier
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from EP20020022312 external-priority patent/EP1408512B1/de
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Application granted granted Critical
Publication of DE60302747D1 publication Critical patent/DE60302747D1/de
Publication of DE60302747T2 publication Critical patent/DE60302747T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
    • G11C29/848—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by adjacent switching
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
    • G11C29/846—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by choosing redundant lines at an output stage
DE60302747T 2002-10-07 2003-05-28 Schaltkreis zur Reparatur von Subspalten Expired - Lifetime DE60302747T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
EP02022312 2002-10-07
EP20020022312 EP1408512B1 (de) 2002-10-07 2002-10-07 Verfahren zum Speichern von Fehlern einer Speichervorrichtung in einem Diagnosefeld mit minimaler Speicherkapazität
EP20020292946 EP1408513A1 (de) 2002-10-07 2002-11-28 Übertragsdekoder für einen Speicher
EP02292946 2002-11-28

Publications (2)

Publication Number Publication Date
DE60302747D1 true DE60302747D1 (de) 2006-01-19
DE60302747T2 DE60302747T2 (de) 2006-08-17

Family

ID=32031767

Family Applications (2)

Application Number Title Priority Date Filing Date
DE60302747T Expired - Lifetime DE60302747T2 (de) 2002-10-07 2003-05-28 Schaltkreis zur Reparatur von Subspalten
DE60306290T Expired - Fee Related DE60306290T2 (de) 2002-10-07 2003-05-28 Interface zum Durchbrennen von Schmelzsicherungen für ein Speicherchip

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE60306290T Expired - Fee Related DE60306290T2 (de) 2002-10-07 2003-05-28 Interface zum Durchbrennen von Schmelzsicherungen für ein Speicherchip

Country Status (2)

Country Link
EP (1) EP1408513A1 (de)
DE (2) DE60302747T2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1408516B1 (de) 2002-10-07 2006-06-21 Infineon Technologies AG Interface zum Durchbrennen von Schmelzsicherungen für ein Speicherchip
US7236418B2 (en) * 2004-06-25 2007-06-26 Qualcomm Incorporated Reduced area, reduced programming voltage CMOS eFUSE-based scannable non-volatile memory bitcell
US11461197B2 (en) 2019-05-31 2022-10-04 Micron Technology, Inc. Flash memory architecture implementing interconnection redundancy

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5301153A (en) * 1992-06-03 1994-04-05 Mips Computer Systems, Inc. Redundant element substitution apparatus
US6249465B1 (en) * 2000-02-18 2001-06-19 Hewlett-Packard Company Redundancy programming using addressable scan paths to reduce the number of required fuses

Also Published As

Publication number Publication date
DE60302747T2 (de) 2006-08-17
DE60306290T2 (de) 2007-06-06
EP1408513A1 (de) 2004-04-14
DE60306290D1 (de) 2006-08-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition