DE60303757D1 - Verfahren und System zur Messung niedriger Impedanzen - Google Patents

Verfahren und System zur Messung niedriger Impedanzen

Info

Publication number
DE60303757D1
DE60303757D1 DE60303757T DE60303757T DE60303757D1 DE 60303757 D1 DE60303757 D1 DE 60303757D1 DE 60303757 T DE60303757 T DE 60303757T DE 60303757 T DE60303757 T DE 60303757T DE 60303757 D1 DE60303757 D1 DE 60303757D1
Authority
DE
Germany
Prior art keywords
measuring low
low impedances
impedances
measuring
low
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60303757T
Other languages
English (en)
Other versions
DE60303757T2 (de
Inventor
Isaac Kantorovich
Stephen C Root
Christopher L Houghton
Laurent James J St
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Development Co LP
Original Assignee
Hewlett Packard Development Co LP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Development Co LP filed Critical Hewlett Packard Development Co LP
Publication of DE60303757D1 publication Critical patent/DE60303757D1/de
Application granted granted Critical
Publication of DE60303757T2 publication Critical patent/DE60303757T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/20—Measuring earth resistance; Measuring contact resistance, e.g. of earth connections, e.g. plates
    • G01R27/205—Measuring contact resistance of connections, e.g. of earth connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
DE60303757T 2002-10-21 2003-10-17 Verfahren und System zur Messung niedriger Impedanzen Expired - Lifetime DE60303757T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/274,611 US6911827B2 (en) 2002-10-21 2002-10-21 System and method of measuring low impedances
US274611 2002-10-21

Publications (2)

Publication Number Publication Date
DE60303757D1 true DE60303757D1 (de) 2006-04-27
DE60303757T2 DE60303757T2 (de) 2006-08-17

Family

ID=32069292

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60303757T Expired - Lifetime DE60303757T2 (de) 2002-10-21 2003-10-17 Verfahren und System zur Messung niedriger Impedanzen

Country Status (7)

Country Link
US (1) US6911827B2 (de)
EP (1) EP1413891B1 (de)
JP (1) JP2004144746A (de)
KR (1) KR20040034539A (de)
DE (1) DE60303757T2 (de)
IL (1) IL155908A0 (de)
TW (1) TW200406587A (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8073739B2 (en) 2004-12-22 2011-12-06 Ebay Inc. Method and system to deliver a digital good
GB2429301B (en) * 2005-08-19 2007-08-01 Megger Ltd Testing loop impedence in an RCCB electrical test circuit
US8001601B2 (en) * 2006-06-02 2011-08-16 At&T Intellectual Property Ii, L.P. Method and apparatus for large-scale automated distributed denial of service attack detection
US7203608B1 (en) 2006-06-16 2007-04-10 International Business Machines Corporation Impedane measurement of chip, package, and board power supply system using pseudo impulse response
US7818595B2 (en) * 2006-06-30 2010-10-19 Intel Corporation Method, system, and apparatus for dynamic clock adjustment
US8958761B2 (en) 2006-10-25 2015-02-17 Nxp, B.V. Determining on chip loading impedance of RF circuit
KR100975032B1 (ko) * 2008-02-14 2010-08-11 정미향 꽃포장지 제조장치
US8519720B2 (en) 2010-07-14 2013-08-27 International Business Machines Corporation Method and system for impedance measurement in an integrated Circuit
US8659310B2 (en) 2010-07-14 2014-02-25 International Business Machines Corporation Method and system for performing self-tests in an electronic system
US9709625B2 (en) * 2010-11-19 2017-07-18 International Business Machines Corporation Measuring power consumption in an integrated circuit
US20140074449A1 (en) * 2012-09-07 2014-03-13 Lsi Corporation Scalable power model calibration
CN103884888B (zh) * 2012-12-20 2018-03-16 北京普源精电科技有限公司 具有万用表功能的示波器
CN113325237A (zh) * 2021-05-21 2021-08-31 中国电子技术标准化研究院 一种射频阻抗测量方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4023098A (en) * 1975-08-27 1977-05-10 Hewlett-Packard Company Noise burst source for transfer function testing
GB2258774B (en) * 1991-08-16 1994-12-07 Marconi Instruments Ltd Waveform generators
US5343404A (en) * 1992-11-12 1994-08-30 Maritec Corp. Precision digital multimeter and waveform synthesizer for multi-signals with distorted waveforms embedded in noise
US5465287A (en) * 1994-01-13 1995-11-07 Teledata Communication Ltd. Subscriber line impedance measurement device and method
US5909656A (en) * 1997-03-05 1999-06-01 Abb Power T&D Company Inc. Protective relay with improved DFT function
US5963023A (en) 1998-03-21 1999-10-05 Advanced Micro Devices, Inc. Power surge management for high performance integrated circuit
KR100317598B1 (ko) * 1999-03-13 2001-12-22 박찬구 라플라스 변환 임피던스 측정방법 및 측정장치
EP1221041B1 (de) * 1999-10-12 2010-01-20 Gerald Wiegand Zeitlich hochaufgelöste impedanzspektroskopie
US6768952B2 (en) * 2002-10-21 2004-07-27 Hewlett-Packard Development Company, L.P. System and method of measuring low impedances

Also Published As

Publication number Publication date
KR20040034539A (ko) 2004-04-28
JP2004144746A (ja) 2004-05-20
US20040075451A1 (en) 2004-04-22
IL155908A0 (en) 2003-12-23
TW200406587A (en) 2004-05-01
US6911827B2 (en) 2005-06-28
EP1413891A1 (de) 2004-04-28
EP1413891B1 (de) 2006-03-01
DE60303757T2 (de) 2006-08-17

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition