DE60301718D1 - Messung von niedrigen Impedanzen - Google Patents

Messung von niedrigen Impedanzen

Info

Publication number
DE60301718D1
DE60301718D1 DE60301718T DE60301718T DE60301718D1 DE 60301718 D1 DE60301718 D1 DE 60301718D1 DE 60301718 T DE60301718 T DE 60301718T DE 60301718 T DE60301718 T DE 60301718T DE 60301718 D1 DE60301718 D1 DE 60301718D1
Authority
DE
Germany
Prior art keywords
measurement
low impedances
impedances
low
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60301718T
Other languages
English (en)
Other versions
DE60301718T2 (de
Inventor
Isaac Kantorovich
Christopher L Houghton
Laurent James J St
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Development Co LP
Original Assignee
Hewlett Packard Development Co LP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Development Co LP filed Critical Hewlett Packard Development Co LP
Publication of DE60301718D1 publication Critical patent/DE60301718D1/de
Application granted granted Critical
Publication of DE60301718T2 publication Critical patent/DE60301718T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/16—Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/20—Measuring earth resistance; Measuring contact resistance, e.g. of earth connections, e.g. plates
    • G01R27/205—Measuring contact resistance of connections, e.g. of earth connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test
DE60301718T 2002-10-21 2003-10-17 Messung von niedrigen Impedanzen Expired - Lifetime DE60301718T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/274,787 US6768952B2 (en) 2002-10-21 2002-10-21 System and method of measuring low impedances
US274787 2002-10-21

Publications (2)

Publication Number Publication Date
DE60301718D1 true DE60301718D1 (de) 2006-02-09
DE60301718T2 DE60301718T2 (de) 2006-03-23

Family

ID=32069298

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60301718T Expired - Lifetime DE60301718T2 (de) 2002-10-21 2003-10-17 Messung von niedrigen Impedanzen

Country Status (7)

Country Link
US (1) US6768952B2 (de)
EP (1) EP1413893B1 (de)
JP (1) JP2004144747A (de)
KR (1) KR20040034541A (de)
DE (1) DE60301718T2 (de)
IL (1) IL155930A (de)
TW (1) TWI221909B (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6911827B2 (en) * 2002-10-21 2005-06-28 Hewlett-Packard Development Company, L.P. System and method of measuring low impedances
US20050058457A1 (en) * 2003-09-15 2005-03-17 Macdougall Trevor Method and apparatus for optical noise cancellation
US7138815B1 (en) * 2003-12-24 2006-11-21 Xilinx, Inc. Power distribution system built-in self test using on-chip data converter
US7599299B2 (en) * 2004-04-30 2009-10-06 Xilinx, Inc. Dynamic reconfiguration of a system monitor (DRPORT)
US20070011544A1 (en) * 2005-06-15 2007-01-11 Hsiu-Huan Shen Reprogramming of tester resource assignments
GB2429301B (en) * 2005-08-19 2007-08-01 Megger Ltd Testing loop impedence in an RCCB electrical test circuit
US7614737B2 (en) * 2005-12-16 2009-11-10 Lexmark International Inc. Method for identifying an installed cartridge
US7203608B1 (en) * 2006-06-16 2007-04-10 International Business Machines Corporation Impedane measurement of chip, package, and board power supply system using pseudo impulse response
US7818595B2 (en) * 2006-06-30 2010-10-19 Intel Corporation Method, system, and apparatus for dynamic clock adjustment
US20090088625A1 (en) * 2007-10-01 2009-04-02 Kenneth Oosting Photonic Based Non-Invasive Surgery System That Includes Automated Cell Control and Eradication Via Pre-Calculated Feed-Forward Control Plus Image Feedback Control For Targeted Energy Delivery
TWI400454B (zh) * 2008-08-01 2013-07-01 Tony Sheng Lin 泛用式安全加固型無限儲存交流阻抗量測登錄裝置
TWI384233B (zh) * 2009-03-27 2013-02-01 Chroma Ate Inc 輸出阻抗量測方法及裝置
US8519720B2 (en) 2010-07-14 2013-08-27 International Business Machines Corporation Method and system for impedance measurement in an integrated Circuit
US8659310B2 (en) 2010-07-14 2014-02-25 International Business Machines Corporation Method and system for performing self-tests in an electronic system
US9709625B2 (en) * 2010-11-19 2017-07-18 International Business Machines Corporation Measuring power consumption in an integrated circuit
DE102012006195A1 (de) 2012-03-27 2013-10-02 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Vektorieller Netzwerkanalysator
US20140074449A1 (en) * 2012-09-07 2014-03-13 Lsi Corporation Scalable power model calibration
US10242290B2 (en) 2012-11-09 2019-03-26 Kla-Tencor Corporation Method, system, and user interface for metrology target characterization
WO2018109726A1 (en) * 2016-12-14 2018-06-21 Sendyne Corporation Compensating for the skin effect in a current shunt
CN108982968B (zh) * 2018-08-06 2019-09-20 浙江大学 一种接触电阻的在线测量系统及测量方法
US11498442B2 (en) * 2019-09-17 2022-11-15 Dr. Ing. H.C. F. Porsche Aktiengesellschaft Systems and methods for noise cancellation in protective earth resistance check of vehicle onboard battery charger
US11740272B2 (en) 2020-05-28 2023-08-29 Taiwan Semiconductor Manufacturing Company, Ltd. Integrated impedance measurement device and impedance measurement method thereof
TWI801878B (zh) * 2020-05-28 2023-05-11 台灣積體電路製造股份有限公司 阻抗測量裝置以及決定待測裝置的阻抗之系統和方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4196475A (en) 1976-09-02 1980-04-01 Genrad, Inc. Method of and apparatus for automatic measurement of impedance or other parameters with microprocessor calculation techniques
US4811345A (en) 1986-12-16 1989-03-07 Advanced Micro Devices, Inc. Methods and apparatus for providing a user oriented microprocessor test interface for a complex, single chip, general purpose central processing unit
US5203000A (en) * 1988-12-09 1993-04-13 Dallas Semiconductor Corp. Power-up reset conditioned on direction of voltage change
US5828822A (en) * 1995-04-21 1998-10-27 Nighthawk Systems, Inc. Watchdog circuit for carbon monoxide monitors
US5627476A (en) 1995-06-27 1997-05-06 Seagate Technology, Inc. Milliohm impedance measurement
US5963023A (en) * 1998-03-21 1999-10-05 Advanced Micro Devices, Inc. Power surge management for high performance integrated circuit
KR100395516B1 (ko) 1998-11-19 2003-12-18 금호석유화학 주식회사 비선형등가회로모형을이용한축전장치의특성인자수치화방법및장치
KR100317598B1 (ko) 1999-03-13 2001-12-22 박찬구 라플라스 변환 임피던스 측정방법 및 측정장치

Also Published As

Publication number Publication date
US20040078156A1 (en) 2004-04-22
IL155930A (en) 2005-12-18
US6768952B2 (en) 2004-07-27
KR20040034541A (ko) 2004-04-28
TW200406586A (en) 2004-05-01
TWI221909B (en) 2004-10-11
EP1413893B1 (de) 2005-09-28
JP2004144747A (ja) 2004-05-20
DE60301718T2 (de) 2006-03-23
IL155930A0 (en) 2003-12-23
EP1413893A1 (de) 2004-04-28

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Legal Events

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