DE60237255D1 - Fixpunktzelle, Apparat zur Realisierung einer Fixpunkttemperatur und Thermometerkalibrierungsmethode - Google Patents

Fixpunktzelle, Apparat zur Realisierung einer Fixpunkttemperatur und Thermometerkalibrierungsmethode

Info

Publication number
DE60237255D1
DE60237255D1 DE60237255T DE60237255T DE60237255D1 DE 60237255 D1 DE60237255 D1 DE 60237255D1 DE 60237255 T DE60237255 T DE 60237255T DE 60237255 T DE60237255 T DE 60237255T DE 60237255 D1 DE60237255 D1 DE 60237255D1
Authority
DE
Germany
Prior art keywords
fixed point
realizing
calibration method
thermometer calibration
point temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60237255T
Other languages
English (en)
Inventor
Naohiko Sasajima
Yoshiro Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
National Institute of Advanced Industrial Science and Technology AIST
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Institute of Advanced Industrial Science and Technology AIST filed Critical National Institute of Advanced Industrial Science and Technology AIST
Application granted granted Critical
Publication of DE60237255D1 publication Critical patent/DE60237255D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00—Testing or calibrating of thermometers
    • G01K15/002—Calibrated temperature sources, temperature standards therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Radiation Pyrometers (AREA)
DE60237255T 2001-03-02 2002-03-01 Fixpunktzelle, Apparat zur Realisierung einer Fixpunkttemperatur und Thermometerkalibrierungsmethode Expired - Lifetime DE60237255D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001058447A JP3404531B2 (ja) 2001-03-02 2001-03-02 温度校正方法および装置

Publications (1)

Publication Number Publication Date
DE60237255D1 true DE60237255D1 (de) 2010-09-23

Family

ID=18918169

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60237255T Expired - Lifetime DE60237255D1 (de) 2001-03-02 2002-03-01 Fixpunktzelle, Apparat zur Realisierung einer Fixpunkttemperatur und Thermometerkalibrierungsmethode

Country Status (4)

Country Link
US (1) US6641299B2 (de)
EP (1) EP1236982B1 (de)
JP (1) JP3404531B2 (de)
DE (1) DE60237255D1 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0114429D0 (en) * 2001-06-13 2001-08-08 Secretary Trade Ind Brit System for calibrating thermometers
KR100542244B1 (ko) * 2003-09-04 2006-01-11 한국표준과학연구원 온도계 보호관 결합용 고정점 셀 및 고정점 셀을 이용한온도계 수명 예측장치
JP4521511B2 (ja) * 2004-04-27 2010-08-11 独立行政法人産業技術総合研究所 温度定点セル、温度定点装置および温度計校正方法
US7275861B2 (en) * 2005-01-31 2007-10-02 Veeco Instruments Inc. Calibration wafer and method of calibrating in situ temperatures
JP4565159B2 (ja) * 2005-10-14 2010-10-20 独立行政法人産業技術総合研究所 温度定点セル、温度定点装置および温度計校正方法
JP4639383B2 (ja) * 2006-02-24 2011-02-23 独立行政法人産業技術総合研究所 温度定点セル、温度定点装置及び温度計校正方法
US7507019B2 (en) 2006-05-19 2009-03-24 Covidien Ag Thermometer calibration
US20070268954A1 (en) * 2006-05-19 2007-11-22 Sherwood Services Ag Portable test apparatus for radiation-sensing thermometer
US7549792B2 (en) 2006-10-06 2009-06-23 Covidien Ag Electronic thermometer with selectable modes
GB0717714D0 (en) * 2007-09-11 2007-10-17 Isothermal Technology Ltd A temperature measuring device
FR2960970B1 (fr) * 2010-06-03 2015-02-20 Snecma Mesure de l'endommagement d'une barriere thermique d'aube de turbine
JP5761705B2 (ja) * 2011-01-07 2015-08-12 国立研究開発法人産業技術総合研究所 温度標準用気体循環式温度可変恒温炉装置
DE102011016612A1 (de) * 2011-04-06 2012-10-11 Technische Universität Ilmenau Verfahren und Anordnung zur Kalibrierung von Thermometern
FR2979990B1 (fr) * 2011-09-09 2013-12-27 Andra Dispositif d'etalonnage en temperature et procedes d'etalonnage en temperature et positionnement d'un capteur de temperature a fibre optique
KR101432159B1 (ko) * 2013-02-05 2014-08-20 에이피시스템 주식회사 온도측정 파이로미터의 교정 장치
KR101389003B1 (ko) * 2013-02-05 2014-04-24 에이피시스템 주식회사 온도측정 파이로미터의 교정 장치
CN105067123B (zh) * 2015-05-13 2018-09-14 高伟 一种高效叠层式高温黑体炉体
CN105586502B (zh) * 2015-12-24 2017-08-25 中国计量科学研究院 一种基于金属碳共晶体或包晶体的高温固定点制备方法和制备装置
EP3767263B1 (de) * 2019-07-16 2022-12-21 Herzog Maschinenfabrik GmbH & Co. KG Aufschlussvorrichtung mit einer schmelztemperaturmessvorrichtung und kalibrierverfahren
CN114076638B (zh) * 2020-08-20 2023-10-13 北京振兴计量测试研究所 一种阈值材料的高温标定方法及设备

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3077539A (en) * 1961-08-28 1963-02-12 Little Inc A Radiation reference standard
US3270547A (en) * 1963-08-12 1966-09-06 Exxon Research Engineering Co Thermocouple calibration system
US3513705A (en) 1968-07-29 1970-05-26 Us Air Force Method and means for indicating ultrahigh temperatures
US4244207A (en) * 1979-03-09 1981-01-13 The Perkin-Elmer Corporation Temperature standard
US4627740A (en) * 1984-04-06 1986-12-09 Digital Dynamics, Inc. Self-calibrating temperature probe apparatus and method for use thereof
US5608838A (en) * 1994-12-07 1997-03-04 Brookley; Charles E. Blackbody type heating element for calibration furnace with pyrolytic graphite coating disposed on end cap electrode members
JP2987459B1 (ja) 1998-12-11 1999-12-06 工業技術院長 温度定点るつぼ、温度定点装置及び温度計校正方法

Also Published As

Publication number Publication date
US6641299B2 (en) 2003-11-04
JP3404531B2 (ja) 2003-05-12
EP1236982B1 (de) 2010-08-11
US20020122457A1 (en) 2002-09-05
JP2002257642A (ja) 2002-09-11
EP1236982A1 (de) 2002-09-04

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