DE60212785D1 - Photoelektrischer Multi-Achsen-Sensor mit Interferenzlichtdetektion - Google Patents

Photoelektrischer Multi-Achsen-Sensor mit Interferenzlichtdetektion

Info

Publication number
DE60212785D1
DE60212785D1 DE60212785T DE60212785T DE60212785D1 DE 60212785 D1 DE60212785 D1 DE 60212785D1 DE 60212785 T DE60212785 T DE 60212785T DE 60212785 T DE60212785 T DE 60212785T DE 60212785 D1 DE60212785 D1 DE 60212785D1
Authority
DE
Germany
Prior art keywords
interfering light
detection timing
pulses
light detection
timing signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60212785T
Other languages
English (en)
Other versions
DE60212785T2 (de
Inventor
Toru Wake
Daisuke Hayakawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Industrial Devices SUNX Co Ltd
Original Assignee
Sunx Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2001331504A external-priority patent/JP3860013B2/ja
Priority claimed from JP2001397471A external-priority patent/JP2003194962A/ja
Application filed by Sunx Ltd filed Critical Sunx Ltd
Publication of DE60212785D1 publication Critical patent/DE60212785D1/de
Application granted granted Critical
Publication of DE60212785T2 publication Critical patent/DE60212785T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00Prospecting or detecting by optical means
    • G01V8/10Detecting, e.g. by using light barriers
    • G01V8/20Detecting, e.g. by using light barriers using multiple transmitters or receivers

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Geophysics (AREA)
  • Switches Operated By Changes In Physical Conditions (AREA)
  • Electronic Switches (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
DE60212785T 2001-10-29 2002-10-25 Photoelektrischer Multi-Achsen-Sensor mit Interferenzlichtdetektion Expired - Fee Related DE60212785T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2001331504 2001-10-29
JP2001331504A JP3860013B2 (ja) 2001-10-29 2001-10-29 多光軸光電センサ
JP2001397471 2001-12-27
JP2001397471A JP2003194962A (ja) 2001-12-27 2001-12-27 光電センサ

Publications (2)

Publication Number Publication Date
DE60212785D1 true DE60212785D1 (de) 2006-08-10
DE60212785T2 DE60212785T2 (de) 2007-06-28

Family

ID=26624175

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60212785T Expired - Fee Related DE60212785T2 (de) 2001-10-29 2002-10-25 Photoelektrischer Multi-Achsen-Sensor mit Interferenzlichtdetektion

Country Status (6)

Country Link
US (1) US6858832B2 (de)
EP (2) EP1306693B1 (de)
AT (1) ATE331963T1 (de)
AU (1) AU2002301601B2 (de)
CA (1) CA2409638A1 (de)
DE (1) DE60212785T2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4353047B2 (ja) * 2004-09-30 2009-10-28 オムロン株式会社 多光軸光電センサ
DE102005048892B4 (de) * 2005-09-22 2009-01-15 Siemens Ag Vorrichtung zur Durchführung von Rotablation sowie medizinische Behandlungseinrichtung
DE102006050303A1 (de) * 2005-12-05 2007-06-14 Cedes Ag Sensoranordnung sowie Sensorvorrichtung für eine Sensoranordnung
EP2259093B1 (de) 2009-06-04 2015-04-29 Sick Ag Optoelektronische Sensoranordnung und Verfahren zum Betrieb einer solchen
CN102317813B (zh) * 2009-07-30 2013-11-13 欧姆龙株式会社 安全传感器及安全传感器的异常检测方法
JP5806892B2 (ja) 2010-09-30 2015-11-10 シスメックス株式会社 検出物質の電気化学的検出方法および被検物質の電気化学的検出方法
JP5970230B2 (ja) * 2012-05-08 2016-08-17 アツミ電氣株式会社 測距型防犯センサ
JP6878931B2 (ja) 2017-02-08 2021-06-02 オムロン株式会社 センサ制御装置、およびセンサシステム
DE102020133095A1 (de) 2020-12-11 2022-06-15 Wenglor sensoric elektronische Geräte GmbH Verfahren zur Bestimmung einer Distanz zwischen einer Messvorrichtung und einem Objekt
CN113064213B (zh) * 2021-03-10 2023-05-09 欧姆龙(上海)有限公司 受光装置和光电传感器

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3970846A (en) * 1973-10-29 1976-07-20 Xenex Corporation Presence detecting system with self-checking
JPS57136179A (en) 1981-02-17 1982-08-23 Omron Tateisi Electronics Co Photoelectric switch
JP3354210B2 (ja) * 1993-06-11 2002-12-09 北陽電機株式会社 光電スイッチ
JP2911369B2 (ja) * 1994-07-29 1999-06-23 サンクス株式会社 多光軸光電センサ
DE19537615B4 (de) * 1995-10-09 2005-02-17 Sick Ag Verfahren zum Betrieb eines optischen Lichttasters
JP3510736B2 (ja) * 1996-07-26 2004-03-29 セコム株式会社 物体検出器
FR2813129B1 (fr) * 2000-08-16 2002-10-11 Schneider Electric Ind Sa Disposition anti-interferences pour cellules optiques

Also Published As

Publication number Publication date
ATE331963T1 (de) 2006-07-15
CA2409638A1 (en) 2003-04-29
EP1306693A1 (de) 2003-05-02
DE60212785T2 (de) 2007-06-28
EP1548466A1 (de) 2005-06-29
US20030080284A1 (en) 2003-05-01
AU2002301601B2 (en) 2007-06-28
EP1306693B1 (de) 2006-06-28
US6858832B2 (en) 2005-02-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee