DE602007007020D1 - EUV-Lichtquelle, deren aktives Material vor der Plasmazündung durch einen Energiestrahl verdampft wird - Google Patents
EUV-Lichtquelle, deren aktives Material vor der Plasmazündung durch einen Energiestrahl verdampft wirdInfo
- Publication number
- DE602007007020D1 DE602007007020D1 DE602007007020T DE602007007020T DE602007007020D1 DE 602007007020 D1 DE602007007020 D1 DE 602007007020D1 DE 602007007020 T DE602007007020 T DE 602007007020T DE 602007007020 T DE602007007020 T DE 602007007020T DE 602007007020 D1 DE602007007020 D1 DE 602007007020D1
- Authority
- DE
- Germany
- Prior art keywords
- vaporized
- light source
- active material
- energy beam
- euv light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K5/00—Irradiation devices
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—X-ray radiation generated from plasma
- H05G2/003—X-ray radiation generated from plasma being produced from a liquid or gas
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—X-ray radiation generated from plasma
- H05G2/003—X-ray radiation generated from plasma being produced from a liquid or gas
- H05G2/005—X-ray radiation generated from plasma being produced from a liquid or gas containing a metal as principal radiation generating component
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- X-Ray Techniques (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006205807 | 2006-07-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602007007020D1 true DE602007007020D1 (de) | 2010-07-22 |
Family
ID=38581958
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602007007020T Active DE602007007020D1 (de) | 2006-07-28 | 2007-07-27 | EUV-Lichtquelle, deren aktives Material vor der Plasmazündung durch einen Energiestrahl verdampft wird |
Country Status (5)
Country | Link |
---|---|
US (1) | US7626188B2 (de) |
EP (1) | EP1883280B1 (de) |
KR (1) | KR20080011048A (de) |
DE (1) | DE602007007020D1 (de) |
TW (1) | TW200808134A (de) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005030304B4 (de) * | 2005-06-27 | 2008-06-26 | Xtreme Technologies Gmbh | Vorrichtung und Verfahren zur Erzeugung von extrem ultravioletter Strahlung |
US8493548B2 (en) * | 2007-08-06 | 2013-07-23 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US8901521B2 (en) | 2007-08-23 | 2014-12-02 | Asml Netherlands B.V. | Module and method for producing extreme ultraviolet radiation |
JP2009099390A (ja) | 2007-10-17 | 2009-05-07 | Tokyo Institute Of Technology | 極端紫外光光源装置および極端紫外光発生方法 |
DE102007060807B4 (de) * | 2007-12-18 | 2009-11-26 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Gasentladungsquelle, insbesondere für EUV-Strahlung |
EP2083328B1 (de) * | 2008-01-28 | 2013-06-19 | Media Lario s.r.l. | Kollektor für streifenden Strahlungseinfall geeignet für lasererzeugte Plasmaquellen |
CN102119365B (zh) * | 2008-08-14 | 2013-06-05 | Asml荷兰有限公司 | 辐射源、光刻设备和器件制造方法 |
JP5454881B2 (ja) * | 2008-08-29 | 2014-03-26 | ギガフォトン株式会社 | 極端紫外光源装置及び極端紫外光の発生方法 |
DE102008049494A1 (de) * | 2008-09-27 | 2010-04-08 | Xtreme Technologies Gmbh | Verfahren und Anordnung zum Betreiben von plasmabasierten kurzwelligen Strahlungsquellen |
JP5687488B2 (ja) * | 2010-02-22 | 2015-03-18 | ギガフォトン株式会社 | 極端紫外光生成装置 |
JP5093267B2 (ja) * | 2010-03-11 | 2012-12-12 | ウシオ電機株式会社 | 集光鏡アッセンブリおよびこの集光鏡アッセンブリを用いた極端紫外光光源装置 |
CN103108480B (zh) * | 2012-11-22 | 2015-09-23 | 中国科学院微电子研究所 | 一种euv光源污染物收集装置 |
JP6477179B2 (ja) * | 2015-04-07 | 2019-03-06 | ウシオ電機株式会社 | 放電電極及び極端紫外光光源装置 |
EP3291650B1 (de) * | 2016-09-02 | 2019-06-05 | ETH Zürich | Vorrichtung und verfahren zur erzeugung von uv- oder röntgenstrahlung mittels eines plasmas |
CN108020572B (zh) * | 2016-10-31 | 2020-07-10 | 清华大学 | 碳纳米管的表征方法 |
DE102021106289A1 (de) * | 2020-05-07 | 2021-11-11 | Taiwan Semiconductor Manufacturing Co., Ltd. | System und verfahren zum ausführen von extrem-ultraviolett-photolithografieprozessen |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6972421B2 (en) * | 2000-06-09 | 2005-12-06 | Cymer, Inc. | Extreme ultraviolet light source |
GB0111204D0 (en) * | 2001-05-08 | 2001-06-27 | Mertek Ltd | High flux,high energy photon source |
EP1406124A1 (de) * | 2002-10-03 | 2004-04-07 | ASML Netherlands B.V. | Strahlungsquelle, lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung |
CN100476585C (zh) | 2002-12-23 | 2009-04-08 | Asml荷兰有限公司 | 具有可扩展薄片的杂质屏蔽 |
US7619232B2 (en) | 2003-06-27 | 2009-11-17 | Xtreme Technologies Gmbh | Method and device for producing extreme ultraviolet radiation or soft X-ray radiation |
DE10342239B4 (de) | 2003-09-11 | 2018-06-07 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und Vorrichtung zum Erzeugen von Extrem-Ultraviolettstrahlung oder weicher Röntgenstrahlung |
RU2278483C2 (ru) | 2004-04-14 | 2006-06-20 | Владимир Михайлович Борисов | Эуф источник с вращающимися электродами и способ получения эуф излучения из газоразрядной плазмы |
CN101065999B (zh) * | 2004-11-29 | 2011-04-06 | 皇家飞利浦电子股份有限公司 | 用于产生波长范围从大约1nm至大约30nm的辐射并在光刻装置或计量学中使用的方法和设备 |
-
2007
- 2007-05-04 TW TW096115950A patent/TW200808134A/zh unknown
- 2007-06-08 KR KR1020070056007A patent/KR20080011048A/ko not_active Application Discontinuation
- 2007-07-27 DE DE602007007020T patent/DE602007007020D1/de active Active
- 2007-07-27 EP EP07014791A patent/EP1883280B1/de not_active Expired - Fee Related
- 2007-07-30 US US11/830,297 patent/US7626188B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20080048134A1 (en) | 2008-02-28 |
US7626188B2 (en) | 2009-12-01 |
KR20080011048A (ko) | 2008-01-31 |
EP1883280B1 (de) | 2010-06-09 |
EP1883280A1 (de) | 2008-01-30 |
TW200808134A (en) | 2008-02-01 |
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