DE602007006347D1 - Verfahren zur bestimmung der derzeitigen rückwegintegrität in einer elektrischen einrichtung, die mit einer weiteren einrichtung verbunden oder verbindbar ist - Google Patents

Verfahren zur bestimmung der derzeitigen rückwegintegrität in einer elektrischen einrichtung, die mit einer weiteren einrichtung verbunden oder verbindbar ist

Info

Publication number
DE602007006347D1
DE602007006347D1 DE602007006347T DE602007006347T DE602007006347D1 DE 602007006347 D1 DE602007006347 D1 DE 602007006347D1 DE 602007006347 T DE602007006347 T DE 602007006347T DE 602007006347 T DE602007006347 T DE 602007006347T DE 602007006347 D1 DE602007006347 D1 DE 602007006347D1
Authority
DE
Germany
Prior art keywords
signal
electric device
near end
integrity
end crosstalk
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602007006347T
Other languages
English (en)
Inventor
Roland Frech
Erich Klink
Juergen Saalmueller
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE602007006347D1 publication Critical patent/DE602007006347D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/16—Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/31855—Interconnection testing, e.g. crosstalk, shortcircuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/70—Testing of connections between components and printed circuit boards
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B3/00—Line transmission systems
    • H04B3/02—Details
    • H04B3/46—Monitoring; Testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B3/00—Line transmission systems
    • H04B3/02—Details
    • H04B3/46—Monitoring; Testing
    • H04B3/487—Testing crosstalk effects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Control Of Direct Current Motors (AREA)
DE602007006347T 2007-01-17 2007-11-20 Verfahren zur bestimmung der derzeitigen rückwegintegrität in einer elektrischen einrichtung, die mit einer weiteren einrichtung verbunden oder verbindbar ist Active DE602007006347D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07100678 2007-01-17
PCT/EP2007/062542 WO2008086908A1 (en) 2007-01-17 2007-11-20 A method for determining the current return path integrity in an electric device connected or connectable to a further device

Publications (1)

Publication Number Publication Date
DE602007006347D1 true DE602007006347D1 (de) 2010-06-17

Family

ID=39247276

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602007006347T Active DE602007006347D1 (de) 2007-01-17 2007-11-20 Verfahren zur bestimmung der derzeitigen rückwegintegrität in einer elektrischen einrichtung, die mit einer weiteren einrichtung verbunden oder verbindbar ist

Country Status (7)

Country Link
US (5) US8248082B2 (de)
EP (1) EP2104863B1 (de)
JP (1) JP4639263B2 (de)
KR (1) KR20090097855A (de)
AT (1) ATE467132T1 (de)
DE (1) DE602007006347D1 (de)
WO (1) WO2008086908A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8248082B2 (en) 2007-01-17 2012-08-21 International Business Machines Corporation Method for determining the current return path integrity in an electric device connected or connectable to a further device
EP2204659B1 (de) * 2008-03-07 2018-06-13 RTE Réseau de Transport d'Electricité Verfahren und Vorrichtung zur Fehlerlokalisierung in einer elektrischen Verbindung
US10705134B2 (en) * 2017-12-04 2020-07-07 International Business Machines Corporation High speed chip substrate test fixture
JP6410915B1 (ja) * 2017-12-19 2018-10-24 馬鞍山市明珠電子科技有限公司 電気機器及び電気機器の接地状態検知方法
CN111277291A (zh) * 2018-11-16 2020-06-12 英业达科技有限公司 电路装置

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2065312B (en) * 1979-11-16 1983-06-08 Post Office Location of croos-talk faults by correlation
US4620282A (en) * 1984-02-03 1986-10-28 Shelley Marlin C System and method for documenting and checking cable interconnections
JP2763793B2 (ja) * 1989-07-15 1998-06-11 富士通株式会社 プリント配線板検査装置
US5513188A (en) 1991-09-10 1996-04-30 Hewlett-Packard Company Enhanced interconnect testing through utilization of board topology data
JPH06194401A (ja) * 1992-04-01 1994-07-15 Pentek Inc 電線・ケーブル系統の異常検知装置
JP3399630B2 (ja) * 1993-09-27 2003-04-21 株式会社日立製作所 バスシステム
US5570029A (en) 1994-03-30 1996-10-29 Fluke Corporation Cable crosstalk measurement system
JP3397957B2 (ja) * 1996-01-10 2003-04-21 株式会社オートネットワーク技術研究所 ワイヤーハーネスの故障位置検出方法及び同方法に用いるワイヤーハーネス
US5821760A (en) * 1996-07-31 1998-10-13 Fluke Corporation Method and apparatus for measuring near-end cross-talk in patch cords
JPH1090337A (ja) * 1996-09-13 1998-04-10 Tokyo Electric Power Co Inc:The ケーブルの劣化測定方法
US6040770A (en) * 1997-09-05 2000-03-21 Britton; Rick A. Communication path integrity supervision in a network system for automatic alarm data communication
JP4248627B2 (ja) * 1998-07-30 2009-04-02 関西電力株式会社 地絡検査装置
JP3880286B2 (ja) * 1999-05-12 2007-02-14 エルピーダメモリ株式会社 方向性結合式メモリシステム
JP2003050256A (ja) * 2001-08-08 2003-02-21 Hitachi Ltd プリント基板検査装置
US20030182640A1 (en) 2002-03-20 2003-09-25 Alani Alaa F. Signal integrity analysis system
US6954076B2 (en) * 2002-09-06 2005-10-11 Northrop Grumman Corporation Aircraft multi-function wire and insulation tester
US7071705B2 (en) * 2004-01-08 2006-07-04 Panduit Corp. Apparatus and method for communications testing
US7225420B2 (en) * 2005-02-10 2007-05-29 Honeywell International Inc. System and method for signal integrity testing of electronic circuits
US7472026B2 (en) * 2006-12-22 2008-12-30 General Electric Company Multi-ended fault location system
US8248082B2 (en) 2007-01-17 2012-08-21 International Business Machines Corporation Method for determining the current return path integrity in an electric device connected or connectable to a further device
EP2065312A1 (de) 2007-11-22 2009-06-03 Nodrops Aktiengesellschaft Einrichtung zum tropfenfreien Ausgiessen von Flüssigkeiten

Also Published As

Publication number Publication date
EP2104863B1 (de) 2010-05-05
US8248082B2 (en) 2012-08-21
US9134364B2 (en) 2015-09-15
US20150309100A1 (en) 2015-10-29
US9891256B2 (en) 2018-02-13
US20120293185A1 (en) 2012-11-22
US9581631B2 (en) 2017-02-28
JP2010517002A (ja) 2010-05-20
US20160216302A1 (en) 2016-07-28
WO2008086908A1 (en) 2008-07-24
JP4639263B2 (ja) 2011-02-23
US20170122993A1 (en) 2017-05-04
ATE467132T1 (de) 2010-05-15
US20100109679A1 (en) 2010-05-06
KR20090097855A (ko) 2009-09-16
US9304158B2 (en) 2016-04-05
EP2104863A1 (de) 2009-09-30

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