DE602007006249D1 - Vorrichtung zur Analyse fluoreszenter Röntgenstrahlen - Google Patents

Vorrichtung zur Analyse fluoreszenter Röntgenstrahlen

Info

Publication number
DE602007006249D1
DE602007006249D1 DE602007006249T DE602007006249T DE602007006249D1 DE 602007006249 D1 DE602007006249 D1 DE 602007006249D1 DE 602007006249 T DE602007006249 T DE 602007006249T DE 602007006249 T DE602007006249 T DE 602007006249T DE 602007006249 D1 DE602007006249 D1 DE 602007006249D1
Authority
DE
Germany
Prior art keywords
rays
fluorescent
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602007006249T
Other languages
German (de)
English (en)
Inventor
Norio Sasayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Analysis Corp
Original Assignee
SII NanoTechnology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SII NanoTechnology Inc filed Critical SII NanoTechnology Inc
Publication of DE602007006249D1 publication Critical patent/DE602007006249D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE602007006249T 2006-06-06 2007-06-06 Vorrichtung zur Analyse fluoreszenter Röntgenstrahlen Active DE602007006249D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006156821A JP4902272B2 (ja) 2006-06-06 2006-06-06 蛍光ｘ線分析装置

Publications (1)

Publication Number Publication Date
DE602007006249D1 true DE602007006249D1 (de) 2010-06-17

Family

ID=38283646

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602007006249T Active DE602007006249D1 (de) 2006-06-06 2007-06-06 Vorrichtung zur Analyse fluoreszenter Röntgenstrahlen

Country Status (5)

Country Link
US (1) US7471763B2 (https=)
EP (1) EP1865309B1 (https=)
JP (1) JP4902272B2 (https=)
CN (1) CN101093201B (https=)
DE (1) DE602007006249D1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100310041A1 (en) * 2009-06-03 2010-12-09 Adams William L X-Ray System and Methods with Detector Interior to Focusing Element
US8439520B2 (en) * 2010-10-21 2013-05-14 Rambus Delaware Llc Color-configurable lighting assembly
CN102841108B (zh) * 2012-03-09 2014-12-17 深圳市华唯计量技术开发有限公司 一种偏振二次靶能量色散型x射线荧光光谱仪
US11029263B2 (en) * 2015-12-09 2021-06-08 Integrated-X, Inc. Systems and methods for inspection using electromagnetic radiation

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3944822A (en) * 1974-09-30 1976-03-16 The United States Of America As Represented By The Administrator Of The U. S. Environmental Protection Agency Polarization excitation device for X-ray fluorescence analysis
SU1045094A1 (ru) 1982-05-04 1983-09-30 Научно-исследовательский институт ядерной физики при Томском политехническом институте им.С.М.Кирова Устройство дл рентгенофлуоресцентного анализа вещества
JPH088314A (ja) * 1994-06-24 1996-01-12 Toshiba Corp 半導体分析装置
FI102697B1 (fi) * 1997-06-26 1999-01-29 Metorex Int Oy Polarisoitua herätesäteilyä hyödyntävä röntgenfluoresenssimittausjärjestely ja röntgenputki
JP3013827B2 (ja) * 1997-12-12 2000-02-28 日本電気株式会社 Ｘ線偏光分析器及びそれを用いたｘ線偏光分析方法
DE19826294C1 (de) * 1998-06-12 2000-02-10 Glukomeditech Ag Polarimetrisches Verfahren zur Bestimmung der (Haupt-)Schwingungsebene polarisierten Lichts auf etwa 0,1m DEG und miniaturisierbare Vorrichtung zu seiner Durchführung
JP3498689B2 (ja) * 2000-07-31 2004-02-16 株式会社島津製作所 モノクロ線源励起用モノクロメータ及び蛍光ｘ線分析装置
JP2004004125A (ja) * 2003-08-22 2004-01-08 Shimadzu Corp 蛍光ｘ線分析装置
JP4754957B2 (ja) * 2005-12-08 2011-08-24 株式会社リガク 多元素同時型蛍光ｘ線分析装置

Also Published As

Publication number Publication date
US7471763B2 (en) 2008-12-30
EP1865309A1 (en) 2007-12-12
JP4902272B2 (ja) 2012-03-21
CN101093201B (zh) 2011-08-03
EP1865309B1 (en) 2010-05-05
JP2007327756A (ja) 2007-12-20
US20070280414A1 (en) 2007-12-06
CN101093201A (zh) 2007-12-26

Similar Documents

Publication Publication Date Title
DE602006003924D1 (de) Vorrichtung zur Probenentnahme
DE602006011071D1 (de) Vorrichtung zur Probenentnahme
DK2084519T3 (da) Røntgenfluorescens-analysefremgangsmåde
DE602007011093D1 (de) Vorrichtung zur insassenzurückhaltung
AT502901A3 (de) Vorrichtung zur wasserstoffherstellung
DE602007012110D1 (de) Distale zielorientierte vorrichtung
EP2124767A4 (en) Device for performing surgery
EP2197363A4 (en) SURGICAL INSTRUMENT
EP2317304A4 (en) SAMPLE ANALYSIS DEVICE
DE602006016506D1 (de) Vorrichtung zur elektrostatischen Beschichtung
DE602007007219D1 (de) Selements zur zeitmessung
BRPI0920005A2 (pt) instrumento e sistema para produzir uma amostra de um líquido de corpo e para análise do mesmo
DE602006007950D1 (de) Vorrichtung zur körperfettmessung
EP2006664A4 (en) Analyzing apparatus
DE112007001026A5 (de) Vorrichtung zur Ermittlung von Abmessungen menschlicher Körperteile
DE502005000634D1 (de) Vorrichtung zur potenzialfreien Strommessung
FI20075191A0 (fi) Väline ja menetelmä analyysiä varten
EP1930276A4 (en) ELEVATOR CONTROL DEVICE
EP1933156A4 (en) NULL PHASE CURRENT DETECTION APPARATUS
EP3734253C0 (en) SAMPLE ELUTION DETECTION APPARATUS
DE502006007755D1 (de) Vorrichtung zur Zwischenkühlung
EP2214007A4 (en) ANALYSIS INSTRUMENT
DE602007001799D1 (de) Vorrichtung zur abgasreinigung
DE602007006249D1 (de) Vorrichtung zur Analyse fluoreszenter Röntgenstrahlen
DE602006002448D1 (de) Vorrichtung zur Interferenzmessung

Legal Events

Date Code Title Description
8364 No opposition during term of opposition