DE602005014358D1 - Röntgenstrahlmanipulator - Google Patents

Röntgenstrahlmanipulator

Info

Publication number
DE602005014358D1
DE602005014358D1 DE602005014358T DE602005014358T DE602005014358D1 DE 602005014358 D1 DE602005014358 D1 DE 602005014358D1 DE 602005014358 T DE602005014358 T DE 602005014358T DE 602005014358 T DE602005014358 T DE 602005014358T DE 602005014358 D1 DE602005014358 D1 DE 602005014358D1
Authority
DE
Germany
Prior art keywords
frame
xray
manipulator
ray
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005014358T
Other languages
English (en)
Inventor
Benjamin Kingsley Stua Peecock
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dage Precision Industries Ltd
Original Assignee
Dage Precision Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dage Precision Industries Ltd filed Critical Dage Precision Industries Ltd
Publication of DE602005014358D1 publication Critical patent/DE602005014358D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Polarising Elements (AREA)
  • Lasers (AREA)
DE602005014358T 2004-07-05 2005-07-04 Röntgenstrahlmanipulator Active DE602005014358D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0415053.8A GB0415053D0 (en) 2004-07-05 2004-07-05 X-ray manipulator
PCT/GB2005/002611 WO2006003430A1 (en) 2004-07-05 2005-07-04 X-ray manipulator

Publications (1)

Publication Number Publication Date
DE602005014358D1 true DE602005014358D1 (de) 2009-06-18

Family

ID=32843600

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005014358T Active DE602005014358D1 (de) 2004-07-05 2005-07-04 Röntgenstrahlmanipulator

Country Status (8)

Country Link
US (1) US7497617B2 (de)
EP (1) EP1766381B1 (de)
JP (1) JP4886684B2 (de)
CN (1) CN1985162B (de)
AT (1) ATE430932T1 (de)
DE (1) DE602005014358D1 (de)
GB (1) GB0415053D0 (de)
WO (1) WO2006003430A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ITFI20050137A1 (it) * 2005-06-20 2006-12-21 Giovanni Berti Apparecchiatura mobile per irragiamento e rilevazione di radiazioni
EP2587450B1 (de) * 2011-10-27 2016-08-31 Nordson Corporation Verfahren und Vorrichtung zur Erzeugung eines dreidimensionalen Modells eines Bereichs von Interesse mithilfe eines Bildgebungssystems
JP6402720B2 (ja) * 2013-12-12 2018-10-10 株式会社ニコン Ｘ線装置
GB201414395D0 (en) * 2014-08-13 2014-09-24 Nikon Metrology Nv X-ray apparatus
US11029263B2 (en) * 2015-12-09 2021-06-08 Integrated-X, Inc. Systems and methods for inspection using electromagnetic radiation
CN110220926B (zh) * 2019-07-03 2020-03-27 中国电子科技集团公司第三十八研究所 一种基于五轴运动平台的x射线检测装置
CN110530903B (zh) * 2019-09-03 2022-05-03 中国电子科技集团公司第三十八研究所 一种用于x射线检测装置的拱桥式运动平台
GB2596061A (en) 2020-06-09 2021-12-22 Nordson Corp An x-ray inspection system, an x-ray imaging accessory, a sample support, a kit, and a method of using an x-ray inspection system

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL32247A (en) * 1969-05-20 1972-08-30 Yeda Res & Dev X-ray diffractometer
JPS5028388A (de) * 1973-07-13 1975-03-22
JPS6274332A (ja) * 1985-09-30 1987-04-06 株式会社東芝 Ｘ線多軌道断層撮影装置
JPH08136698A (ja) * 1994-11-09 1996-05-31 Nippon Steel Corp 円弧状スライダー駆動式ゴニオメータおよび立体角回折計
US5966423A (en) * 1997-03-28 1999-10-12 Philips Electronics North America Corporation Arc diffractometer
JP3689868B2 (ja) * 1998-06-23 2005-08-31 京セラ株式会社 Ｘ線検査装置
JP3505428B2 (ja) * 1998-06-23 2004-03-08 京セラ株式会社 Ｘ線検査装置
CN2347151Y (zh) * 1998-09-30 1999-11-03 邯郸高新技术发展总公司爱斯特研究所 侧倾固定ψ法为主的微机控制应力测定仪
JP3693318B2 (ja) * 2000-01-19 2005-09-07 株式会社日立国際電気 エックス線可変斜視角透視装置
JP2001319951A (ja) * 2000-05-10 2001-11-16 Fujitsu Ltd 接続検査方法及び接続検査装置
US6882739B2 (en) * 2001-06-19 2005-04-19 Hypernex, Inc. Method and apparatus for rapid grain size analysis of polycrystalline materials
JP4687853B2 (ja) * 2001-06-25 2011-05-25 株式会社島津製作所 Ｘ線透視撮影装置
US6700949B2 (en) * 2001-09-25 2004-03-02 Ge Medical Systems Global Technology Llc Retractable collimator apparatus for a CT-PET system
WO2003081221A2 (en) * 2002-03-21 2003-10-02 Bruker Axs, Inc. Transmission mode x-ray diffraction screening system
JP3883060B2 (ja) * 2002-06-17 2007-02-21 株式会社リガク 結晶評価装置
JP4386812B2 (ja) * 2003-08-27 2009-12-16 パナソニック株式会社 Ｘ線検査装置
WO2005078419A1 (ja) * 2004-02-18 2005-08-25 Pony Industry Co., Ltd. 放射線透視撮影装置及びこれを用いた放射線透視撮影方法

Also Published As

Publication number Publication date
CN1985162B (zh) 2011-03-23
ATE430932T1 (de) 2009-05-15
JP4886684B2 (ja) 2012-02-29
EP1766381B1 (de) 2009-05-06
GB0415053D0 (en) 2004-08-04
US20080232551A1 (en) 2008-09-25
US7497617B2 (en) 2009-03-03
JP2008505340A (ja) 2008-02-21
EP1766381A1 (de) 2007-03-28
WO2006003430A1 (en) 2006-01-12
CN1985162A (zh) 2007-06-20

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Legal Events

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