DE602005007818D1 - Analysevorrichtung unter Verwendung von abgeschwächter Totalreflektion - Google Patents

Analysevorrichtung unter Verwendung von abgeschwächter Totalreflektion

Info

Publication number
DE602005007818D1
DE602005007818D1 DE200560007818 DE602005007818T DE602005007818D1 DE 602005007818 D1 DE602005007818 D1 DE 602005007818D1 DE 200560007818 DE200560007818 DE 200560007818 DE 602005007818 T DE602005007818 T DE 602005007818T DE 602005007818 D1 DE602005007818 D1 DE 602005007818D1
Authority
DE
Germany
Prior art keywords
analyzer
total reflection
attenuated total
attenuated
reflection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE200560007818
Other languages
English (en)
Inventor
Katsuaki Muraishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
Original Assignee
Fujifilm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Publication of DE602005007818D1 publication Critical patent/DE602005007818D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00039—Transport arrangements specific to flat sample substrates, e.g. pusher blade
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00089—Magazines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00346—Heating or cooling arrangements
    • G01N2035/00356—Holding samples at elevated temperature (incubation)
    • G01N2035/00376—Conductive heating, e.g. heated plates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0401—Sample carriers, cuvettes or reaction vessels
    • G01N2035/0418—Plate elements with several rows of samples
    • G01N2035/0425—Stacks, magazines or elevators for plates

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE200560007818 2004-09-21 2005-09-20 Analysevorrichtung unter Verwendung von abgeschwächter Totalreflektion Active DE602005007818D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004272959A JP2006090718A (ja) 2004-09-21 2004-09-21 全反射減衰を利用した測定装置

Publications (1)

Publication Number Publication Date
DE602005007818D1 true DE602005007818D1 (de) 2008-08-14

Family

ID=35262045

Family Applications (1)

Application Number Title Priority Date Filing Date
DE200560007818 Active DE602005007818D1 (de) 2004-09-21 2005-09-20 Analysevorrichtung unter Verwendung von abgeschwächter Totalreflektion

Country Status (4)

Country Link
US (1) US20060062693A1 (de)
EP (1) EP1637888B1 (de)
JP (1) JP2006090718A (de)
DE (1) DE602005007818D1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101960314B (zh) * 2008-03-07 2014-11-26 柯尼卡美能达精密光学株式会社 微芯片及其制造方法
US9778188B2 (en) 2009-03-11 2017-10-03 Industrial Technology Research Institute Apparatus and method for detection and discrimination molecular object
US9482615B2 (en) 2010-03-15 2016-11-01 Industrial Technology Research Institute Single-molecule detection system and methods
JP5585138B2 (ja) * 2010-03-17 2014-09-10 オムロン株式会社 流路チップ及び治具
US8865078B2 (en) * 2010-06-11 2014-10-21 Industrial Technology Research Institute Apparatus for single-molecule detection
WO2012021571A2 (en) * 2010-08-11 2012-02-16 Aushon Biosystems Method of and system for applying blocking material to assay substrates
EP3650117B1 (de) 2011-11-14 2022-07-20 Aushon Biosystems, Inc. Systeme und verfahren zur verbesserung der konsistenz der testleistung

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE462408B (sv) * 1988-11-10 1990-06-18 Pharmacia Ab Optiskt biosensorsystem utnyttjande ytplasmonresonans foer detektering av en specific biomolekyl, saett att kalibrera sensoranordningen samt saett att korrigera foer baslinjedrift i systemet
ATE154981T1 (de) * 1990-04-06 1997-07-15 Perkin Elmer Corp Automatisiertes labor für molekularbiologie
US5991048A (en) * 1995-10-25 1999-11-23 University Of Washington Surface plasmon resonance light pipe sensor
JP3062481B2 (ja) * 1997-11-19 2000-07-10 グルポ グリフォルス，エス．エー． 実験室試験を自動的に行う装置
EP0994355A1 (de) * 1998-09-23 2000-04-19 Randox Laboratories Ltd. Vorrichtung zur Verarbeitung von Assayproben
EP1947446A3 (de) * 2000-03-16 2008-10-29 FUJIFILM Corporation Messverfahren und Vorrichtung mit gedämpfter Totalreflexion
US6564120B1 (en) * 2000-05-11 2003-05-13 Cryo-Cell International, Inc. Storage system, particularly with automatic insertion and retrieval
US7030988B2 (en) * 2001-03-22 2006-04-18 Fuji Photo Film Co., Ltd. Measuring apparatus and measuring chip
EP1324019B1 (de) * 2001-12-25 2006-07-12 Fuji Photo Film Co., Ltd. Sensorsystem mit evaneszenten Wellen

Also Published As

Publication number Publication date
EP1637888A1 (de) 2006-03-22
US20060062693A1 (en) 2006-03-23
EP1637888B1 (de) 2008-07-02
JP2006090718A (ja) 2006-04-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition