DE602005004228D1 - Messsonde für Oberflächentextur und dieselbe verwendendes Mikroskop. - Google Patents

Messsonde für Oberflächentextur und dieselbe verwendendes Mikroskop.

Info

Publication number
DE602005004228D1
DE602005004228D1 DE602005004228T DE602005004228T DE602005004228D1 DE 602005004228 D1 DE602005004228 D1 DE 602005004228D1 DE 602005004228 T DE602005004228 T DE 602005004228T DE 602005004228 T DE602005004228 T DE 602005004228T DE 602005004228 D1 DE602005004228 D1 DE 602005004228D1
Authority
DE
Germany
Prior art keywords
microscope
probe
same
surface texture
texture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005004228T
Other languages
English (en)
Other versions
DE602005004228T2 (de
Inventor
Kazuhiko Hidaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Publication of DE602005004228D1 publication Critical patent/DE602005004228D1/de
Application granted granted Critical
Publication of DE602005004228T2 publication Critical patent/DE602005004228T2/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/02—Probe holders
    • G01Q70/04—Probe holders with compensation for temperature or vibration induced errors

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
DE602005004228T 2004-11-02 2005-11-02 Messsonde für Oberflächentextur und dieselbe verwendendes Mikroskop. Active DE602005004228T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004319379 2004-11-02
JP2004319379A JP4323412B2 (ja) 2004-11-02 2004-11-02 表面性状測定用探針およびこれを用いた顕微鏡

Publications (2)

Publication Number Publication Date
DE602005004228D1 true DE602005004228D1 (de) 2008-02-21
DE602005004228T2 DE602005004228T2 (de) 2008-05-08

Family

ID=35519759

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005004228T Active DE602005004228T2 (de) 2004-11-02 2005-11-02 Messsonde für Oberflächentextur und dieselbe verwendendes Mikroskop.

Country Status (5)

Country Link
US (1) US7581438B2 (de)
EP (1) EP1653478B1 (de)
JP (1) JP4323412B2 (de)
CN (1) CN1769860B (de)
DE (1) DE602005004228T2 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006001496B4 (de) * 2006-01-11 2019-02-21 Siemens Aktiengesellschaft System und Verfahren zur Bestimmung geometrischer Veränderungen eines Werkstücks
EP2120037B1 (de) 2008-05-16 2017-01-25 Mitutoyo Corporation Messsonde für ein Scanmikroskop und Betriebsverfahren dafür
EP2120036B1 (de) 2008-05-16 2012-07-18 Mitutoyo Corporation Messsonde mit einem oder mehreren Stützelementen für ein Messinstrument
EP2163906B1 (de) 2008-09-16 2014-02-26 Mitutoyo Corporation Verfahren zur Bewegungserkennung einer Messsonde und Messinstrument
EP2211187B1 (de) 2009-01-14 2013-10-02 Mitutoyo Corporation Verfahren zur Betätigung eines Systems, Vorrichtung zur Modifizierung eines Steuersignals zur Betätigung eines Systems und Verfahren zum Abstimmen einer solchen Vorrichtung
US8701301B2 (en) * 2011-04-19 2014-04-22 Mitutoyo Corporation Surface texture measuring instrument
JP5776608B2 (ja) * 2012-03-30 2015-09-09 東亜ディーケーケー株式会社 薄板固定方法およびそれを用いた油膜検出装置
US9785862B2 (en) 2014-08-18 2017-10-10 International Business Machines Corporation System and method for feeling surface roughness through microscopic data
CN114072655A (zh) * 2019-07-17 2022-02-18 株式会社岛津制作所 气体测定装置用采样探针

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4947034A (en) 1989-04-28 1990-08-07 International Business Machines Corporation Apertureless near field optical microscope
JPH0830707B2 (ja) 1991-01-26 1996-03-27 株式会社ミツトヨ 走査型トンネル顕微鏡の探針
US5517190A (en) * 1994-02-03 1996-05-14 Gunn; Colin N. Physical measurement from changes in reactance
JPH09203864A (ja) 1996-01-25 1997-08-05 Nikon Corp Ｎｆｍ一体型顕微鏡
JP3290586B2 (ja) 1996-03-13 2002-06-10 セイコーインスツルメンツ株式会社 走査型近視野光学顕微鏡
JP2001165843A (ja) 1999-12-14 2001-06-22 Olympus Optical Co Ltd 近接場光学顕微鏡及びそれに用いられるカンチレバー
US6469288B1 (en) 1999-05-17 2002-10-22 Olympus Optcial Co., Ltd. Near field optical microscope and probe for near field optical microscope
JP4044241B2 (ja) 1999-05-24 2008-02-06 日本分光株式会社 プローブ顕微鏡
JP2001264230A (ja) 2000-03-21 2001-09-26 Nippon Telegr & Teleph Corp <Ntt> 原子間力顕微鏡、トンネル顕微鏡に用いる探針
US6598306B2 (en) * 2001-04-17 2003-07-29 Homer L. Eaton Self-loading spatial reference point array
IL145136A0 (en) 2001-08-27 2002-06-30 Multiple plate tip or sample scanning reconfigurable scanning probe microscope with transparent interfacing of far-field optical microscopes
JP2003344034A (ja) 2002-05-23 2003-12-03 Mitsutoyo Corp 表面性状測定装置及び表面性状センサ
GB0228368D0 (en) * 2002-12-05 2003-01-08 Renishaw Plc Probe for high speed scanning
JP3920247B2 (ja) * 2003-07-02 2007-05-30 三菱電機株式会社 感熱式流量検出素子およびその製造方法

Also Published As

Publication number Publication date
EP1653478A2 (de) 2006-05-03
DE602005004228T2 (de) 2008-05-08
US20060090550A1 (en) 2006-05-04
EP1653478B1 (de) 2008-01-09
CN1769860B (zh) 2010-08-11
EP1653478A3 (de) 2006-09-06
CN1769860A (zh) 2006-05-10
JP2006132969A (ja) 2006-05-25
US7581438B2 (en) 2009-09-01
JP4323412B2 (ja) 2009-09-02

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