DE602005002739D1 - Fraktal-skr-verfahren zur auswertung der bildqualität - Google Patents
Fraktal-skr-verfahren zur auswertung der bildqualitätInfo
- Publication number
- DE602005002739D1 DE602005002739D1 DE602005002739T DE602005002739T DE602005002739D1 DE 602005002739 D1 DE602005002739 D1 DE 602005002739D1 DE 602005002739 T DE602005002739 T DE 602005002739T DE 602005002739 T DE602005002739 T DE 602005002739T DE 602005002739 D1 DE602005002739 D1 DE 602005002739D1
- Authority
- DE
- Germany
- Prior art keywords
- skr
- matrix
- matrices
- rays
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title abstract 2
- 239000011159 matrix material Substances 0.000 abstract 5
- 230000019771 cognition Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/462—Computing operations in or between colour spaces; Colour management systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/52—Measurement of colour; Colour measuring devices, e.g. colorimeters using colour charts
- G01J3/524—Calibration of colorimeters
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10024—Color image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30168—Image quality inspection
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Mathematical Physics (AREA)
- Image Processing (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
WOPCT/EP2004/003 | 2004-03-22 | ||
EP2004003894 | 2004-04-13 | ||
PCT/EP2005/003889 WO2005101312A2 (en) | 2004-04-13 | 2005-04-13 | Fractal skr-method for evaluating image quality |
Publications (2)
Publication Number | Publication Date |
---|---|
DE602005002739D1 true DE602005002739D1 (de) | 2007-11-15 |
DE602005002739T2 DE602005002739T2 (de) | 2008-07-17 |
Family
ID=34957449
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602005002739T Active DE602005002739T2 (de) | 2004-04-13 | 2005-04-13 | Fraktal-skr-verfahren zur auswertung der bildqualität |
Country Status (4)
Country | Link |
---|---|
US (1) | US7953249B2 (de) |
AT (1) | ATE374979T1 (de) |
DE (1) | DE602005002739T2 (de) |
WO (1) | WO2005101312A2 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102010047444A1 (de) * | 2010-10-04 | 2012-04-05 | Audi Ag | Verfahren zur Visualisierung von Maßabweichungen zwischen einer Ist- und Soll-Geometrie eines Bauteils |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4974586B2 (ja) * | 2006-05-24 | 2012-07-11 | オリンパス株式会社 | 顕微鏡用撮像装置 |
US7840060B2 (en) * | 2006-06-12 | 2010-11-23 | D&S Consultants, Inc. | System and method for machine learning using a similarity inverse matrix |
US8158928B2 (en) * | 2008-12-23 | 2012-04-17 | Fluke Corporation | System and method for improving the quality of thermal images |
US8310548B2 (en) * | 2009-10-23 | 2012-11-13 | Contec Llc | System and method for video quality parametric tests |
US8754988B2 (en) * | 2010-12-22 | 2014-06-17 | Tektronix, Inc. | Blur detection with local sharpness map |
US9322777B2 (en) | 2012-10-29 | 2016-04-26 | Tokitae Llc | Systems, devices, and methods employing angular-resolved scattering and spectrally resolved measurements for classification of objects |
US9706968B2 (en) * | 2013-03-15 | 2017-07-18 | Koninklijke Philips N.V. | Determining a residual mode image from a dual energy image |
ES2533778B1 (es) * | 2013-09-13 | 2016-02-02 | Abengoa Solar New Technologies S.A. | Espectrofotómetro para caracterización de receptores de colectores solares |
CN104809467B (zh) * | 2015-04-16 | 2018-07-06 | 北京工业大学 | 一种基于暗原色先验的空气质量指数估计方法 |
US9836631B1 (en) * | 2015-04-26 | 2017-12-05 | Aic Innovations Group, Inc. | Method and apparatus for fractal identification |
KR102387459B1 (ko) * | 2015-11-20 | 2022-04-15 | 삼성전자주식회사 | 반도체 소자의 패턴 형성 방법 |
US10635909B2 (en) * | 2015-12-30 | 2020-04-28 | Texas Instruments Incorporated | Vehicle control with efficient iterative triangulation |
CN106595512B (zh) * | 2016-11-09 | 2017-09-29 | 华中科技大学 | 一种基于分形维数的碳纳米管分散状态的数值化表征方法 |
JP6969164B2 (ja) * | 2017-05-31 | 2021-11-24 | 株式会社リコー | 評価装置、評価プログラム及び評価方法 |
RU2686257C1 (ru) * | 2018-04-27 | 2019-04-24 | Ационерное общество "РОТЕК" (АО "РОТЕК") | Способ и система удалённой идентификации и прогнозирования развития зарождающихся дефектов объектов |
US10701353B1 (en) | 2019-03-20 | 2020-06-30 | United States Of America, As Represented By The Secretary Of The Army | Pattern, method, and apparatus for testing imaging system performance |
JP2020166492A (ja) * | 2019-03-29 | 2020-10-08 | コニカミノルタ株式会社 | 検査装置、検査方法及びコンピュータープログラム |
CN114782422B (zh) * | 2022-06-17 | 2022-10-14 | 电子科技大学 | 一种svr特征融合的无参考jpeg图像质量评价方法 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5235652A (en) * | 1988-02-09 | 1993-08-10 | Nally Robert B | Qualification system for printed images |
US5490516A (en) * | 1990-12-14 | 1996-02-13 | Hutson; William H. | Method and system to enhance medical signals for real-time analysis and high-resolution display |
US5600574A (en) * | 1994-05-13 | 1997-02-04 | Minnesota Mining And Manufacturing Company | Automated image quality control |
KR0154739B1 (ko) * | 1995-04-19 | 1998-11-16 | 김광호 | 프랙탈 영상 압축 장치 및 방법 |
US5838833A (en) * | 1995-06-30 | 1998-11-17 | Minolta Co., Ltd. | Fractal image compression method and device and fractal image restoration method and device |
JP3116994B2 (ja) * | 1996-08-29 | 2000-12-11 | 富士ゼロックス株式会社 | 画質予測装置および方法ならびに画質制御装置および方法 |
US5912988A (en) * | 1996-12-27 | 1999-06-15 | Xytec Corporation | Image processing method and apparatus for distortion compensation |
DE19724066B4 (de) * | 1997-06-07 | 2007-04-19 | Man Roland Druckmaschinen Ag | Verfahren zur Korrektur von Geometriefehlern bei der Übertragung von Informationen auf einen Bedruckstoff |
US6741743B2 (en) * | 1998-07-31 | 2004-05-25 | Prc. Inc. | Imaged document optical correlation and conversion system |
US6707932B1 (en) * | 2000-06-30 | 2004-03-16 | Siemens Corporate Research, Inc. | Method for identifying graphical objects in large engineering drawings |
JP4691835B2 (ja) * | 2001-06-12 | 2011-06-01 | ソニー株式会社 | 係数データの生成装置および生成方法、それを使用した情報信号の処理装置および処理方法、それに使用する係数データの取得装置および取得方法、並びに情報記録媒体 |
US6862414B2 (en) * | 2002-01-30 | 2005-03-01 | Xerox Corporation | Automated banding defect analysis and repair for document processing systems |
US6785405B2 (en) * | 2002-10-23 | 2004-08-31 | Assuretec Systems, Inc. | Apparatus and method for document reading and authentication |
JP4375523B2 (ja) * | 2002-12-20 | 2009-12-02 | 富士ゼロックス株式会社 | 画像処理装置、画像処理方法、画像処理プログラム、印刷物検査装置、印刷物検査方法、印刷物検査プログラム |
US7697792B2 (en) * | 2003-11-26 | 2010-04-13 | Yesvideo, Inc. | Process-response statistical modeling of a visual image for use in determining similarity between visual images |
US7433098B2 (en) * | 2004-04-30 | 2008-10-07 | Unisys Corporation | Document processing system with improved image quality assurance |
-
2005
- 2005-04-13 WO PCT/EP2005/003889 patent/WO2005101312A2/en active IP Right Grant
- 2005-04-13 AT AT05716575T patent/ATE374979T1/de not_active IP Right Cessation
- 2005-04-13 DE DE602005002739T patent/DE602005002739T2/de active Active
-
2006
- 2006-10-04 US US11/543,623 patent/US7953249B2/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102010047444A1 (de) * | 2010-10-04 | 2012-04-05 | Audi Ag | Verfahren zur Visualisierung von Maßabweichungen zwischen einer Ist- und Soll-Geometrie eines Bauteils |
Also Published As
Publication number | Publication date |
---|---|
DE602005002739T2 (de) | 2008-07-17 |
US7953249B2 (en) | 2011-05-31 |
US20070184373A1 (en) | 2007-08-09 |
WO2005101312A2 (en) | 2005-10-27 |
ATE374979T1 (de) | 2007-10-15 |
WO2005101312A3 (en) | 2006-10-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: UNIVERSITEIT ANTWERPEN, ANTWERPEN, BE Owner name: KAREL DE GROTE HOGESCHOOL, ANTWERPEN, BE Owner name: IMEC, LEUVEN, BE |