DE602005002739D1 - Fraktal-skr-verfahren zur auswertung der bildqualität - Google Patents

Fraktal-skr-verfahren zur auswertung der bildqualität

Info

Publication number
DE602005002739D1
DE602005002739D1 DE602005002739T DE602005002739T DE602005002739D1 DE 602005002739 D1 DE602005002739 D1 DE 602005002739D1 DE 602005002739 T DE602005002739 T DE 602005002739T DE 602005002739 T DE602005002739 T DE 602005002739T DE 602005002739 D1 DE602005002739 D1 DE 602005002739D1
Authority
DE
Germany
Prior art keywords
skr
matrix
matrices
rays
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005002739T
Other languages
English (en)
Other versions
DE602005002739T2 (de
Inventor
Luc Mertens
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KAREL DE GROTE HOGESCHOOL, ANTWERPEN, BE
UNIVERSITEIT ANTWERPEN, ANTWERPEN, BE
Interuniversitair Microelektronica Centrum vzw IMEC
Original Assignee
AIC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AIC filed Critical AIC
Publication of DE602005002739D1 publication Critical patent/DE602005002739D1/de
Application granted granted Critical
Publication of DE602005002739T2 publication Critical patent/DE602005002739T2/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/462—Computing operations in or between colour spaces; Colour management systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/52—Measurement of colour; Colour measuring devices, e.g. colorimeters using colour charts
    • G01J3/524—Calibration of colorimeters
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30168—Image quality inspection

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Mathematical Physics (AREA)
  • Image Processing (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
DE602005002739T 2004-04-13 2005-04-13 Fraktal-skr-verfahren zur auswertung der bildqualität Active DE602005002739T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
WOPCT/EP2004/003 2004-03-22
EP2004003894 2004-04-13
PCT/EP2005/003889 WO2005101312A2 (en) 2004-04-13 2005-04-13 Fractal skr-method for evaluating image quality

Publications (2)

Publication Number Publication Date
DE602005002739D1 true DE602005002739D1 (de) 2007-11-15
DE602005002739T2 DE602005002739T2 (de) 2008-07-17

Family

ID=34957449

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005002739T Active DE602005002739T2 (de) 2004-04-13 2005-04-13 Fraktal-skr-verfahren zur auswertung der bildqualität

Country Status (4)

Country Link
US (1) US7953249B2 (de)
AT (1) ATE374979T1 (de)
DE (1) DE602005002739T2 (de)
WO (1) WO2005101312A2 (de)

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DE102010047444A1 (de) * 2010-10-04 2012-04-05 Audi Ag Verfahren zur Visualisierung von Maßabweichungen zwischen einer Ist- und Soll-Geometrie eines Bauteils

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JP4974586B2 (ja) * 2006-05-24 2012-07-11 オリンパス株式会社 顕微鏡用撮像装置
US7840060B2 (en) * 2006-06-12 2010-11-23 D&S Consultants, Inc. System and method for machine learning using a similarity inverse matrix
US8158928B2 (en) * 2008-12-23 2012-04-17 Fluke Corporation System and method for improving the quality of thermal images
US8310548B2 (en) * 2009-10-23 2012-11-13 Contec Llc System and method for video quality parametric tests
US8754988B2 (en) * 2010-12-22 2014-06-17 Tektronix, Inc. Blur detection with local sharpness map
US9322777B2 (en) 2012-10-29 2016-04-26 Tokitae Llc Systems, devices, and methods employing angular-resolved scattering and spectrally resolved measurements for classification of objects
US9706968B2 (en) * 2013-03-15 2017-07-18 Koninklijke Philips N.V. Determining a residual mode image from a dual energy image
ES2533778B1 (es) * 2013-09-13 2016-02-02 Abengoa Solar New Technologies S.A. Espectrofotómetro para caracterización de receptores de colectores solares
CN104809467B (zh) * 2015-04-16 2018-07-06 北京工业大学 一种基于暗原色先验的空气质量指数估计方法
US9836631B1 (en) * 2015-04-26 2017-12-05 Aic Innovations Group, Inc. Method and apparatus for fractal identification
KR102387459B1 (ko) * 2015-11-20 2022-04-15 삼성전자주식회사 반도체 소자의 패턴 형성 방법
US10635909B2 (en) * 2015-12-30 2020-04-28 Texas Instruments Incorporated Vehicle control with efficient iterative triangulation
CN106595512B (zh) * 2016-11-09 2017-09-29 华中科技大学 一种基于分形维数的碳纳米管分散状态的数值化表征方法
JP6969164B2 (ja) * 2017-05-31 2021-11-24 株式会社リコー 評価装置、評価プログラム及び評価方法
RU2686257C1 (ru) * 2018-04-27 2019-04-24 Ационерное общество "РОТЕК" (АО "РОТЕК") Способ и система удалённой идентификации и прогнозирования развития зарождающихся дефектов объектов
US10701353B1 (en) 2019-03-20 2020-06-30 United States Of America, As Represented By The Secretary Of The Army Pattern, method, and apparatus for testing imaging system performance
JP2020166492A (ja) * 2019-03-29 2020-10-08 コニカミノルタ株式会社 検査装置、検査方法及びコンピュータープログラム
CN114782422B (zh) * 2022-06-17 2022-10-14 电子科技大学 一种svr特征融合的无参考jpeg图像质量评价方法

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US5600574A (en) * 1994-05-13 1997-02-04 Minnesota Mining And Manufacturing Company Automated image quality control
KR0154739B1 (ko) * 1995-04-19 1998-11-16 김광호 프랙탈 영상 압축 장치 및 방법
US5838833A (en) * 1995-06-30 1998-11-17 Minolta Co., Ltd. Fractal image compression method and device and fractal image restoration method and device
JP3116994B2 (ja) * 1996-08-29 2000-12-11 富士ゼロックス株式会社 画質予測装置および方法ならびに画質制御装置および方法
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010047444A1 (de) * 2010-10-04 2012-04-05 Audi Ag Verfahren zur Visualisierung von Maßabweichungen zwischen einer Ist- und Soll-Geometrie eines Bauteils

Also Published As

Publication number Publication date
DE602005002739T2 (de) 2008-07-17
US7953249B2 (en) 2011-05-31
US20070184373A1 (en) 2007-08-09
WO2005101312A2 (en) 2005-10-27
ATE374979T1 (de) 2007-10-15
WO2005101312A3 (en) 2006-10-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: UNIVERSITEIT ANTWERPEN, ANTWERPEN, BE

Owner name: KAREL DE GROTE HOGESCHOOL, ANTWERPEN, BE

Owner name: IMEC, LEUVEN, BE