DE60123450D1 - Mikroskop für beugungsobjekte - Google Patents

Mikroskop für beugungsobjekte

Info

Publication number
DE60123450D1
DE60123450D1 DE60123450T DE60123450T DE60123450D1 DE 60123450 D1 DE60123450 D1 DE 60123450D1 DE 60123450 T DE60123450 T DE 60123450T DE 60123450 T DE60123450 T DE 60123450T DE 60123450 D1 DE60123450 D1 DE 60123450D1
Authority
DE
Germany
Prior art keywords
microscope
reflected
wave
passing
dimensional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60123450T
Other languages
English (en)
Inventor
Vincent Lauer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from FR0014160A external-priority patent/FR2816412A1/fr
Priority claimed from FR0101908A external-priority patent/FR2820830A1/fr
Priority claimed from FR0103215A external-priority patent/FR2821935A1/fr
Priority claimed from FR0103861A external-priority patent/FR2822552A1/fr
Application filed by Individual filed Critical Individual
Application granted granted Critical
Publication of DE60123450D1 publication Critical patent/DE60123450D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Bending Of Plates, Rods, And Pipes (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE60123450T 2000-11-06 2001-11-02 Mikroskop für beugungsobjekte Expired - Lifetime DE60123450D1 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
FR0014160A FR2816412A1 (fr) 2000-11-06 2000-11-06 Microscope pour objets diffractants
FR0101908A FR2820830A1 (fr) 2001-02-13 2001-02-13 Microscope pour objets diffractants
FR0103215A FR2821935A1 (fr) 2001-03-09 2001-03-09 Microscope pour objets diffractants
FR0103861A FR2822552A1 (fr) 2001-03-22 2001-03-22 Microscope pour objets diffractants
PCT/FR2001/003394 WO2002037157A2 (fr) 2000-11-06 2001-11-02 Microscope pour objets diffractants

Publications (1)

Publication Number Publication Date
DE60123450D1 true DE60123450D1 (de) 2006-11-09

Family

ID=27445925

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60123450T Expired - Lifetime DE60123450D1 (de) 2000-11-06 2001-11-02 Mikroskop für beugungsobjekte

Country Status (6)

Country Link
US (2) US20050099682A1 (de)
EP (1) EP1332397B1 (de)
AT (1) ATE341012T1 (de)
AU (1) AU2002223730A1 (de)
DE (1) DE60123450D1 (de)
WO (1) WO2002037157A2 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE450807T1 (de) * 2003-07-04 2009-12-15 Vincent Lauer Bildgebungsvorrichtung für konfokale mikroskopie mit bildsubstraktion
DE10338472B4 (de) * 2003-08-21 2020-08-06 Carl Zeiss Meditec Ag Optisches Abbildungssystem mit erweiterter Schärfentiefe
US7916304B2 (en) * 2006-12-21 2011-03-29 Howard Hughes Medical Institute Systems and methods for 3-dimensional interferometric microscopy
FR2917844A3 (fr) * 2007-06-20 2008-12-26 Vincent Lauer Dispositif interferometrique
US8759077B2 (en) * 2007-08-28 2014-06-24 Lightspeed Genomics, Inc. Apparatus for selective excitation of microparticles
US8222040B2 (en) * 2007-08-28 2012-07-17 Lightspeed Genomics, Inc. Nucleic acid sequencing by selective excitation of microparticles
US8228601B2 (en) * 2008-05-13 2012-07-24 Applied Materials Israel, Ltd. Scanning microscopy using inhomogeneous polarization
WO2010021148A1 (ja) * 2008-08-20 2010-02-25 国立大学法人東北大学 形状・傾斜検知及び／又は計測光学装置及び方法並びにその関連装置
US7988295B2 (en) * 2008-10-28 2011-08-02 Heidelberg Engineering Gmbh Laser control with phase plate feedback
US9465228B2 (en) 2010-03-19 2016-10-11 Optical Biosystems, Inc. Illumination apparatus optimized for synthetic aperture optics imaging using minimum selective excitation patterns
US8502867B2 (en) * 2010-03-19 2013-08-06 Lightspeed Genomics, Inc. Synthetic aperture optics imaging method using minimum selective excitation patterns
US8934103B2 (en) 2011-12-22 2015-01-13 General Electric Company Quantitative phase microscopy for label-free high-contrast cell imaging
US8693000B2 (en) * 2011-12-22 2014-04-08 General Electric Company Quantitative phase microscopy for label-free high-contrast cell imaging
US10620118B2 (en) * 2012-02-27 2020-04-14 Steris Instrument Management Services, Inc. Systems and methods for identifying optical materials
WO2015121853A1 (en) * 2014-02-13 2015-08-20 B. G. Negev Technologies And Applications Ltd., At Ben-Gurion University Real time dual mode full-field optical coherence microscopy with full range imaging
WO2016178856A1 (en) 2015-05-01 2016-11-10 The Board Of Regents Of The University Of Texas System Uniform and scalable light-sheets generated by extended focusing
KR20170076517A (ko) 2015-12-24 2017-07-04 주식회사 연시스템즈 단안식 입체 카메라
KR101608404B1 (ko) * 2015-12-24 2016-04-01 주식회사 연시스템즈 입체 이미지를 촬영하기 위한 단안식 현미경
WO2017163233A1 (en) * 2016-03-22 2017-09-28 B. G. Negev Technologies And Applications Ltd., At Ben-Gurion University Frequency modulated multiple wavelength parallel phase shift interferometry
WO2017180680A1 (en) 2016-04-12 2017-10-19 The Board Of Regents Of The University Of Texas System LIGHT-SHEET MICROSCOPE WITH PARALLELIZED 3D lMAGE ACQUISITION
US9880377B1 (en) * 2016-09-09 2018-01-30 Photonicsys Ltd. Multiple wavelengths real time phase shift interference microscopy
EP3538941A4 (de) 2016-11-10 2020-06-17 The Trustees of Columbia University in the City of New York Schnelles hochauflösendes bildgebungsverfahren für grosse proben
JP6239166B2 (ja) * 2017-01-11 2017-11-29 アストロデザイン株式会社 光学的分解能向上装置
US11366303B2 (en) 2018-01-30 2022-06-21 Rebus Biosystems, Inc. Method for detecting particles using structured illumination
CN108828761B (zh) * 2018-06-13 2020-05-29 河北工程大学 一种显微图像记录实验系统及图像记录方法
CN111816344B (zh) * 2020-07-01 2022-10-25 浙江大学 同时操纵多个瑞利区低折射率微粒且高捕获效率的装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3705755A (en) * 1970-08-24 1972-12-12 Stephen Charles Baer Microscopy apparatus
US4478482A (en) * 1981-05-11 1984-10-23 Koester Charles J Axial scanning optical system and method of examining an object plane
US4873653A (en) * 1986-04-09 1989-10-10 Carl-Zeiss-Stiftung Microscope system for providing three-dimensional resolution
CH678663A5 (de) * 1988-06-09 1991-10-15 Zeiss Carl Fa
US5386112A (en) * 1990-06-29 1995-01-31 Dixon; Arthur E. Apparatus and method for transmitted-light and reflected-light imaging
US5241364A (en) * 1990-10-19 1993-08-31 Fuji Photo Film Co., Ltd. Confocal scanning type of phase contrast microscope and scanning microscope
US6215587B1 (en) * 1994-02-14 2001-04-10 Robert R. Alfano Microscope imaging inside highly scattering media
JP3699761B2 (ja) * 1995-12-26 2005-09-28 オリンパス株式会社 落射蛍光顕微鏡
WO1999012068A1 (fr) * 1997-08-29 1999-03-11 Olympus Optical Co., Ltd. Dispositif d'eclairage a emission pour microscopes
US6078390A (en) * 1998-05-04 2000-06-20 General Scanning, Inc. Scanning system and method of operation for automatically setting detection sensitivity

Also Published As

Publication number Publication date
US20050099682A1 (en) 2005-05-12
EP1332397B1 (de) 2006-09-27
US20060274408A1 (en) 2006-12-07
ATE341012T1 (de) 2006-10-15
WO2002037157A3 (fr) 2002-07-18
WO2002037157A2 (fr) 2002-05-10
EP1332397A2 (de) 2003-08-06
AU2002223730A1 (en) 2002-05-15

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Legal Events

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