AU2002223730A1 - Microscope for diffracting objects - Google Patents

Microscope for diffracting objects

Info

Publication number
AU2002223730A1
AU2002223730A1 AU2002223730A AU2373002A AU2002223730A1 AU 2002223730 A1 AU2002223730 A1 AU 2002223730A1 AU 2002223730 A AU2002223730 A AU 2002223730A AU 2373002 A AU2373002 A AU 2373002A AU 2002223730 A1 AU2002223730 A1 AU 2002223730A1
Authority
AU
Australia
Prior art keywords
microscope
reflected
wave
passing
diffracting objects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2002223730A
Inventor
Vincent Lauer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from FR0014160A external-priority patent/FR2816412A1/en
Priority claimed from FR0101908A external-priority patent/FR2820830A1/en
Priority claimed from FR0103215A external-priority patent/FR2821935A1/en
Priority claimed from FR0103861A external-priority patent/FR2822552A1/en
Application filed by Individual filed Critical Individual
Publication of AU2002223730A1 publication Critical patent/AU2002223730A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Bending Of Plates, Rods, And Pipes (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The invention concerns a microscope for observing diffracting objects comprising a laser beam ( 2000 ) reflected by a first surface of mobile mirrors ( 2003 ) and ( 2007 ), passing through the condenser ( 2011 ), the sample ( 2040 ), the lens ( 2013 ), reflected by a second surface of mobile mirrors, passing through a filtering device ( 2019 ) and third-wave palates ( 2022 ) ( 2027 ) applying phase shifts only to the non-diffracted part of the wave, and detected by the cameras ( 2024 ) ( 2029 ) ( 2032 ). The invention is applicable in fast three-dimensional and two-dimensional microscopy, in biology and the study of materials.
AU2002223730A 2000-11-06 2001-11-02 Microscope for diffracting objects Abandoned AU2002223730A1 (en)

Applications Claiming Priority (13)

Application Number Priority Date Filing Date Title
FR00/14160 2000-11-06
FR0014160A FR2816412A1 (en) 2000-11-06 2000-11-06 Microscope for diffracting objects, comprises light source, condenser, light beam not focussed on observed object, mirrors, microscope objective and attenuating and phase modifying filters
FR0014160 2000-11-06
FR01/01908 2001-02-13
FR0101908A FR2820830A1 (en) 2001-02-13 2001-02-13 Microscope for diffracting objects, comprises light source, condenser, light beam not focussed on observed object, mirrors, microscope objective and attenuating and phase modifying filters
FR0101908 2001-02-13
FR01/03215 2001-03-09
FR0103215 2001-03-09
FR0103215A FR2821935A1 (en) 2001-03-09 2001-03-09 Microscope for diffracting objects, comprises light source, condenser, light beam not focussed on observed object, mirrors, microscope objective and attenuating and phase modifying filters
FR0103861 2001-03-22
FR0103861A FR2822552A1 (en) 2001-03-22 2001-03-22 Microscope for diffracting objects, comprises light source, condenser, light beam not focussed on observed object, mirrors, microscope objective and attenuating and phase modifying filters
FR01/03861 2001-03-22
PCT/FR2001/003394 WO2002037157A2 (en) 2000-11-06 2001-11-02 Microscope for diffracting objects

Publications (1)

Publication Number Publication Date
AU2002223730A1 true AU2002223730A1 (en) 2002-05-15

Family

ID=27445925

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2002223730A Abandoned AU2002223730A1 (en) 2000-11-06 2001-11-02 Microscope for diffracting objects

Country Status (6)

Country Link
US (2) US20050099682A1 (en)
EP (1) EP1332397B1 (en)
AT (1) ATE341012T1 (en)
AU (1) AU2002223730A1 (en)
DE (1) DE60123450D1 (en)
WO (1) WO2002037157A2 (en)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1972983B1 (en) * 2003-07-04 2009-12-02 Vincent Lauer Scanning imaging device for confocal microscopy with image substraction
DE10338472B4 (en) 2003-08-21 2020-08-06 Carl Zeiss Meditec Ag Optical imaging system with extended depth of field
US7916304B2 (en) * 2006-12-21 2011-03-29 Howard Hughes Medical Institute Systems and methods for 3-dimensional interferometric microscopy
FR2917844A1 (en) * 2007-06-20 2008-12-26 Vincent Lauer INTERFEROMETER DEVICE
US8759077B2 (en) 2007-08-28 2014-06-24 Lightspeed Genomics, Inc. Apparatus for selective excitation of microparticles
US8222040B2 (en) * 2007-08-28 2012-07-17 Lightspeed Genomics, Inc. Nucleic acid sequencing by selective excitation of microparticles
US8228601B2 (en) * 2008-05-13 2012-07-24 Applied Materials Israel, Ltd. Scanning microscopy using inhomogeneous polarization
US20110144505A1 (en) * 2008-08-20 2011-06-16 Masaki Yamamoto Optical device and method for shape and gradient detection and/or measurement and associated device
US7988295B2 (en) * 2008-10-28 2011-08-02 Heidelberg Engineering Gmbh Laser control with phase plate feedback
US8502867B2 (en) * 2010-03-19 2013-08-06 Lightspeed Genomics, Inc. Synthetic aperture optics imaging method using minimum selective excitation patterns
US9465228B2 (en) 2010-03-19 2016-10-11 Optical Biosystems, Inc. Illumination apparatus optimized for synthetic aperture optics imaging using minimum selective excitation patterns
US8693000B2 (en) 2011-12-22 2014-04-08 General Electric Company Quantitative phase microscopy for label-free high-contrast cell imaging
US8934103B2 (en) 2011-12-22 2015-01-13 General Electric Company Quantitative phase microscopy for label-free high-contrast cell imaging
WO2013130681A1 (en) * 2012-02-27 2013-09-06 Integrated Medical Systems International, Inc. Systems and methods for identifying optical material
US10190867B2 (en) 2014-02-13 2019-01-29 B. G. Negev Technologies And Applications Ltd., At Ben-Gurion University Real time dual mode full-field optical coherence microscopy with full range imaging
WO2016178856A1 (en) 2015-05-01 2016-11-10 The Board Of Regents Of The University Of Texas System Uniform and scalable light-sheets generated by extended focusing
KR101608404B1 (en) * 2015-12-24 2016-04-01 주식회사 연시스템즈 Single lens Microscope for three dimensional image
KR20170076517A (en) 2015-12-24 2017-07-04 주식회사 연시스템즈 Single Lens Camera for three dimensional image
US20190101380A1 (en) * 2016-03-22 2019-04-04 B.G. Negev Technologies And Applications Ltd., At Ben-Gurion University Frequency modulated multiple wavelength parallel phase shift interferometry
US10876970B2 (en) 2016-04-12 2020-12-29 The Board Of Regents Of The University Of Texas System Light-sheet microscope with parallelized 3D image acquisition
US9880377B1 (en) * 2016-09-09 2018-01-30 Photonicsys Ltd. Multiple wavelengths real time phase shift interference microscopy
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees
JP6239166B2 (en) * 2017-01-11 2017-11-29 アストロデザイン株式会社 Optical resolution improvement device
WO2019152539A1 (en) 2018-01-30 2019-08-08 Optical Biosystems, Inc. Method for detecting particles using structured illumination
CN108828761B (en) * 2018-06-13 2020-05-29 河北工程大学 Microscopic image recording experimental system and image recording method
CN111816344B (en) * 2020-07-01 2022-10-25 浙江大学 Simultaneous manipulation of multiple Rayleigh zone low-refractive-index particles with high trapping efficiency

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3705755A (en) * 1970-08-24 1972-12-12 Stephen Charles Baer Microscopy apparatus
US4478482A (en) * 1981-05-11 1984-10-23 Koester Charles J Axial scanning optical system and method of examining an object plane
US4873653A (en) * 1986-04-09 1989-10-10 Carl-Zeiss-Stiftung Microscope system for providing three-dimensional resolution
CH678663A5 (en) * 1988-06-09 1991-10-15 Zeiss Carl Fa
US5386112A (en) * 1990-06-29 1995-01-31 Dixon; Arthur E. Apparatus and method for transmitted-light and reflected-light imaging
US5241364A (en) * 1990-10-19 1993-08-31 Fuji Photo Film Co., Ltd. Confocal scanning type of phase contrast microscope and scanning microscope
US6215587B1 (en) * 1994-02-14 2001-04-10 Robert R. Alfano Microscope imaging inside highly scattering media
JP3699761B2 (en) * 1995-12-26 2005-09-28 オリンパス株式会社 Epifluorescence microscope
EP1008884B1 (en) * 1997-08-29 2006-09-27 Olympus Optical Co., Ltd. Transmission illuminator for microscopes
US6078390A (en) * 1998-05-04 2000-06-20 General Scanning, Inc. Scanning system and method of operation for automatically setting detection sensitivity

Also Published As

Publication number Publication date
EP1332397B1 (en) 2006-09-27
ATE341012T1 (en) 2006-10-15
US20060274408A1 (en) 2006-12-07
US20050099682A1 (en) 2005-05-12
EP1332397A2 (en) 2003-08-06
DE60123450D1 (en) 2006-11-09
WO2002037157A3 (en) 2002-07-18
WO2002037157A2 (en) 2002-05-10

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