DE60115314D1 - Verfahren für die Auswertung von Bildern zur Defekterkennung - Google Patents

Verfahren für die Auswertung von Bildern zur Defekterkennung

Info

Publication number
DE60115314D1
DE60115314D1 DE60115314T DE60115314T DE60115314D1 DE 60115314 D1 DE60115314 D1 DE 60115314D1 DE 60115314 T DE60115314 T DE 60115314T DE 60115314 T DE60115314 T DE 60115314T DE 60115314 D1 DE60115314 D1 DE 60115314D1
Authority
DE
Germany
Prior art keywords
evaluation
images
defect detection
defect
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60115314T
Other languages
English (en)
Other versions
DE60115314T2 (de
Inventor
Grantham Pang Kwok-Hung
Kumar Aiay
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Hong Kong HKU
Original Assignee
University of Hong Kong HKU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Hong Kong HKU filed Critical University of Hong Kong HKU
Application granted granted Critical
Publication of DE60115314D1 publication Critical patent/DE60115314D1/de
Publication of DE60115314T2 publication Critical patent/DE60115314T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Wood Science & Technology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Treatment Of Fiber Materials (AREA)
  • Image Analysis (AREA)
DE60115314T 2000-04-18 2001-04-18 Verfahren für die Auswertung von Bildern zur Defekterkennung Expired - Lifetime DE60115314T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US19770800P 2000-04-18 2000-04-18
US197708P 2000-04-18

Publications (2)

Publication Number Publication Date
DE60115314D1 true DE60115314D1 (de) 2006-01-05
DE60115314T2 DE60115314T2 (de) 2006-08-03

Family

ID=22730435

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60115314T Expired - Lifetime DE60115314T2 (de) 2000-04-18 2001-04-18 Verfahren für die Auswertung von Bildern zur Defekterkennung

Country Status (5)

Country Link
US (1) US6804381B2 (de)
EP (1) EP1148332B1 (de)
CN (1) CN100401043C (de)
DE (1) DE60115314T2 (de)
HK (1) HK1042944A1 (de)

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KR101051555B1 (ko) * 2007-11-20 2011-07-22 삼성메디슨 주식회사 개선된 3차원 초음파 영상을 형성하는 초음파 영상 장치 및방법
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JP5315417B2 (ja) * 2009-11-18 2013-10-16 本田技研工業株式会社 表面検査装置及び表面検査方法
US20110141269A1 (en) * 2009-12-16 2011-06-16 Stephen Michael Varga Systems And Methods For Monitoring On-Line Webs Using Line Scan Cameras
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CN102230901B (zh) * 2011-06-21 2013-04-03 福州大学 织物瑕疵光电检测装置
US9915944B2 (en) 2011-08-17 2018-03-13 Seagate Technology Llc In-line analyzer for wavelet based defect scanning
CN102495076B (zh) * 2011-12-07 2013-06-19 广东辉丰科技股份有限公司 一种基于机器视觉的拉链金属链牙缺陷检测方法
CN102854193A (zh) * 2012-08-30 2013-01-02 苏州天准精密技术有限公司 一种用于图像瑕疵检测的检测方法和检测系统
FR3010523B1 (fr) * 2013-09-06 2015-09-25 Safran Procede de caracterisation d'une piece en materiau composite
CN104463236A (zh) * 2014-11-25 2015-03-25 武汉钢铁(集团)公司 一种钢材表面缺陷自动识别方法、移动终端及数据服务器
CN104674604B (zh) * 2015-03-04 2016-07-13 周迪 基于飞行喷射机器人的古籍修复方法
CN105466950B (zh) * 2016-01-14 2018-06-01 上海孚兴电子科技有限公司 一种基于视觉的竹块在线检测方法及系统
CN105701477B (zh) * 2016-02-19 2017-07-14 中原工学院 一种基于平稳小波变换视觉显著性的织物疵点检测方法
CN105931246A (zh) * 2016-05-05 2016-09-07 东华大学 一种基于小波变换和遗传算法的织物瑕疵检测方法
CA3038607C (en) * 2016-11-29 2021-02-16 Wartsila Finland Oy An ultrasonic quality control using filtered image data
EP3361444A1 (de) * 2017-02-10 2018-08-15 ABB Schweiz AG Verfahren zur echtzeitvollbahnbildverarbeitung und system zur bahnherstellungsüberwachung
CN107895371B (zh) * 2017-11-24 2021-10-01 常州大学 基于峰值覆盖值和Gabor特征的纺织品瑕疵检测方法
CN108755072B (zh) * 2018-07-13 2020-12-04 常州市宏大电气有限公司 基于机器视觉的织物在线自动整花方法
CN109410192B (zh) * 2018-10-18 2020-11-03 首都师范大学 一种多纹理分级融合的织物缺陷检测方法及其装置
CN109584225B (zh) * 2018-11-23 2023-02-03 聚时科技(上海)有限公司 一种基于自编码器的无监督缺陷检测方法
CN110033433B (zh) * 2019-03-04 2021-07-02 深圳市智能机器人研究院 一种纹理缺陷检测方法、系统、装置和存储介质
CN111340752A (zh) * 2019-12-04 2020-06-26 京东方科技集团股份有限公司 屏幕的检测方法、装置、电子设备及计算机可读存储介质
CN111062934B (zh) * 2019-12-25 2023-10-13 陈金选 一种织物图像缺陷实时检测方法
CN111709915A (zh) * 2020-05-28 2020-09-25 拉萨经济技术开发区美第意户外用品有限公司 一种速干面料瑕疵的自动检测方法及系统
US11205262B2 (en) * 2020-07-28 2021-12-21 Jiangnan University Online detection method of circular weft knitting stripe defects based on gray gradient method
EP3964824B1 (de) * 2020-09-02 2024-02-14 AT & S Austria Technologie & Systemtechnik Aktiengesellschaft Dehnungskoeffizientenbestimmung mit verformungsmessung und simulation
CN112884691A (zh) * 2021-03-10 2021-06-01 深圳中科飞测科技股份有限公司 数据增强及装置、数据增强设备和存储介质
CN114066816B (zh) * 2021-10-21 2023-08-15 西安理工大学 基于静态小波变换提取的sar图像无监督变化检测方法
CN114612468B (zh) * 2022-05-09 2022-07-15 西南交通大学 一种基于正样本的设备外部缺陷检测方法
CN114693676B (zh) * 2022-05-31 2022-08-19 南通市通州翔鹏纺织品有限公司 一种新材料纺织品漂白缺陷光学检测方法及装置
CN115100201B (zh) * 2022-08-25 2022-11-11 淄博齐华制衣有限公司 一种阻燃纤维材料的混纺缺陷检测方法
CN115240144B (zh) * 2022-09-21 2022-12-27 青岛宏大纺织机械有限责任公司 一种纺纱捻线智能识别瑕疵方法及系统
CN116735612B (zh) * 2023-08-15 2023-11-07 山东精亿机械制造有限公司 一种精密电子元器件焊接缺陷检测方法
CN116934749B (zh) * 2023-09-15 2023-12-19 山东虹纬纺织有限公司 基于图像特征的纺织物瑕疵快速检测方法
CN117911417B (zh) * 2024-03-20 2024-05-31 天津市凯瑞新材料科技有限公司 一种基于光电探测器的纺织布面缺陷检测方法

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Also Published As

Publication number Publication date
US6804381B2 (en) 2004-10-12
EP1148332A3 (de) 2001-11-07
CN1335496A (zh) 2002-02-13
EP1148332B1 (de) 2005-11-30
CN100401043C (zh) 2008-07-09
DE60115314T2 (de) 2006-08-03
EP1148332A2 (de) 2001-10-24
US20020054293A1 (en) 2002-05-09
HK1042944A1 (en) 2002-08-30

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Legal Events

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