DE60109567D1 - Kammer und Verfahren zur Bearbeitung elektronischer Geräte und deren Anwendung - Google Patents

Kammer und Verfahren zur Bearbeitung elektronischer Geräte und deren Anwendung

Info

Publication number
DE60109567D1
DE60109567D1 DE60109567T DE60109567T DE60109567D1 DE 60109567 D1 DE60109567 D1 DE 60109567D1 DE 60109567 T DE60109567 T DE 60109567T DE 60109567 T DE60109567 T DE 60109567T DE 60109567 D1 DE60109567 D1 DE 60109567D1
Authority
DE
Germany
Prior art keywords
chamber
electronic devices
application
test
processing electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60109567T
Other languages
English (en)
Inventor
Anders Persson
Kent Madsen
Hans Bergstedt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Telefonaktiebolaget LM Ericsson AB
Original Assignee
Telefonaktiebolaget LM Ericsson AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Telefonaktiebolaget LM Ericsson AB filed Critical Telefonaktiebolaget LM Ericsson AB
Application granted granted Critical
Publication of DE60109567D1 publication Critical patent/DE60109567D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of antennas
    • G01R29/105—Radiation diagrams of antennas using anechoic chambers; Chambers or open field sites used therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Mobile Radio Communication Systems (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Multi-Process Working Machines And Systems (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE60109567T 2001-01-16 2001-01-16 Kammer und Verfahren zur Bearbeitung elektronischer Geräte und deren Anwendung Expired - Lifetime DE60109567D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP01610005A EP1223432B1 (de) 2001-01-16 2001-01-16 Kammer und Verfahren zur Bearbeitung elektronischer Geräte und deren Anwendung

Publications (1)

Publication Number Publication Date
DE60109567D1 true DE60109567D1 (de) 2005-04-28

Family

ID=8183510

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60109567T Expired - Lifetime DE60109567D1 (de) 2001-01-16 2001-01-16 Kammer und Verfahren zur Bearbeitung elektronischer Geräte und deren Anwendung

Country Status (4)

Country Link
US (1) US20020160717A1 (de)
EP (1) EP1223432B1 (de)
AT (1) ATE291744T1 (de)
DE (1) DE60109567D1 (de)

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EP1739442B1 (de) 2005-06-29 2009-12-09 SwissQual License AG Kammer zur Bearbeitung elektronischer geräte
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US8521092B2 (en) * 2009-05-27 2013-08-27 Echo Ridge Llc Wireless transceiver test bed system and method
US8295777B1 (en) * 2009-06-19 2012-10-23 Sprint Spectrum L.P. Method and system for automated handoff testing
US8350765B2 (en) * 2010-05-14 2013-01-08 The United States Of America As Represented By The Secretary Of The Navy Resonant cavity injection-based calibration of a radiant energy device
CN102933905B (zh) * 2010-05-26 2015-04-01 Lg电子株式会社 烹调装置
US20110300809A1 (en) * 2010-06-03 2011-12-08 Research In Motion Limited Method of verification for a wireless system
EP2392932B1 (de) * 2010-06-03 2014-12-03 BlackBerry Limited System und Verfahren zur Verifizierung einer zu prüfenden Vorrichtung
US9265097B2 (en) * 2010-07-01 2016-02-16 Goji Limited Processing objects by radio frequency (RF) energy
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US8706044B2 (en) * 2010-08-31 2014-04-22 Apple Inc. Methods of testing wireless devices in over-the-air radio-frequency test systems without path loss characterization
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US9588218B2 (en) 2010-09-30 2017-03-07 Echo Ridge Llc System and method for robust navigation and geolocation using measurements of opportunity
US8503947B2 (en) * 2010-10-01 2013-08-06 Murata Manufacturing Co., Ltd. Multi-radio test method and test fixture
US9992824B2 (en) 2010-10-29 2018-06-05 Goji Limited Time estimation for energy application in an RF energy transfer device
US8903326B2 (en) * 2010-11-15 2014-12-02 Apple Inc. Simultaneous downlink testing for multiple devices in radio-frequency test systems
US9213053B2 (en) 2010-12-02 2015-12-15 Apple Inc. System for field testing wireless devices with reduced multipath interference
NL2006275C2 (en) * 2011-02-22 2012-08-24 Comtest Engineering B V Reverberation chamber and method for reverberating electromagnetic radiation in a reverberation chamber.
US9258067B2 (en) 2011-06-15 2016-02-09 Bluetest Ab Method and apparatus for measuring the performance of antennas, mobile phones and other wireless terminals
US9739891B2 (en) 2011-09-30 2017-08-22 Echo Ridge Llc System and method of using measurements of opportunity with vector tracking filters for improved navigation
US9594170B2 (en) 2011-09-30 2017-03-14 Echo Ridge Llc Performance improvements for measurement of opportunity geolocation/navigation systems
US9319908B2 (en) 2011-10-12 2016-04-19 Apple Inc. Methods for reducing path loss while testing wireless electronic devices with multiple antennas
US9148808B2 (en) 2011-12-01 2015-09-29 Echo Ridge Llc Adaptive RF system testing system and method
US20130303089A1 (en) * 2012-05-11 2013-11-14 Apple Inc. Uplink and/or Downlink Testing of Wireless Devices in a Reverberation Chamber
US9151693B1 (en) * 2012-06-20 2015-10-06 Amazon Technologies, Inc. Combinatorial test device
CN103685658B (zh) * 2012-09-19 2016-05-04 英华达（南京）科技有限公司 手持装置的信号测试系统及其信号测试方法
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US9772363B2 (en) * 2014-02-26 2017-09-26 Nokomis, Inc. Automated analysis of RF effects on electronic devices through the use of device unintended emissions
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CN108234036B (zh) 2016-12-14 2020-05-12 深圳市通用测试系统有限公司 Mimo无线终端的无线性能测试方法
US10466291B2 (en) * 2016-12-29 2019-11-05 Rohde & Schwarz Gmbh & Co. Kg Signal processing unit and signal processing method
KR101935259B1 (ko) * 2017-02-10 2019-01-07 한국전자통신연구원 전자파 잔향실
US10605857B2 (en) * 2017-05-24 2020-03-31 Rohde & Schwarz Gmbh & Co. Kg Anechoic chamber for testing a device under test
EP3467523B1 (de) * 2017-10-05 2020-04-15 Rohde & Schwarz GmbH & Co. KG Messsystem und verfahren zur untersuchung eines prüflings bezüglich seines temperaturverhaltens
SE541521C2 (en) * 2018-01-17 2019-10-29 Bluetest Ab Apparatus and method for production testing of devices with wireless capability
US11032012B2 (en) * 2018-06-05 2021-06-08 Rohde & Schwarz Gmbh & Co. Kg Radio frequency channel emulator system
KR102661011B1 (ko) * 2018-08-27 2024-04-25 김남식 소형 전자파 차폐 및 흡수성능 측정기
EP3699611A1 (de) * 2019-02-19 2020-08-26 Rohde & Schwarz GmbH & Co. KG Messsystem, messaufbau sowie verfahren zur durchführung von messungen
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Also Published As

Publication number Publication date
EP1223432A1 (de) 2002-07-17
US20020160717A1 (en) 2002-10-31
ATE291744T1 (de) 2005-04-15
EP1223432B1 (de) 2005-03-23

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Legal Events

Date Code Title Description
8332 No legal effect for de