DE60039433D1 - Wärmeaufzeichnungsverfahren mit einer synthetischen referenz - Google Patents
Wärmeaufzeichnungsverfahren mit einer synthetischen referenzInfo
- Publication number
- DE60039433D1 DE60039433D1 DE60039433T DE60039433T DE60039433D1 DE 60039433 D1 DE60039433 D1 DE 60039433D1 DE 60039433 T DE60039433 T DE 60039433T DE 60039433 T DE60039433 T DE 60039433T DE 60039433 D1 DE60039433 D1 DE 60039433D1
- Authority
- DE
- Germany
- Prior art keywords
- recording method
- synthetic reference
- heat recording
- frames
- time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
- G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Radiation Pyrometers (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Thermal Transfer Or Thermal Recording In General (AREA)
- Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
- Heat Sensitive Colour Forming Recording (AREA)
- Image Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Closed-Circuit Television Systems (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14488699P | 1999-07-21 | 1999-07-21 | |
US09/568,053 US6367969B1 (en) | 1999-07-21 | 2000-05-10 | Synthetic reference thermal imaging method |
PCT/US2000/016053 WO2001007902A1 (en) | 1999-07-21 | 2000-06-12 | Synthetic reference thermal imaging method |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60039433D1 true DE60039433D1 (de) | 2008-08-21 |
Family
ID=26842457
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60039433T Expired - Lifetime DE60039433D1 (de) | 1999-07-21 | 2000-06-12 | Wärmeaufzeichnungsverfahren mit einer synthetischen referenz |
Country Status (9)
Country | Link |
---|---|
US (1) | US6367969B1 (de) |
EP (1) | EP1203224B1 (de) |
JP (1) | JP4698907B2 (de) |
KR (1) | KR100720214B1 (de) |
AT (1) | ATE400808T1 (de) |
BR (1) | BR0012679A (de) |
DE (1) | DE60039433D1 (de) |
TR (1) | TR200200139T2 (de) |
WO (1) | WO2001007902A1 (de) |
Families Citing this family (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ATE423966T1 (de) * | 1999-12-02 | 2009-03-15 | Thermal Wave Imaging Inc | Verfahren und system zur bezugsfreien thermographischen erkennung von suboberflächendefekten unter verwendung komprimierter bilddaten |
US6517238B2 (en) * | 2001-01-18 | 2003-02-11 | The United States Of America As Represented By The United States Department Of Energy | Thermal imaging measurement of lateral diffusivity and non-invasive material defect detection |
ITRM20020023A1 (it) * | 2002-01-18 | 2003-07-18 | Intelligence Devices S R L | Metodo e relativo dispositivo per il rilevamento di oggetti. |
US6712502B2 (en) * | 2002-04-10 | 2004-03-30 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Synchronized electronic shutter system and method for thermal nondestructive evaluation |
US7064331B2 (en) * | 2002-09-13 | 2006-06-20 | Siemens Power Generation, Inc. | Method for calibrating and enhancing flaw detection of an acoustic thermography system |
US7071462B2 (en) * | 2003-06-16 | 2006-07-04 | Raytek Corporation | Calibration system and method to correct distortion of thermal images from in-line and rotary thermoforming machines |
US20050018748A1 (en) * | 2003-07-24 | 2005-01-27 | Ringermacher Harry Israel | Actively quenched lamp, infrared thermography imaging system, and method for actively controlling flash duration |
US7015473B2 (en) * | 2003-09-30 | 2006-03-21 | General Electric Company | Method and apparatus for internal feature reconstruction |
JP4672313B2 (ja) * | 2004-09-01 | 2011-04-20 | アンリツ株式会社 | 印刷はんだ検査装置 |
CN100383502C (zh) * | 2004-12-17 | 2008-04-23 | 华中科技大学 | 红外序列图像历史趋势分析方法 |
US7591583B2 (en) * | 2005-05-18 | 2009-09-22 | Federal-Mogul World Wide, Inc. | Transient defect detection algorithm |
US7388204B2 (en) * | 2005-12-07 | 2008-06-17 | Meyer Tool, Inc. | Apparatus and method for analyzing relative outward flow characterizations of fabricated features |
US7409313B2 (en) * | 2005-12-16 | 2008-08-05 | General Electric Company | Method and apparatus for nondestructive evaluation of insulative coating |
US7822268B2 (en) * | 2006-06-06 | 2010-10-26 | Siemens Energy, Inc. | Advanced processing of active thermography signals |
US7671338B2 (en) * | 2006-06-14 | 2010-03-02 | Meyer Tool, Inc. | Apparatus and method for analyzing relative outward flow characterizations of fabricated features |
DE102006043339B4 (de) * | 2006-09-15 | 2010-11-11 | Siemens Ag | Verfahren und Vorrichtung zur Bestimmung von Bauteilwandstärken mittels Thermographie |
US7365330B1 (en) * | 2006-09-18 | 2008-04-29 | Uchicago Argonne, Llc | Method for thermal tomography of thermal effusivity from pulsed thermal imaging |
DE102006044443A1 (de) * | 2006-09-21 | 2008-04-03 | Robert Bosch Gmbh | Automatische Erkennung von Beschichtungsfehlern |
US7516663B2 (en) * | 2006-11-03 | 2009-04-14 | General Electric Company | Systems and method for locating failure events in samples under load |
US7966883B2 (en) * | 2006-12-06 | 2011-06-28 | Lockheed Martin Corporation | Non-destructive inspection using laser-ultrasound and infrared thermography |
US7605924B2 (en) | 2006-12-06 | 2009-10-20 | Lockheed Martin Corporation | Laser-ultrasound inspection using infrared thermography |
US7549789B2 (en) * | 2007-06-20 | 2009-06-23 | General Electric Company | Method and apparatus for thermographic nondestructive evaluation of an object |
CN100498806C (zh) * | 2007-09-19 | 2009-06-10 | 中国科学院上海技术物理研究所 | 仿真红外探测器输出信号的装置及方法 |
KR101380491B1 (ko) * | 2007-12-06 | 2014-04-01 | 록히드 마틴 코포레이션 | 레이저-초음파 및 적외선 서모그래피를 이용하는 비파괴적 검사 |
US8393784B2 (en) | 2008-03-31 | 2013-03-12 | General Electric Company | Characterization of flaws in composites identified by thermography |
US8384783B2 (en) * | 2009-09-29 | 2013-02-26 | Flir Systems Ab | Infrared camera and method for calculating output power value indicative of an amount of energy dissipated in an image view |
US8692887B2 (en) * | 2010-08-27 | 2014-04-08 | General Electric Company | Thermal imaging method and apparatus for evaluating coatings |
US9007466B2 (en) * | 2011-04-27 | 2015-04-14 | General Electric Company | System and method for thermographic inspection |
US8958058B2 (en) * | 2011-11-15 | 2015-02-17 | Process Metrix | Apparatus, process, and system for monitoring the integrity of containers |
US9816866B2 (en) | 2011-12-10 | 2017-11-14 | Fei Efa, Inc. | Method for examination of a sample by means of the heat flow thermography |
EP2743688B1 (de) | 2012-12-17 | 2017-05-03 | Thermosensorik Gmbh | Verfahren und System zur Untersuchung einer Probe mittels Thermographie |
US9500611B2 (en) | 2013-09-26 | 2016-11-22 | General Electric Company | Lamp assembly for a thermographic nondestructive evaluation system |
US9250136B1 (en) | 2014-08-29 | 2016-02-02 | General Electric Company | Hyperspectral imaging system for pyrometry applications and method of operating the same |
RU2590347C1 (ru) * | 2015-04-01 | 2016-07-10 | Федеральное государственное автономное образовательное учреждение высшего образования "Национальный исследовательский Томский политехнический университет" | Способ бесконтактного одностороннего активного теплового неразрушающего контроля |
US10830132B2 (en) | 2016-04-29 | 2020-11-10 | General Electric Company | Micro thermal imaging system for turbine engines |
CN107782764B (zh) * | 2016-08-25 | 2021-02-23 | 成都鼎桥通信技术有限公司 | 一种光伏组件的故障识别方法 |
CN106351803B (zh) * | 2016-11-02 | 2019-02-26 | 广州特种承压设备检测研究院 | 海上风力机叶片运行状态监测系统 |
US11397112B2 (en) | 2017-01-09 | 2022-07-26 | General Electric Company | System and method for monitoring of gas turbine components with infrared system |
US11193820B2 (en) | 2017-01-09 | 2021-12-07 | General Electric Company | System and method for disposable infrared imaging system |
US10241036B2 (en) * | 2017-05-08 | 2019-03-26 | Siemens Energy, Inc. | Laser thermography |
CN108490030B (zh) * | 2018-03-30 | 2021-03-23 | 吉林建筑大学 | 基于无人机红外热成像的建筑围护结构热工性能检测方法 |
CN109030546B (zh) * | 2018-07-23 | 2019-09-20 | 清华大学 | 高温变形和温度测量系统和方法 |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4854724A (en) | 1984-07-09 | 1989-08-08 | Lockheed Corporation | Method of and apparatus for thermographic evaluation of spot welds |
GB8431928D0 (en) | 1984-12-18 | 1985-01-30 | Stevenson G M | Non-destructively testing heat shrinkable sleeves |
JPS62172249A (ja) | 1986-01-25 | 1987-07-29 | Kajima Corp | 煙突の劣化診断方法及び装置 |
US4792683A (en) | 1987-01-16 | 1988-12-20 | Hughes Aircraft Company | Thermal technique for simultaneous testing of circuit board solder joints |
US4872762A (en) | 1987-08-25 | 1989-10-10 | Nkk Corporation | Method and apparatus for detecting defective portion on inner surface of pipe |
GB8813423D0 (en) | 1988-06-07 | 1988-07-13 | Atomic Energy Authority Uk | Coating inspection |
US4983836A (en) | 1988-06-30 | 1991-01-08 | Nkk Corporation | Method for detecting thinned out portion on inner surface or outer surface of pipe |
JPH0212044A (ja) * | 1988-06-30 | 1990-01-17 | Nkk Corp | 赤外線カメラによる欠陥部の検出方法 |
US5032727A (en) | 1990-09-14 | 1991-07-16 | Digital Equipment Corporation | Product defect detection using thermal ratio analysis |
FR2682757A1 (fr) * | 1991-10-21 | 1993-04-23 | Inst Francais Du Petrole | Dispositif et methode de controle non destructif et continu de l'epaisseur de profiles. |
US5250809A (en) | 1992-01-24 | 1993-10-05 | Shuji Nakata | Method and device for checking joint of electronic component |
US5246291A (en) | 1992-06-01 | 1993-09-21 | Motorola, Inc. | Bond inspection technique for a semiconductor chip |
US5292195A (en) | 1992-09-09 | 1994-03-08 | Martin Marietta Corporation | Thermographic evaluation technique |
GB9303219D0 (en) | 1993-02-18 | 1993-04-07 | Horne Subsea Ltd | Sub-surface defect detection and measurement |
US5376793A (en) | 1993-09-15 | 1994-12-27 | Stress Photonics, Inc. | Forced-diffusion thermal imaging apparatus and method |
US5539656A (en) | 1994-10-11 | 1996-07-23 | United Technologies Corporation | Crack monitoring apparatus |
US5683181A (en) | 1995-05-12 | 1997-11-04 | Thermal Wave Imaging, Inc. | Method and apparatus for enhancing thermal wave imaging of reflective low-emissivity solids |
US5631465A (en) | 1996-02-29 | 1997-05-20 | Shepard; Steven M. | Method of interpreting thermographic data for non-destructive evaluation |
WO1998005921A1 (de) | 1996-07-31 | 1998-02-12 | Siemens Aktiengesellschaft | Verfahren zur wanddickenbestimmung an einer turbinenschaufel und vorrichtung zur durchführung des verfahrens |
WO1998005949A1 (de) | 1996-07-31 | 1998-02-12 | Siemens Aktiengesellschaft | Verfahren und vorrichtung zur delaminationsprüfung bei beschichtungen auf substraten, insbesondere bei vps-beschichtungen auf gasturbinenschaufeln |
US5711603A (en) | 1996-10-30 | 1998-01-27 | United Technologies Corporation | Nondestructive testing: transient depth thermography |
JPH10274675A (ja) | 1997-03-31 | 1998-10-13 | Shimadzu Corp | 放射線検出器 |
-
2000
- 2000-05-10 US US09/568,053 patent/US6367969B1/en not_active Expired - Fee Related
- 2000-06-12 BR BR0012679-9A patent/BR0012679A/pt not_active Application Discontinuation
- 2000-06-12 TR TR2002/00139T patent/TR200200139T2/xx unknown
- 2000-06-12 DE DE60039433T patent/DE60039433D1/de not_active Expired - Lifetime
- 2000-06-12 WO PCT/US2000/016053 patent/WO2001007902A1/en active IP Right Grant
- 2000-06-12 KR KR1020027000846A patent/KR100720214B1/ko active IP Right Grant
- 2000-06-12 JP JP2001512281A patent/JP4698907B2/ja not_active Expired - Lifetime
- 2000-06-12 AT AT00939787T patent/ATE400808T1/de not_active IP Right Cessation
- 2000-06-12 EP EP00939787A patent/EP1203224B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
BR0012679A (pt) | 2002-04-16 |
JP2003505692A (ja) | 2003-02-12 |
JP4698907B2 (ja) | 2011-06-08 |
KR20020035106A (ko) | 2002-05-09 |
ATE400808T1 (de) | 2008-07-15 |
WO2001007902A1 (en) | 2001-02-01 |
TR200200139T2 (tr) | 2002-05-21 |
KR100720214B1 (ko) | 2007-05-21 |
EP1203224B1 (de) | 2008-07-09 |
EP1203224A1 (de) | 2002-05-08 |
US6367969B1 (en) | 2002-04-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |