DE60036801D1 - Vorrichtung zur kontinuierlichen überwachung von emissionen verschiedener metalle in rauhen umgebungen - Google Patents

Vorrichtung zur kontinuierlichen überwachung von emissionen verschiedener metalle in rauhen umgebungen

Info

Publication number
DE60036801D1
DE60036801D1 DE60036801T DE60036801T DE60036801D1 DE 60036801 D1 DE60036801 D1 DE 60036801D1 DE 60036801 T DE60036801 T DE 60036801T DE 60036801 T DE60036801 T DE 60036801T DE 60036801 D1 DE60036801 D1 DE 60036801D1
Authority
DE
Germany
Prior art keywords
background
light emission
nitrogen
microwave
emissions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60036801T
Other languages
English (en)
Other versions
DE60036801T2 (de
Inventor
Phlip C Efthimion
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Efthimion Emerging Industries LLC
Original Assignee
Efthimion Emerging Industries LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Efthimion Emerging Industries LLC filed Critical Efthimion Emerging Industries LLC
Application granted granted Critical
Publication of DE60036801D1 publication Critical patent/DE60036801D1/de
Publication of DE60036801T2 publication Critical patent/DE60036801T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/10Devices for withdrawing samples in the liquid or fluent state
    • G01N1/14Suction devices, e.g. pumps; Ejector devices
    • G01N1/1409Suction devices, e.g. pumps; Ejector devices adapted for sampling molten metals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/22Devices for withdrawing samples in the gaseous state
    • G01N1/2202Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling
    • G01N1/2205Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling with filters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/68Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/714Sample nebulisers for flame burners or plasma burners
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/74Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flameless atomising, e.g. graphite furnaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/22Devices for withdrawing samples in the gaseous state
    • G01N1/24Suction devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/44Sample treatment involving radiation, e.g. heat
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/22Devices for withdrawing samples in the gaseous state
    • G01N1/2202Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling
    • G01N2001/222Other features
    • G01N2001/2223Other features aerosol sampling devices

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Molecular Biology (AREA)
  • Biomedical Technology (AREA)
  • Hydrology & Water Resources (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Measuring Oxygen Concentration In Cells (AREA)
  • Fire-Detection Mechanisms (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
DE60036801T 1999-07-23 2000-07-21 Vorrichtung zur kontinuierlichen überwachung von emissionen verschiedener metalle in rauhen umgebungen Expired - Fee Related DE60036801T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14534199P 1999-07-23 1999-07-23
US145341P 1999-07-23
PCT/US2000/019930 WO2001007897A1 (en) 1999-07-23 2000-07-21 A continuous emissions monitor of multiple metal species in harsh environments

Publications (2)

Publication Number Publication Date
DE60036801D1 true DE60036801D1 (de) 2007-11-29
DE60036801T2 DE60036801T2 (de) 2008-07-24

Family

ID=22512652

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60036801T Expired - Fee Related DE60036801T2 (de) 1999-07-23 2000-07-21 Vorrichtung zur kontinuierlichen überwachung von emissionen verschiedener metalle in rauhen umgebungen

Country Status (7)

Country Link
US (1) US6577390B1 (de)
EP (1) EP1196764B1 (de)
AT (1) ATE376177T1 (de)
AU (1) AU6116400A (de)
CA (1) CA2380478A1 (de)
DE (1) DE60036801T2 (de)
WO (1) WO2001007897A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6774993B2 (en) * 2001-04-03 2004-08-10 Agilent Technologies, Inc. Method and apparatus for atomic emission spectroscopy
US7123361B1 (en) 2003-03-05 2006-10-17 Verionix Incorporated Microplasma emission spectrometer
US7309842B1 (en) 2004-03-19 2007-12-18 Verionix Incorporated Shielded monolithic microplasma source for prevention of continuous thin film formation
PL2044133T3 (pl) * 2006-07-20 2015-06-30 Albemarle Corp Proces technologiczny odzyskiwania bromowanych polimerów styrenowych z mieszanin reakcyjnych, w których zostały one wytworzone i/lub przekształcenie takich mieszanin w peletki lub w granulki albo pastylki
JP2010539443A (ja) * 2007-08-07 2010-12-16 ピヴォタル システムズ コーポレーション ガスの化学組成を同定するための方法および装置
CN103278553A (zh) * 2013-04-27 2013-09-04 天津大学 一种测定燃煤产物中易挥发元素汞的方法
FI20155549L (fi) * 2015-07-10 2017-01-11 Outotec Finland Oy Menetelmä ja laite fludien optista säteilyspektroskooppiaa varten
FI129477B (fi) * 2019-05-17 2022-03-15 Andritz Oy Soodakattilan reduktioasteen määritys
CN113340669B (zh) * 2021-07-05 2023-01-24 国能神皖能源有限责任公司 用于libs煤质在线分析的全自动粉管采样装置及方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3843257A (en) * 1971-11-30 1974-10-22 Monsanto Res Corp Microwave-excited emission detector
CA1098809A (en) * 1976-07-20 1981-04-07 Dennis J. C. Macourt Particle coating analysis and mineral prospecting
US4833322A (en) * 1986-05-02 1989-05-23 Shell Oil Company Method and apparatus for analysis of material
JP2607675B2 (ja) * 1989-03-31 1997-05-07 株式会社日立製作所 原子吸光分析装置
US5242143A (en) 1992-03-12 1993-09-07 Tachi-S Co. Ltd. Cover for slide rail of automotive seat
US5479254A (en) 1993-10-22 1995-12-26 Woskov; Paul P. Continuous, real time microwave plasma element sensor
US5671045A (en) 1993-10-22 1997-09-23 Masachusetts Institute Of Technology Microwave plasma monitoring system for the elemental composition analysis of high temperature process streams
US5596405A (en) * 1995-10-03 1997-01-21 The United States Of America As Represented By The Secretary Of The Navy Method of and apparatus for the continuous emissions monitoring of toxic airborne metals
US5825485A (en) 1995-11-03 1998-10-20 Cohn; Daniel R. Compact trace element sensor which utilizes microwave generated plasma and which is portable by an individual
US5986757A (en) * 1997-09-17 1999-11-16 The United States Of America As Represented By The Secretary Of The Navy Correction of spectral interferences arising from CN emission in continuous air monitoring using inductively coupled plasma atomic emission spectroscopy
US5854431A (en) * 1997-12-10 1998-12-29 Sandia Corporation Particle preconcentrator
US5909277A (en) * 1998-02-13 1999-06-01 Massachusetts Institute Of Technology Microwave plasma element sensor

Also Published As

Publication number Publication date
ATE376177T1 (de) 2007-11-15
WO2001007897A1 (en) 2001-02-01
US6577390B1 (en) 2003-06-10
EP1196764A1 (de) 2002-04-17
EP1196764A4 (de) 2005-11-16
EP1196764B1 (de) 2007-10-17
CA2380478A1 (en) 2001-02-01
AU6116400A (en) 2001-02-13
DE60036801T2 (de) 2008-07-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee