ATE376177T1 - Vorrichtung zur kontinuierlichen überwachung von emissionen verschiedener metalle in rauhen umgebungen - Google Patents

Vorrichtung zur kontinuierlichen überwachung von emissionen verschiedener metalle in rauhen umgebungen

Info

Publication number
ATE376177T1
ATE376177T1 AT00947584T AT00947584T ATE376177T1 AT E376177 T1 ATE376177 T1 AT E376177T1 AT 00947584 T AT00947584 T AT 00947584T AT 00947584 T AT00947584 T AT 00947584T AT E376177 T1 ATE376177 T1 AT E376177T1
Authority
AT
Austria
Prior art keywords
background
light emission
nitrogen
microwave
continuous monitoring
Prior art date
Application number
AT00947584T
Other languages
English (en)
Inventor
Phlip C Efthimion
Original Assignee
Efthimion Emerging Ind Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Efthimion Emerging Ind Llc filed Critical Efthimion Emerging Ind Llc
Application granted granted Critical
Publication of ATE376177T1 publication Critical patent/ATE376177T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/10—Devices for withdrawing samples in the liquid or fluent state
    • G01N1/14—Suction devices, e.g. pumps; Ejector devices
    • G01N1/1409—Suction devices, e.g. pumps; Ejector devices adapted for sampling molten metals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/2202—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling
    • G01N1/2205—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling with filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/68—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/714—Sample nebulisers for flame burners or plasma burners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/74—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flameless atomising, e.g. graphite furnaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/24—Suction devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/44—Sample treatment involving radiation, e.g. heat
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/2202—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling
    • G01N2001/222—Other features
    • G01N2001/2223—Other features aerosol sampling devices

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Molecular Biology (AREA)
  • Biomedical Technology (AREA)
  • Hydrology & Water Resources (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Measuring Oxygen Concentration In Cells (AREA)
  • Fire-Detection Mechanisms (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
AT00947584T 1999-07-23 2000-07-21 Vorrichtung zur kontinuierlichen überwachung von emissionen verschiedener metalle in rauhen umgebungen ATE376177T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US14534199P 1999-07-23 1999-07-23

Publications (1)

Publication Number Publication Date
ATE376177T1 true ATE376177T1 (de) 2007-11-15

Family

ID=22512652

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00947584T ATE376177T1 (de) 1999-07-23 2000-07-21 Vorrichtung zur kontinuierlichen überwachung von emissionen verschiedener metalle in rauhen umgebungen

Country Status (7)

Country Link
US (1) US6577390B1 (de)
EP (1) EP1196764B1 (de)
AT (1) ATE376177T1 (de)
AU (1) AU6116400A (de)
CA (1) CA2380478A1 (de)
DE (1) DE60036801T2 (de)
WO (1) WO2001007897A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6774993B2 (en) * 2001-04-03 2004-08-10 Agilent Technologies, Inc. Method and apparatus for atomic emission spectroscopy
US7123361B1 (en) 2003-03-05 2006-10-17 Verionix Incorporated Microplasma emission spectrometer
US7309842B1 (en) 2004-03-19 2007-12-18 Verionix Incorporated Shielded monolithic microplasma source for prevention of continuous thin film formation
MX2009000535A (es) * 2006-07-20 2009-03-09 Albemarle Corp Tecnologia de proceso para recuperar polimeros estirenicos bromados de mezclas de reaccion en las cuales se forman y/o convertir estas mezclas en pelotillas o granulos o pastillas.
WO2009020881A1 (en) * 2007-08-07 2009-02-12 Pivotal Systems Corporation Method and apparatus for identifying the chemical composition of a gas
CN103278553A (zh) * 2013-04-27 2013-09-04 天津大学 一种测定燃煤产物中易挥发元素汞的方法
FI20155549L (fi) * 2015-07-10 2017-01-11 Outotec Finland Oy Menetelmä ja laite fludien optista säteilyspektroskooppiaa varten
FI129477B (fi) * 2019-05-17 2022-03-15 Andritz Oy Soodakattilan reduktioasteen määritys
CN113340669B (zh) * 2021-07-05 2023-01-24 国能神皖能源有限责任公司 用于libs煤质在线分析的全自动粉管采样装置及方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3843257A (en) 1971-11-30 1974-10-22 Monsanto Res Corp Microwave-excited emission detector
CA1098809A (en) * 1976-07-20 1981-04-07 Dennis J. C. Macourt Particle coating analysis and mineral prospecting
US4833322A (en) * 1986-05-02 1989-05-23 Shell Oil Company Method and apparatus for analysis of material
JP2607675B2 (ja) * 1989-03-31 1997-05-07 株式会社日立製作所 原子吸光分析装置
US5242143A (en) 1992-03-12 1993-09-07 Tachi-S Co. Ltd. Cover for slide rail of automotive seat
US5671045A (en) 1993-10-22 1997-09-23 Masachusetts Institute Of Technology Microwave plasma monitoring system for the elemental composition analysis of high temperature process streams
US5479254A (en) 1993-10-22 1995-12-26 Woskov; Paul P. Continuous, real time microwave plasma element sensor
US5596405A (en) * 1995-10-03 1997-01-21 The United States Of America As Represented By The Secretary Of The Navy Method of and apparatus for the continuous emissions monitoring of toxic airborne metals
US5825485A (en) 1995-11-03 1998-10-20 Cohn; Daniel R. Compact trace element sensor which utilizes microwave generated plasma and which is portable by an individual
US5986757A (en) * 1997-09-17 1999-11-16 The United States Of America As Represented By The Secretary Of The Navy Correction of spectral interferences arising from CN emission in continuous air monitoring using inductively coupled plasma atomic emission spectroscopy
US5854431A (en) * 1997-12-10 1998-12-29 Sandia Corporation Particle preconcentrator
US5909277A (en) 1998-02-13 1999-06-01 Massachusetts Institute Of Technology Microwave plasma element sensor

Also Published As

Publication number Publication date
WO2001007897A1 (en) 2001-02-01
DE60036801D1 (de) 2007-11-29
CA2380478A1 (en) 2001-02-01
EP1196764B1 (de) 2007-10-17
EP1196764A4 (de) 2005-11-16
AU6116400A (en) 2001-02-13
US6577390B1 (en) 2003-06-10
EP1196764A1 (de) 2002-04-17
DE60036801T2 (de) 2008-07-24

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Legal Events

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