DE60032726D1 - OPTISCHES ZEITBEREICHSREFLEkTOMETER - Google Patents

OPTISCHES ZEITBEREICHSREFLEkTOMETER

Info

Publication number
DE60032726D1
DE60032726D1 DE60032726T DE60032726T DE60032726D1 DE 60032726 D1 DE60032726 D1 DE 60032726D1 DE 60032726 T DE60032726 T DE 60032726T DE 60032726 T DE60032726 T DE 60032726T DE 60032726 D1 DE60032726 D1 DE 60032726D1
Authority
DE
Germany
Prior art keywords
time range
optical time
range references
references
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60032726T
Other languages
English (en)
Other versions
DE60032726T2 (de
Inventor
Satoshi Makita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Publication of DE60032726D1 publication Critical patent/DE60032726D1/de
Application granted granted Critical
Publication of DE60032726T2 publication Critical patent/DE60032726T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3145—Details of the optoelectronics or data analysis
DE60032726T 1999-09-10 2000-09-06 OPTISCHES ZEITBEREICHSREFLEkTOMETER Expired - Lifetime DE60032726T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP25745399 1999-09-10
JP25745399 1999-09-10
PCT/JP2000/006027 WO2001020288A1 (en) 1999-09-10 2000-09-06 Optical time domain reflectometer

Publications (2)

Publication Number Publication Date
DE60032726D1 true DE60032726D1 (de) 2007-02-15
DE60032726T2 DE60032726T2 (de) 2007-10-04

Family

ID=17306559

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60032726T Expired - Lifetime DE60032726T2 (de) 1999-09-10 2000-09-06 OPTISCHES ZEITBEREICHSREFLEkTOMETER

Country Status (5)

Country Link
US (1) US6594004B1 (de)
EP (1) EP1130376B1 (de)
JP (1) JP3614818B2 (de)
DE (1) DE60032726T2 (de)
WO (1) WO2001020288A1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3711950B2 (ja) * 2002-02-28 2005-11-02 横河電機株式会社 光パルス試験器
US7852213B2 (en) * 2007-08-06 2010-12-14 Woven Electronics, Llc Double-end fiber optic security system for sensing intrusions
US7141815B2 (en) * 2004-01-30 2006-11-28 The United States Of America As Represented By The Secretary Of The Army Fiber optic-based probe for use in saltwater and similarly conductive media as found in unenclosed natural environments
US7403274B2 (en) * 2006-07-16 2008-07-22 Fluke Corporation Equivalent time sampling system
GB0713585D0 (en) * 2006-07-16 2007-08-22 Fluke Corp Equivalent
US8195008B2 (en) * 2007-06-28 2012-06-05 Broadcom Corporation Method and system for processing video data in a multipixel memory to memory compositor
US8180216B2 (en) * 2007-12-20 2012-05-15 Verizon Patent And Licensing Inc. Latency measurement in optical networks
DE102010024178A1 (de) * 2010-06-17 2011-12-22 Lios Technology Gmbh Verfahren und Vorrichtung zur ortsaufgelösten Messung einer physikalischen Größe
US9964464B2 (en) 2012-04-11 2018-05-08 Ultra Communications, Inc. Optical time domain reflectometer with high resolution and high sensitivity
US10171228B2 (en) * 2015-03-19 2019-01-01 Sony Corporation Receiving circuit, electronic device, transmission/reception system, and receiving circuit control method
WO2016189352A1 (en) * 2015-05-26 2016-12-01 Uab "Lifodas" Optical time-domain reflectometer (otdr) with integrated, retractable launch cable
CN107836090B (zh) * 2016-04-14 2019-11-29 华为技术有限公司 一种光纤状态检测方法、光监控单元及站点
EP3249375A1 (de) * 2016-05-27 2017-11-29 Xieon Networks S.à r.l. Otdr mit erhöhter genauigkeit und reduziertem todbereich unter verwendung von überdeckung von impulsen mit variierender taktsignalverzögerung
US11920962B2 (en) * 2019-04-05 2024-03-05 Nec Corporation Surveying system and surveying method
CN111555801A (zh) * 2020-04-28 2020-08-18 昂纳信息技术（深圳）有限公司 一种用于光时域反射仪的光信号采样装置及其方法和光时域反射仪
CN113783607B (zh) * 2021-08-30 2023-04-14 昂纳科技(深圳)集团股份有限公司 一种双时钟错相位采样装置及其采样方法和光时域反射仪

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4438404A (en) 1982-01-04 1984-03-20 Tektronix, Inc. Signal sampling system
JPS6150033A (ja) * 1984-08-18 1986-03-12 Iwatsu Electric Co Ltd タイム・ドメイン・リフレクトメ−タ
JP2584478B2 (ja) 1988-03-14 1997-02-26 東京電力株式会社 光ファイバ後方散乱光の受信信号処理方法

Also Published As

Publication number Publication date
WO2001020288A1 (en) 2001-03-22
US6594004B1 (en) 2003-07-15
DE60032726T2 (de) 2007-10-04
EP1130376B1 (de) 2007-01-03
JP3614818B2 (ja) 2005-01-26
EP1130376A1 (de) 2001-09-05
EP1130376A4 (de) 2004-08-25

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Legal Events

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