DE60032220D1 - Kontrolle, kalibrierung und betrieb einer mikrobolometermatrix - Google Patents

Kontrolle, kalibrierung und betrieb einer mikrobolometermatrix

Info

Publication number
DE60032220D1
DE60032220D1 DE60032220T DE60032220T DE60032220D1 DE 60032220 D1 DE60032220 D1 DE 60032220D1 DE 60032220 T DE60032220 T DE 60032220T DE 60032220 T DE60032220 T DE 60032220T DE 60032220 D1 DE60032220 D1 DE 60032220D1
Authority
DE
Germany
Prior art keywords
temperature
pixel
scene
integration time
ambient
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60032220T
Other languages
English (en)
Other versions
DE60032220T2 (de
Inventor
A Wand
W Rachels
F Brady
Michael Weinstein
D Ratcliff
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
L3 Technologies Inc
Original Assignee
L3 Communications Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by L3 Communications Corp filed Critical L3 Communications Corp
Publication of DE60032220D1 publication Critical patent/DE60032220D1/de
Application granted granted Critical
Publication of DE60032220T2 publication Critical patent/DE60032220T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Steroid Compounds (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Semiconductor Lasers (AREA)
DE60032220T 1999-03-05 2000-03-06 Kontrolle, kalibrierung und betrieb einer mikrobolometermatrix Expired - Lifetime DE60032220T2 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US12317199P 1999-03-05 1999-03-05
US123171P 1999-03-05
US283274 1999-04-01
US09/283,274 US6267501B1 (en) 1999-03-05 1999-04-01 Ambient temperature micro-bolometer control, calibration, and operation
PCT/US2000/005888 WO2000052435A1 (en) 1999-03-05 2000-03-06 Control, calibration, and operation of a microbolometer array at ambient temperature

Publications (2)

Publication Number Publication Date
DE60032220D1 true DE60032220D1 (de) 2007-01-18
DE60032220T2 DE60032220T2 (de) 2007-09-13

Family

ID=26821308

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60032220T Expired - Lifetime DE60032220T2 (de) 1999-03-05 2000-03-06 Kontrolle, kalibrierung und betrieb einer mikrobolometermatrix

Country Status (6)

Country Link
US (1) US6267501B1 (de)
EP (1) EP1159591B1 (de)
AT (1) ATE347686T1 (de)
AU (1) AU3728000A (de)
DE (1) DE60032220T2 (de)
WO (1) WO2000052435A1 (de)

Cited By (1)

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US20120183011A1 (en) * 2011-01-13 2012-07-19 Seiko Epson Corporation Temperature detecting device, electro-optic device and electronic apparatus

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US7140766B2 (en) * 1999-08-04 2006-11-28 Given Imaging Ltd. Device, system and method for temperature sensing in an in-vivo device
EP2249284B1 (de) 2001-01-22 2014-03-05 Hand Held Products, Inc. Optisches Lesegerät mit Partial-Frame-Betriebsmodus
US7268924B2 (en) 2001-01-22 2007-09-11 Hand Held Products, Inc. Optical reader having reduced parameter determination delay
US6637658B2 (en) 2001-01-22 2003-10-28 Welch Allyn, Inc. Optical reader having partial frame operating mode
GB0104206D0 (en) 2001-02-21 2001-04-11 Secr Defence Radiometers
US6812465B2 (en) * 2002-02-27 2004-11-02 Indigo Systems Corporation Microbolometer focal plane array methods and circuitry
US7034301B2 (en) * 2002-02-27 2006-04-25 Indigo Systems Corporation Microbolometer focal plane array systems and methods
GB0205482D0 (en) * 2002-03-08 2002-04-24 Bae Systems Plc Improvements in or relating to infra red camera calibration
US7425093B2 (en) * 2003-07-16 2008-09-16 Cabot Corporation Thermography test method and apparatus for bonding evaluation in sputtering targets
US7681199B2 (en) * 2004-08-31 2010-03-16 Hewlett-Packard Development Company, L.P. Time measurement using a context switch count, an offset, and a scale factor, received from the operating system
US7325971B2 (en) * 2005-05-25 2008-02-05 Fons Lloyd C Method and apparatus for locating hydrocarbon deposits
US8675101B1 (en) 2007-03-28 2014-03-18 Ambarella, Inc. Temperature-based fixed pattern noise and bad pixel calibration
US8023013B1 (en) 2007-03-28 2011-09-20 Ambarella, Inc. Fixed pattern noise correction with compressed gain and offset
US8237824B1 (en) * 2007-03-28 2012-08-07 Ambarella, Inc. Fixed pattern noise and bad pixel calibration
DE102008005167A1 (de) * 2008-01-19 2009-07-23 Testo Ag Wärmebildkamera
US7679048B1 (en) 2008-04-18 2010-03-16 Flir Systems, Inc. Systems and methods for selecting microbolometers within microbolometer focal plane arrays
US9384698B2 (en) * 2009-11-30 2016-07-05 Ignis Innovation Inc. System and methods for aging compensation in AMOLED displays
US8841601B2 (en) * 2012-01-27 2014-09-23 Bae Systems Information And Electronic Systems Integration Inc. Non-linear calibration of a microbolometer included in an infrared imaging system
US20140267756A1 (en) * 2013-03-14 2014-09-18 Qualcomm Mems Technologies, Inc. Microbolometer supported by glass substrate
US20150226613A1 (en) * 2014-02-07 2015-08-13 Raytheon Company Imaging device with shutterless non-uniformity correction
EP3617676B1 (de) * 2015-03-19 2022-04-06 CI Systems (Israel) LTD. Verfahren zur korrektur von thermischer drift in einem bildgebenden gerät
JP6921591B2 (ja) * 2017-04-05 2021-08-18 旭化成エレクトロニクス株式会社 センサ出力処理装置およびセンサ出力処理方法
CN111076821B (zh) * 2019-12-11 2021-07-09 中国航空工业集团公司洛阳电光设备研究所 一种积分时间自适应切换的红外图像非均匀校正方法
EP3885725B1 (de) 2020-03-23 2022-01-12 Axis AB Verfahren, vorrichtung und system zur temperaturkalibrierung und bestimmung einer temperatur in einer szene
US11373302B2 (en) * 2020-05-01 2022-06-28 Adasky, Ltd. Thermal camera, and method thereof for early diagnosis of infectious diseases
CN112461376B (zh) * 2020-12-07 2024-05-24 爱沃泰科技(深圳)有限公司 一种自适应红外传感器信号采样算法

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US5717608A (en) * 1994-09-26 1998-02-10 Luxtron Corporation Electro-optical board assembly for measuring the temperature of an object surface from infra-red emissions thereof, including an automatic gain control therefore
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US5756999A (en) * 1997-02-11 1998-05-26 Indigo Systems Corporation Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array
US6028309A (en) * 1997-02-11 2000-02-22 Indigo Systems Corporation Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120183011A1 (en) * 2011-01-13 2012-07-19 Seiko Epson Corporation Temperature detecting device, electro-optic device and electronic apparatus

Also Published As

Publication number Publication date
EP1159591A1 (de) 2001-12-05
AU3728000A (en) 2000-09-21
US6267501B1 (en) 2001-07-31
EP1159591B1 (de) 2006-12-06
DE60032220T2 (de) 2007-09-13
ATE347686T1 (de) 2006-12-15
WO2000052435A1 (en) 2000-09-08

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