DE60010890D1 - Gerät und verfahren zur temperaturkontrolle von integrierten schaltungen während der prüfung - Google Patents

Gerät und verfahren zur temperaturkontrolle von integrierten schaltungen während der prüfung

Info

Publication number
DE60010890D1
DE60010890D1 DE60010890T DE60010890T DE60010890D1 DE 60010890 D1 DE60010890 D1 DE 60010890D1 DE 60010890 T DE60010890 T DE 60010890T DE 60010890 T DE60010890 T DE 60010890T DE 60010890 D1 DE60010890 D1 DE 60010890D1
Authority
DE
Germany
Prior art keywords
temperature control
test
integrated circuits
devices
circuits during
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60010890T
Other languages
English (en)
Other versions
DE60010890T2 (de
Inventor
Larry Dibattista
Mark Malinoski
Tomoya Shitara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Delta Design Inc
Original Assignee
Delta Design Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Delta Design Inc filed Critical Delta Design Inc
Application granted granted Critical
Publication of DE60010890D1 publication Critical patent/DE60010890D1/de
Publication of DE60010890T2 publication Critical patent/DE60010890T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Control Of Temperature (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE60010890T 1999-07-15 2000-07-14 Gerät und verfahren zur temperaturkontrolle von integrierten schaltungen während der prüfung Expired - Lifetime DE60010890T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14393299P 1999-07-15 1999-07-15
US143932P 1999-07-15
PCT/US2000/019161 WO2001006273A1 (en) 1999-07-15 2000-07-14 Apparatus and method for temperature control of ic device during test

Publications (2)

Publication Number Publication Date
DE60010890D1 true DE60010890D1 (de) 2004-06-24
DE60010890T2 DE60010890T2 (de) 2005-05-19

Family

ID=22506325

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60010890T Expired - Lifetime DE60010890T2 (de) 1999-07-15 2000-07-14 Gerät und verfahren zur temperaturkontrolle von integrierten schaltungen während der prüfung

Country Status (5)

Country Link
EP (1) EP1196790B1 (de)
AT (1) ATE267403T1 (de)
AU (1) AU6096900A (de)
DE (1) DE60010890T2 (de)
WO (1) WO2001006273A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6448992B1 (en) * 2001-11-07 2002-09-10 Advanced Micro Devices, Inc. Voltage programmable power dissipater
JP4659328B2 (ja) * 2002-10-21 2011-03-30 東京エレクトロン株式会社 被検査体を温度制御するプローブ装置
DE102005001163B3 (de) 2005-01-10 2006-05-18 Erich Reitinger Verfahren und Vorrichtung zum Testen von Halbleiterwafern mittels einer temperierbaren Aufspanneinrichtung
DE102005013926B4 (de) * 2005-03-26 2011-06-22 Jürgen Dipl.-Ing. 98693 Kröhnert Vorrichtung und Verfahren zur Temperaturregelung eines Temperiergutes
US9335080B2 (en) * 2011-10-17 2016-05-10 Temptronic Corporation Temperature system having an impurity filter
US20170261547A1 (en) * 2016-03-08 2017-09-14 Temptronic Corporation Temperature Forcing System and Method with Conductive Thermal Probes
DE102021101240A1 (de) 2021-01-21 2022-07-21 TDK Europe GmbH Testvorrichtung und Verfahren zum Betrieb der Testvorrichtung
DE112022004481T5 (de) * 2021-09-21 2024-07-18 Aem Singapore Pte. Ltd. Vorrichtung und wärmeprüfvorrichtung zum wärmeprüfen von chips einer integrierten schaltung
CN114814543A (zh) * 2022-04-22 2022-07-29 上海晶岳电子有限公司 一种电源管理芯片抗温度冲击测试系统及其测试方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5084671A (en) * 1987-09-02 1992-01-28 Tokyo Electron Limited Electric probing-test machine having a cooling system
US4870355A (en) * 1988-01-11 1989-09-26 Thermonics Incorporated Thermal fixture for testing integrated circuits
US5210485A (en) * 1991-07-26 1993-05-11 International Business Machines Corporation Probe for wafer burn-in test system
US5420520A (en) * 1993-06-11 1995-05-30 International Business Machines Corporation Method and apparatus for testing of integrated circuit chips
DE19700839C2 (de) * 1997-01-13 2000-06-08 Siemens Ag Chuckanordnung
US5911897A (en) * 1997-01-13 1999-06-15 Micro Control Company Temperature control for high power burn-in for integrated circuits

Also Published As

Publication number Publication date
EP1196790B1 (de) 2004-05-19
AU6096900A (en) 2001-02-05
WO2001006273A1 (en) 2001-01-25
DE60010890T2 (de) 2005-05-19
ATE267403T1 (de) 2004-06-15
WO2001006273A9 (en) 2002-07-11
EP1196790A1 (de) 2002-04-17

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Legal Events

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