DE60010322T2 - Konzentrisches spektrometer mit verringerung interner spiegelreflexionen - Google Patents

Konzentrisches spektrometer mit verringerung interner spiegelreflexionen Download PDF

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Publication number
DE60010322T2
DE60010322T2 DE60010322T DE60010322T DE60010322T2 DE 60010322 T2 DE60010322 T2 DE 60010322T2 DE 60010322 T DE60010322 T DE 60010322T DE 60010322 T DE60010322 T DE 60010322T DE 60010322 T2 DE60010322 T2 DE 60010322T2
Authority
DE
Germany
Prior art keywords
spectrometer
optical
light
spectrometer according
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60010322T
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German (de)
English (en)
Other versions
DE60010322D1 (de
Inventor
A. Perry PALUMBO
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hach Co
Original Assignee
Hach Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hach Co filed Critical Hach Co
Publication of DE60010322D1 publication Critical patent/DE60010322D1/de
Application granted granted Critical
Publication of DE60010322T2 publication Critical patent/DE60010322T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/04Slit arrangements slit adjustment
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0262Constructional arrangements for removing stray light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/18Generating the spectrum; Monochromators using diffraction elements, e.g. grating

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Lenses (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
DE60010322T 1999-12-01 2000-11-13 Konzentrisches spektrometer mit verringerung interner spiegelreflexionen Expired - Lifetime DE60010322T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US16749199P 1999-12-01 1999-12-01
US167491P 1999-12-01
PCT/US2000/031165 WO2001040746A1 (en) 1999-12-01 2000-11-13 Concentric spectrometer with mitigation of internal specular reflections

Publications (2)

Publication Number Publication Date
DE60010322D1 DE60010322D1 (de) 2004-06-03
DE60010322T2 true DE60010322T2 (de) 2005-05-04

Family

ID=22607572

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60010322T Expired - Lifetime DE60010322T2 (de) 1999-12-01 2000-11-13 Konzentrisches spektrometer mit verringerung interner spiegelreflexionen

Country Status (6)

Country Link
US (1) US6538736B1 (enExample)
EP (1) EP1236025B1 (enExample)
JP (1) JP4611591B2 (enExample)
CA (1) CA2389367C (enExample)
DE (1) DE60010322T2 (enExample)
WO (1) WO2001040746A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011078755A1 (de) * 2011-07-06 2013-01-10 Siemens Aktiengesellschaft Vorrichtung und Verfahren zur Reduzierung von Streustrahlung bei Spektrometern mittels Abdeckung
DE102011078756A1 (de) * 2011-07-06 2013-01-10 Siemens Aktiengesellschaft Vorrichtung und Verfahren zur Reduzierung von Streustrahlung bei Spektrometern mittels Innenwänden

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6538736B1 (en) 1999-12-01 2003-03-25 Hach Company Concentric spectrometer with mitigation of internal specular reflections
EP1784622A4 (en) * 2004-08-19 2009-06-03 Headwall Photonics Inc Multi-channel, multi-spectrum imaging spectrometer
KR20100017083A (ko) 2007-06-08 2010-02-16 하마마츠 포토닉스 가부시키가이샤 분광 모듈
WO2008149940A1 (ja) * 2007-06-08 2008-12-11 Hamamatsu Photonics K.K. 分光モジュール
US7609381B2 (en) * 2008-03-20 2009-10-27 The Aerospace Corporation Compact, high-throughput spectrometer apparatus for hyperspectral remote sensing
JP5415060B2 (ja) 2008-05-15 2014-02-12 浜松ホトニクス株式会社 分光モジュール
JP5205243B2 (ja) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光器
JP5207938B2 (ja) 2008-05-15 2013-06-12 浜松ホトニクス株式会社 分光モジュール及び分光モジュールの製造方法
JP5512961B2 (ja) * 2008-05-15 2014-06-04 浜松ホトニクス株式会社 分光モジュール及びその製造方法
JP2009300418A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュール
JP2009300417A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュールの製造方法及び分光モジュール
JP5205241B2 (ja) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光モジュール
JP5205242B2 (ja) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光器の製造方法
JP5205239B2 (ja) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光器
JP5205238B2 (ja) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光モジュール
JP2009300422A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュール
JP5205240B2 (ja) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光モジュールの製造方法及び分光モジュール
JP5666459B2 (ja) * 2008-10-20 2015-02-12 ニンボ ユアンル エレクトロ−オプティクス,カンパニー リミテッド 収差補正凹面回折格子と透過型収差補正手段とを備える分光計
FR2938059B1 (fr) * 2008-11-03 2011-03-11 Horiba Jobin Yvon Sas Spectrometre imageur de type dyson de qualite image amelioree et a faible distorsion.
JP2010261767A (ja) * 2009-05-01 2010-11-18 Canon Inc 分光装置及びそれを有する画像形成装置
FI20106141A0 (fi) * 2010-11-01 2010-11-01 Specim Spectral Imaging Oy Ltd Kuvantava spektrometri
CN102538962B (zh) * 2012-01-19 2015-11-18 杭州远方光电信息股份有限公司 一种低杂散光多色仪
WO2014159727A1 (en) * 2013-03-14 2014-10-02 Drs Rsta, Inc. Method and system for controlling stray light reflections in an optical system
EP3879325A1 (en) 2020-03-13 2021-09-15 Optos PLC Optical component mount
US12152931B2 (en) 2022-05-26 2024-11-26 Eagle Technology, Llc Low noise optothermally stable metering structure
CN119256213A (zh) * 2022-05-27 2025-01-03 浜松光子学株式会社 分光测定装置
US12436027B2 (en) 2022-10-10 2025-10-07 Eagle Technology, Llc Modular stray light mitigation

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1201299A (en) * 1982-11-29 1986-03-04 Albert Brunsting Optical readhead
US4798446A (en) * 1987-09-14 1989-01-17 The United States Of America As Represented By The United States Department Of Energy Aplanatic and quasi-aplanatic diffraction gratings
GB8821029D0 (en) * 1988-09-07 1988-10-05 Sira Ltd Imaging spectrometer
US5123740A (en) * 1991-01-15 1992-06-23 Beckman Instruments, Inc. Stray light trap in a monochrometer
US5995221A (en) * 1997-02-28 1999-11-30 Instruments S.A., Inc. Modified concentric spectrograph
US6538736B1 (en) 1999-12-01 2003-03-25 Hach Company Concentric spectrometer with mitigation of internal specular reflections

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011078755A1 (de) * 2011-07-06 2013-01-10 Siemens Aktiengesellschaft Vorrichtung und Verfahren zur Reduzierung von Streustrahlung bei Spektrometern mittels Abdeckung
DE102011078756A1 (de) * 2011-07-06 2013-01-10 Siemens Aktiengesellschaft Vorrichtung und Verfahren zur Reduzierung von Streustrahlung bei Spektrometern mittels Innenwänden
DE102011078755B4 (de) * 2011-07-06 2014-03-13 Siemens Aktiengesellschaft Vorrichtung und Verfahren zur Reduzierung von Streustrahlung bei Spektrometern mittels Abdeckung

Also Published As

Publication number Publication date
DE60010322D1 (de) 2004-06-03
JP2003515733A (ja) 2003-05-07
EP1236025A1 (en) 2002-09-04
JP4611591B2 (ja) 2011-01-12
WO2001040746A1 (en) 2001-06-07
CA2389367A1 (en) 2001-06-07
US6538736B1 (en) 2003-03-25
CA2389367C (en) 2010-08-24
EP1236025B1 (en) 2004-04-28

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