DE60001353T2 - Polarisationsdispersionsmessverfahren für optische Geräte und Vorrichtung dazu - Google Patents

Polarisationsdispersionsmessverfahren für optische Geräte und Vorrichtung dazu

Info

Publication number
DE60001353T2
DE60001353T2 DE60001353T DE60001353T DE60001353T2 DE 60001353 T2 DE60001353 T2 DE 60001353T2 DE 60001353 T DE60001353 T DE 60001353T DE 60001353 T DE60001353 T DE 60001353T DE 60001353 T2 DE60001353 T2 DE 60001353T2
Authority
DE
Germany
Prior art keywords
measurement method
optical devices
apparatus therefor
polarization dispersion
dispersion measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60001353T
Other languages
English (en)
Other versions
DE60001353D1 (de
Inventor
Harald Rosenfeldt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE60001353D1 publication Critical patent/DE60001353D1/de
Application granted granted Critical
Publication of DE60001353T2 publication Critical patent/DE60001353T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/331—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by using interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G01J4/04—Polarimeters using electric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/336—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring polarization mode dispersion [PMD]

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
DE60001353T 2000-11-17 2000-11-17 Polarisationsdispersionsmessverfahren für optische Geräte und Vorrichtung dazu Expired - Fee Related DE60001353T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP00125089A EP1113250B1 (de) 2000-11-17 2000-11-17 Polarisationsdispersionsmessverfahren für optische Geräte und Vorrichtung dazu

Publications (2)

Publication Number Publication Date
DE60001353D1 DE60001353D1 (de) 2003-03-13
DE60001353T2 true DE60001353T2 (de) 2003-06-26

Family

ID=8170406

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60001353T Expired - Fee Related DE60001353T2 (de) 2000-11-17 2000-11-17 Polarisationsdispersionsmessverfahren für optische Geräte und Vorrichtung dazu

Country Status (3)

Country Link
US (1) US6606158B2 (de)
EP (1) EP1113250B1 (de)
DE (1) DE60001353T2 (de)

Families Citing this family (47)

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AUPQ641500A0 (en) * 2000-03-23 2000-04-15 Defence Science And Technology Organisation Method and apparatus for estimating chromatic dispersion in fibre bragg gratings
US6856400B1 (en) * 2000-12-14 2005-02-15 Luna Technologies Apparatus and method for the complete characterization of optical devices including loss, birefringence and dispersion effects
DE60100064T2 (de) * 2001-06-07 2003-04-17 Agilent Technologies Inc Bestimmung der Eigenschaften eines optischen Gerätes
EP1202038A1 (de) * 2001-07-27 2002-05-02 Agilent Technologies, Inc. (a Delaware corporation) Bestimmung optischer Eigenschaften eines zu testenden Geräts bezüglich Transmission und Reflexion
EP1202039A1 (de) * 2001-07-27 2002-05-02 Agilent Technologies, Inc. (a Delaware corporation) Kalibrierung und/oder Verifizierung eines Messaufbaus
US6914681B2 (en) * 2001-08-22 2005-07-05 Agilent Technologies, Inc. Interferometric optical component analyzer based on orthogonal filters
US6882428B2 (en) * 2001-08-28 2005-04-19 Agilent Technologies, Inc. Optical analyzer and method for reducing relative intensity noise in interferometric optical measurements using a continuously tunable laser
US6961123B1 (en) * 2001-09-28 2005-11-01 The Texas A&M University System Method and apparatus for obtaining information from polarization-sensitive optical coherence tomography
US6856398B2 (en) * 2001-10-24 2005-02-15 Exfo Electro-Optical Engineering Inc. Method of and apparatus for making wavelength-resolved polarimetric measurements
US6900895B2 (en) * 2001-12-06 2005-05-31 Agilent Technologies, Inc. Phase noise compensation in an interferometric system
KR20040066888A (ko) * 2001-12-10 2004-07-27 이 아이 듀폰 디 네모아 앤드 캄파니 파장 분할 다중 전송 광학 성능 모니터
US6807321B2 (en) * 2002-03-11 2004-10-19 Lucent Technologies Inc. Apparatus and method for measurement and adaptive control of polarization mode dispersion in optical fiber transmission systems
US6943891B2 (en) 2002-03-15 2005-09-13 Agilent Technologies, Inc. Determining optical characteristics of optical devices under test
US7009691B2 (en) * 2002-05-29 2006-03-07 Agilent Technologies, Inc. System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter
US7253906B2 (en) 2002-06-24 2007-08-07 Jds Uniphase Inc. Polarization state frequency multiplexing
US20050117159A1 (en) * 2002-06-29 2005-06-02 Harald Rosenfeldt Polarization diversity detection using a polarization multiplexed local oscillator
US20060215169A1 (en) * 2002-07-11 2006-09-28 Hansjoerg Haisch Delaying interferometer
US6813028B2 (en) * 2002-07-25 2004-11-02 Agilent Technologies, Inc. Calibration methodology and system for optical network analyzer
US6704100B2 (en) * 2002-08-08 2004-03-09 Fitel Usa Corp. Systems and methods for accurately measuring low values of polarization mode dispersion in an optical fiber using localized external perturbation induced low mode coupling
EP1329702B1 (de) * 2002-08-22 2005-03-23 Agilent Technologies Inc. a Delaware Corporation Mittelwertbildung durch Polarisationseffekte
AU2002340903A1 (en) * 2002-09-13 2004-04-30 Agilent Technologies Inc. Coded polarization-dependent analyzing
EP1365224B1 (de) * 2002-10-11 2009-03-04 Agilent Technologies, Inc. Bestimmung der Modenspektren für die Hauptzustände der Polarisation
EP1420238B1 (de) * 2002-11-15 2008-02-13 Agilent Technologies, Inc. Bestimmung einer optischen Eigenschaft unter Benutzung von überlagerten und verzögerten Signalen
DE60317107T2 (de) * 2003-02-06 2008-08-14 Exfo Electro-Optical Engineering Inc., Vanier Verfahren und apparat zur messung der polarisationsmodendispersion
DE50306180D1 (de) 2003-02-21 2007-02-15 Thorlabs Inc Vorrichtung und Verfahren zur Bestimmung der chromatischen Dispersion von optischen Komponenten
US6888625B2 (en) * 2003-04-16 2005-05-03 Tektronix, Inc. Single sweep measurement of multiple optical characteristics
JP3966221B2 (ja) * 2003-05-01 2007-08-29 セイコーエプソン株式会社 液晶表示装置、及び電子機器
US6977720B2 (en) 2003-08-05 2005-12-20 Agilent Technologies, Inc. Characterization of active and passive optical properties of an optical device
JP2007503578A (ja) * 2003-08-27 2007-02-22 ザ ユニバーシティー オブ クイーンズランド 位相偏移の精密測定のための方法と装置
US7405815B1 (en) * 2003-11-04 2008-07-29 The Boeing Company Systems and methods for characterizing laser beam quality
US7426021B2 (en) * 2004-11-29 2008-09-16 Expo Electro- Optical Engineering Inc. Interferometric optical analyzer and method for measuring the linear response of an optical component
JP2006214856A (ja) * 2005-02-03 2006-08-17 Canon Inc 測定装置及び方法
DE102006025122A1 (de) * 2005-05-31 2006-12-07 Yokogawa Electric Corporation, Musashino Vorrichtung zur Messung einer optischen Charakteristik
EP1935069A4 (de) * 2005-10-13 2011-03-09 Sensilaser Technologies Inc Verfahren und einrichtung zum verringern des laserphasenrauschens
JP4753137B2 (ja) * 2005-11-29 2011-08-24 独立行政法人情報通信研究機構 光強度測定器のキャリブレーション方法及び装置
WO2007066465A1 (ja) * 2005-12-07 2007-06-14 Kabushiki Kaisha Topcon 光画像計測装置
US7589840B2 (en) * 2006-01-10 2009-09-15 Sunrise Telecom Incorporated Broad- and inter-band multi-wavelength-reference method and apparatus for wavelength measurement or monitoring systems
DE102006014766A1 (de) * 2006-03-30 2007-10-04 Robert Bosch Gmbh Interferometrische Messvorrichtung
TWI444680B (zh) * 2011-01-19 2014-07-11 Nat Applied Res Laboratories 自由空間等效單模光纖應用於光纖感測器
ES2441915B1 (es) 2012-05-22 2015-02-04 Aragon Photonics Labs S.L.U. Sistema y método de medida de un estado de polarización resuelto en longitud de onda de una señal óptica
US9841447B2 (en) * 2014-11-21 2017-12-12 Tektronix, Inc. Apparatus enabling use of a reference diode to compare against a device under test in relative amplitude and phase measurements
US9768864B2 (en) 2014-11-21 2017-09-19 Tektronix, Inc. Test and measurement device for measuring integrated coherent optical receiver
US20180299336A1 (en) * 2015-07-11 2018-10-18 Fsp Llc Pressure sensor utilizing bragg grating with single mode fiber
FR3054663B1 (fr) 2016-07-28 2018-09-07 Stmicroelectronics (Crolles 2) Sas Procede de caracterisation de dispositifs photoniques, et dispositif associe.
DE102017011730B4 (de) * 2017-12-18 2020-06-18 Hottinger Baldwin Messtechnik Gmbh Interrogator für zwei Faser-Bragg-Gitter Messstellen
CN111693146B (zh) * 2020-05-30 2021-08-10 华南理工大学 一种矢量超快光信号偏振态实时测量方法与系统
CN113375913A (zh) * 2021-08-12 2021-09-10 武汉昊衡科技有限公司 高精度光矢量分析装置及方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4750833A (en) * 1985-12-03 1988-06-14 Princeton Applied Research Corp. Fiber optic dispersion method and apparatus
FR2745082B1 (fr) * 1996-02-16 1998-04-30 Univ Geneve Procede et dispositif de mesure de la dispersion de polarisation d'une fibre optique
JP3131144B2 (ja) * 1996-03-29 2001-01-31 株式会社アドバンテスト 偏波モード分散の測定装置

Also Published As

Publication number Publication date
US20020113972A1 (en) 2002-08-22
DE60001353D1 (de) 2003-03-13
US6606158B2 (en) 2003-08-12
EP1113250A1 (de) 2001-07-04
EP1113250B1 (de) 2003-02-05

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee