DE59703140D1 - Röntgenmikroskop mit zonenplatten - Google Patents

Röntgenmikroskop mit zonenplatten

Info

Publication number
DE59703140D1
DE59703140D1 DE59703140T DE59703140T DE59703140D1 DE 59703140 D1 DE59703140 D1 DE 59703140D1 DE 59703140 T DE59703140 T DE 59703140T DE 59703140 T DE59703140 T DE 59703140T DE 59703140 D1 DE59703140 D1 DE 59703140D1
Authority
DE
Germany
Prior art keywords
zone plates
ray microscope
microscope
ray
zone
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE59703140T
Other languages
English (en)
Inventor
Gerd Schneider
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Application granted granted Critical
Publication of DE59703140D1 publication Critical patent/DE59703140D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K7/00—Gamma- or X-ray microscopes
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE59703140T 1996-01-12 1997-01-13 Röntgenmikroskop mit zonenplatten Expired - Fee Related DE59703140D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19600895 1996-01-12
PCT/DE1997/000045 WO1997025723A2 (de) 1996-01-12 1997-01-13 Röntgenmikroskop mit zonenplatten

Publications (1)

Publication Number Publication Date
DE59703140D1 true DE59703140D1 (de) 2001-04-19

Family

ID=7782588

Family Applications (2)

Application Number Title Priority Date Filing Date
DE59703140T Expired - Fee Related DE59703140D1 (de) 1996-01-12 1997-01-13 Röntgenmikroskop mit zonenplatten
DE19700880A Withdrawn DE19700880A1 (de) 1996-01-12 1997-01-13 Röntgenmikroskop mit Zonenplatten

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE19700880A Withdrawn DE19700880A1 (de) 1996-01-12 1997-01-13 Röntgenmikroskop mit Zonenplatten

Country Status (4)

Country Link
US (1) US6167112A (de)
EP (1) EP0873566B1 (de)
DE (2) DE59703140D1 (de)
WO (1) WO1997025723A2 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3741411B2 (ja) * 1999-10-01 2006-02-01 株式会社リガク Ｘ線集光装置及びｘ線装置
US20050041779A1 (en) * 1999-11-24 2005-02-24 Btg International Limited X-ray zoom lens
US6762880B2 (en) * 2001-02-21 2004-07-13 Ibsen Photonics A/S Grating structures and methods of making the grating structures
US7365909B2 (en) * 2002-10-17 2008-04-29 Xradia, Inc. Fabrication methods for micro compounds optics
US7072442B1 (en) * 2002-11-20 2006-07-04 Kla-Tencor Technologies Corporation X-ray metrology using a transmissive x-ray optical element
US7119953B2 (en) * 2002-12-27 2006-10-10 Xradia, Inc. Phase contrast microscope for short wavelength radiation and imaging method
US7170969B1 (en) * 2003-11-07 2007-01-30 Xradia, Inc. X-ray microscope capillary condenser system
WO2005094318A2 (en) * 2004-03-29 2005-10-13 Jmar Research, Inc. Morphology and spectroscopy of nanoscale regions using x-rays generated by laser produced plasma
US7302043B2 (en) * 2004-07-27 2007-11-27 Gatan, Inc. Rotating shutter for laser-produced plasma debris mitigation
US7452820B2 (en) * 2004-08-05 2008-11-18 Gatan, Inc. Radiation-resistant zone plates and method of manufacturing thereof
US7466796B2 (en) * 2004-08-05 2008-12-16 Gatan, Inc. Condenser zone plate illumination for point X-ray sources
US20080240347A1 (en) * 2005-07-22 2008-10-02 Jmar Research, Inc. Method, apparatus, and system for extending depth of field (dof) in a short-wavelength microscope using wavefront encoding
US7331714B2 (en) * 2005-09-29 2008-02-19 Uchicago Argonne, Llc Optomechanical structure for a multifunctional hard x-ray nanoprobe instrument
US7492989B2 (en) 2006-05-23 2009-02-17 Massachusetts Institute Of Technology Hybrid transmission-reflection grating
US8040601B1 (en) * 2007-06-22 2011-10-18 Allview Research Llc Projection screen using a bragg selective holographic element
US8541758B1 (en) * 2011-06-17 2013-09-24 Aqua Treatment Services, Inc. Ultraviolet reactor
US8481966B1 (en) * 2012-02-28 2013-07-09 Tiza Lab, L.L.C. Microplasma ion source for focused ion beam applications
US8674321B2 (en) * 2012-02-28 2014-03-18 Tiza Lab, L.L.C. Microplasma ion source for focused ion beam applications
US9887459B2 (en) * 2013-09-27 2018-02-06 Raytheon Bbn Technologies Corp. Reconfigurable aperture for microwave transmission and detection
US20160086681A1 (en) * 2014-09-24 2016-03-24 Carl Zeiss X-ray Microscopy, Inc. Zone Plate and Method for Fabricating Same Using Conformal Coating
CN108646330B (zh) * 2018-04-25 2020-12-25 深圳大学 一种全透波带片
JP2022069273A (ja) * 2020-10-23 2022-05-11 株式会社リガク 結像型ｘ線顕微鏡

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD129370A1 (de) * 1976-06-25 1978-01-11 Lutz Wolf Anordnung zur pruefung und messung von zu einer ebene symmetrisch gekruemmten flaechen
US4831261A (en) * 1986-06-20 1989-05-16 Digital Scintigraphics, Inc. Compound collimator and tomography camera using same
US5199057A (en) * 1989-08-09 1993-03-30 Nikon Corporation Image formation-type soft X-ray microscopic apparatus
DE4027285A1 (de) * 1990-08-29 1992-03-05 Zeiss Carl Fa Roentgenmikroskop

Also Published As

Publication number Publication date
US6167112A (en) 2000-12-26
EP0873566B1 (de) 2001-03-14
WO1997025723A2 (de) 1997-07-17
DE19700880A1 (de) 1997-07-17
EP0873566A2 (de) 1998-10-28
WO1997025723A3 (de) 1997-10-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee