DE3884490D1 - Einrichtung zum abtasten, analysieren und anzeigen eines elektrischen signals. - Google Patents

Einrichtung zum abtasten, analysieren und anzeigen eines elektrischen signals.

Info

Publication number
DE3884490D1
DE3884490D1 DE88111265T DE3884490T DE3884490D1 DE 3884490 D1 DE3884490 D1 DE 3884490D1 DE 88111265 T DE88111265 T DE 88111265T DE 3884490 T DE3884490 T DE 3884490T DE 3884490 D1 DE3884490 D1 DE 3884490D1
Authority
DE
Germany
Prior art keywords
scaning
analyzing
displaying
electrical signal
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE88111265T
Other languages
English (en)
Other versions
DE3884490T2 (de
Inventor
Yoshihiro Takiguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP17550987A external-priority patent/JPS6418066A/ja
Priority claimed from JP17551087A external-priority patent/JPS6418067A/ja
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of DE3884490D1 publication Critical patent/DE3884490D1/de
Application granted granted Critical
Publication of DE3884490T2 publication Critical patent/DE3884490T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/347—Circuits for representing a single waveform by sampling, e.g. for very high frequencies using electro-optic elements
DE88111265T 1987-07-14 1988-07-13 Einrichtung zum Abtasten, Analysieren und Anzeigen eines elektrischen Signals. Expired - Fee Related DE3884490T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP17550987A JPS6418066A (en) 1987-07-14 1987-07-14 Sampling apparatus by photoelectron
JP17551087A JPS6418067A (en) 1987-07-14 1987-07-14 Analyzing and displaying apparatus of electric signal

Publications (2)

Publication Number Publication Date
DE3884490D1 true DE3884490D1 (de) 1993-11-04
DE3884490T2 DE3884490T2 (de) 1994-01-27

Family

ID=26496757

Family Applications (1)

Application Number Title Priority Date Filing Date
DE88111265T Expired - Fee Related DE3884490T2 (de) 1987-07-14 1988-07-13 Einrichtung zum Abtasten, Analysieren und Anzeigen eines elektrischen Signals.

Country Status (3)

Country Link
US (1) US4891581A (de)
EP (1) EP0299465B1 (de)
DE (1) DE3884490T2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0769351B2 (ja) * 1988-05-30 1995-07-26 浜松ホトニクス株式会社 電気信号観測装置
NL8801671A (nl) * 1988-07-01 1990-02-01 Optische Ind De Oude Delft Nv Werkwijze voor het bedrijven van een van een kanalenplaat voorziene beeldversterkerbuis en beeldversterkerbuisinrichting voorzien van een kanalenplaat.
JP3071809B2 (ja) * 1990-09-07 2000-07-31 浜松ホトニクス株式会社 ストリーク管
JP2875370B2 (ja) * 1990-09-14 1999-03-31 浜松ホトニクス株式会社 荷電粒子測定装置および光強度波形測定装置
US5278403A (en) * 1991-04-29 1994-01-11 Alfano Robert R Femtosecond streak camera
US5412330A (en) * 1993-06-16 1995-05-02 Tektronix, Inc. Optical module for an optically based measurement system
EP0902896A4 (de) * 1996-05-31 1999-12-08 Rensselaer Polytech Inst Elektro- und magnetooptische messvorrichtung sowie verfahren zur charakterisierung elektromagnetischer freiraumstrahlung
US5952818A (en) * 1996-05-31 1999-09-14 Rensselaer Polytechnic Institute Electro-optical sensing apparatus and method for characterizing free-space electromagnetic radiation
US6414473B1 (en) 1996-05-31 2002-07-02 Rensselaer Polytechnic Institute Electro-optic/magneto-optic measurement of electromagnetic radiation using chirped optical pulse
JPH10142049A (ja) * 1996-11-13 1998-05-29 Hamamatsu Photonics Kk ビーム光空間パターン記録装置
GB2372929B (en) * 2000-03-03 2003-03-12 Tera View Ltd Apparatus and method for investigating a sample
DE10353901A1 (de) * 2002-11-25 2004-06-09 Advanced LCD Technologies Development Center Co., Ltd., Yokohama Verfahren und Vorrichtung zur Bildung eines Substrats für Halbleiter oder dergleichen

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4446425A (en) * 1982-02-12 1984-05-01 The University Of Rochester Measurement of electrical signals with picosecond resolution
EP0197196A1 (de) * 1985-03-08 1986-10-15 The University Of Rochester Elektro-elektronenoptisches Oszilloskop zur Zeitauflösung elektrischer Wellenzüge im Picosekundenbereich
JPS62188915A (ja) * 1986-02-14 1987-08-18 Hamamatsu Photonics Kk ２重掃引ストリ−クカメラ装置

Also Published As

Publication number Publication date
US4891581A (en) 1990-01-02
EP0299465A3 (en) 1990-07-11
DE3884490T2 (de) 1994-01-27
EP0299465A2 (de) 1989-01-18
EP0299465B1 (de) 1993-09-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee