DE3866276D1 - X-strahlen-analysevorrichtung mit sagittal gebogenem analysatorkristall. - Google Patents

X-strahlen-analysevorrichtung mit sagittal gebogenem analysatorkristall.

Info

Publication number
DE3866276D1
DE3866276D1 DE8888200309T DE3866276T DE3866276D1 DE 3866276 D1 DE3866276 D1 DE 3866276D1 DE 8888200309 T DE8888200309 T DE 8888200309T DE 3866276 T DE3866276 T DE 3866276T DE 3866276 D1 DE3866276 D1 DE 3866276D1
Authority
DE
Germany
Prior art keywords
analyst
sagittal
bent
crystal
analysis device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8888200309T
Other languages
English (en)
Inventor
Egeraat Walterus Alphonsus Van
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of DE3866276D1 publication Critical patent/DE3866276D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Molecular Biology (AREA)
  • Dispersion Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE8888200309T 1987-02-27 1988-02-22 X-strahlen-analysevorrichtung mit sagittal gebogenem analysatorkristall. Expired - Lifetime DE3866276D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8700488A NL8700488A (nl) 1987-02-27 1987-02-27 Roentgen analyse apparaat met saggitaal gebogen analyse kristal.

Publications (1)

Publication Number Publication Date
DE3866276D1 true DE3866276D1 (de) 1992-01-02

Family

ID=19849636

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888200309T Expired - Lifetime DE3866276D1 (de) 1987-02-27 1988-02-22 X-strahlen-analysevorrichtung mit sagittal gebogenem analysatorkristall.

Country Status (5)

Country Link
US (1) US5008910A (de)
EP (1) EP0290058B1 (de)
JP (1) JPS63229351A (de)
DE (1) DE3866276D1 (de)
NL (1) NL8700488A (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8926998D0 (en) * 1989-11-29 1990-01-17 Fisons Plc Analysis crystal
US5280176A (en) * 1992-11-06 1994-01-18 The United States Of America As Represented By The Secretary Of Commerce X-ray photoelectron emission spectrometry system
US5381458A (en) * 1993-02-23 1995-01-10 The United States Of America As Represented By The Secretary Of Commerce Method and apparatus for precisely measuring accelerating voltages applied to x-ray sources
DE9317031U1 (de) * 1993-11-08 1994-03-31 Installation Européenne de Rayonnement Synchrotron (European Synchrotron Radiation Facility) E.S.R.F., Grenoble Doppelkristall-Monochromator
DE4407278A1 (de) * 1994-03-04 1995-09-07 Siemens Ag Röntgen-Analysegerät
US6269144B1 (en) 1998-03-04 2001-07-31 William P. Dube Method and apparatus for diffraction measurement using a scanning x-ray source
US6185276B1 (en) 1999-02-02 2001-02-06 Thermal Corp. Collimated beam x-ray tube
FI125488B (en) * 2014-06-09 2015-10-30 Fenno Aurum Oy Wavelength dispersion spectrometer, X-ray fluorescence apparatus and method
DE102017223228B3 (de) 2017-12-19 2018-12-27 Bruker Axs Gmbh Aufbau zur ortsaufgelösten Messung mit einem wellenlängendispersiven Röntgenspektrometer

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL72976C (de) * 1948-03-27
US2853617A (en) * 1955-01-27 1958-09-23 California Inst Res Found Focusing crystal for x-rays and method of manufacture
FR1180719A (fr) * 1957-07-08 1959-06-09 Radiologie Cie Gle Presse de cintrage à monocristal courbe pour monochromateur à rayons chi
SU614367A1 (ru) * 1975-09-26 1978-07-05 Предприятие П/Я М-5659 Флуоресцентный рентгеновский спектрометр
JPS55112553A (en) * 1979-02-22 1980-08-30 Rigaku Denki Kogyo Kk Xxray spectroscope
US4261771A (en) * 1979-10-31 1981-04-14 Bell Telephone Laboratories, Incorporated Method of fabricating periodic monolayer semiconductor structures by molecular beam epitaxy
US4467199A (en) * 1981-06-03 1984-08-21 Seiko Instruments & Electronics Ltd. Macroanalyzer system
US4461018A (en) * 1982-06-07 1984-07-17 The United States Of America As Represented By The United States Department Of Energy Diffraction crystal for sagittally focusing x-rays
US4599741A (en) * 1983-11-04 1986-07-08 USC--Dept. of Materials Science System for local X-ray excitation by monochromatic X-rays
US4882780A (en) * 1983-11-04 1989-11-21 University Of Southern California Scanning monochromator crystal and related method
JPS6166156A (ja) * 1984-09-08 1986-04-04 Rigaku Denki Kogyo Kk 超軟ｘ線分光器
NL8501181A (nl) * 1985-04-24 1986-11-17 Philips Nv Kristal voor een roentgenanalyse apparaat.

Also Published As

Publication number Publication date
NL8700488A (nl) 1988-09-16
EP0290058A1 (de) 1988-11-09
EP0290058B1 (de) 1991-11-21
US5008910A (en) 1991-04-16
JPS63229351A (ja) 1988-09-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: PHILIPS ELECTRONICS N.V., EINDHOVEN, NL

8339 Ceased/non-payment of the annual fee