GB8926998D0 - Analysis crystal - Google Patents

Analysis crystal

Info

Publication number
GB8926998D0
GB8926998D0 GB898926998A GB8926998A GB8926998D0 GB 8926998 D0 GB8926998 D0 GB 8926998D0 GB 898926998 A GB898926998 A GB 898926998A GB 8926998 A GB8926998 A GB 8926998A GB 8926998 D0 GB8926998 D0 GB 8926998D0
Authority
GB
United Kingdom
Prior art keywords
analysis crystal
crystal
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
GB898926998A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fisons Ltd
Original Assignee
Fisons Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fisons Ltd filed Critical Fisons Ltd
Priority to GB898926998A priority Critical patent/GB8926998D0/en
Publication of GB8926998D0 publication Critical patent/GB8926998D0/en
Priority to EP90917662A priority patent/EP0502065A1/en
Priority to JP3500230A priority patent/JPH05501610A/en
Priority to PCT/GB1990/001840 priority patent/WO1991008471A1/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Dispersion Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB898926998A 1989-11-29 1989-11-29 Analysis crystal Pending GB8926998D0 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
GB898926998A GB8926998D0 (en) 1989-11-29 1989-11-29 Analysis crystal
EP90917662A EP0502065A1 (en) 1989-11-29 1990-11-27 X-ray spectrometer
JP3500230A JPH05501610A (en) 1989-11-29 1990-11-27 X-ray spectrometer
PCT/GB1990/001840 WO1991008471A1 (en) 1989-11-29 1990-11-27 X-ray spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB898926998A GB8926998D0 (en) 1989-11-29 1989-11-29 Analysis crystal

Publications (1)

Publication Number Publication Date
GB8926998D0 true GB8926998D0 (en) 1990-01-17

Family

ID=10667128

Family Applications (1)

Application Number Title Priority Date Filing Date
GB898926998A Pending GB8926998D0 (en) 1989-11-29 1989-11-29 Analysis crystal

Country Status (4)

Country Link
EP (1) EP0502065A1 (en)
JP (1) JPH05501610A (en)
GB (1) GB8926998D0 (en)
WO (1) WO1991008471A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2266040B (en) * 1992-04-09 1996-03-13 Rigaku Ind Corp X-ray analysis apparatus
JP3950156B1 (en) * 2006-04-11 2007-07-25 理学電機工業株式会社 X-ray fluorescence analyzer
DE102016210304B8 (en) * 2016-06-10 2017-08-17 Bruker Axs Gmbh Measuring chamber for a compact goniometer in an X-ray spectrometer

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL301825A (en) * 1963-12-13 1965-10-11
US4461018A (en) * 1982-06-07 1984-07-17 The United States Of America As Represented By The United States Department Of Energy Diffraction crystal for sagittally focusing x-rays
NL8204584A (en) * 1982-11-25 1984-06-18 Philips Nv ROENTGEN ANALYSIS DEVICE WITH A FOUR-CRYSTAL MONOCHROMATOR.
NL8700488A (en) * 1987-02-27 1988-09-16 Philips Nv ROENTGEN ANALYSIS DEVICE WITH SAGGITALLY CURVED ANALYSIS CRYSTAL.
NL8801019A (en) * 1988-04-20 1989-11-16 Philips Nv ROENTGEN SPECTROMETER WITH DOUBLE-CURVED CRYSTAL.

Also Published As

Publication number Publication date
EP0502065A1 (en) 1992-09-09
JPH05501610A (en) 1993-03-25
WO1991008471A1 (en) 1991-06-13

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