DE3853389D1 - Vorrichtung zur Prüfüng einer Schaltung. - Google Patents
Vorrichtung zur Prüfüng einer Schaltung.Info
- Publication number
- DE3853389D1 DE3853389D1 DE3853389T DE3853389T DE3853389D1 DE 3853389 D1 DE3853389 D1 DE 3853389D1 DE 3853389 T DE3853389 T DE 3853389T DE 3853389 T DE3853389 T DE 3853389T DE 3853389 D1 DE3853389 D1 DE 3853389D1
- Authority
- DE
- Germany
- Prior art keywords
- testing device
- circuit testing
- circuit
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8710870A FR2621699B1 (fr) | 1987-07-31 | 1987-07-31 | Perfectionnements aux testeurs de circuits |
FR888808230A FR2633055B2 (fr) | 1987-07-31 | 1988-06-20 | Perfectionnements aux testeurs de circuits |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3853389D1 true DE3853389D1 (de) | 1995-04-27 |
DE3853389T2 DE3853389T2 (de) | 1995-11-16 |
Family
ID=26226139
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE3853389T Expired - Fee Related DE3853389T2 (de) | 1987-07-31 | 1988-07-22 | Vorrichtung zur Prüfüng einer Schaltung. |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0306359B1 (de) |
KR (1) | KR890002671A (de) |
DE (1) | DE3853389T2 (de) |
FR (1) | FR2633055B2 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE69010053T2 (de) * | 1989-04-12 | 1994-10-13 | Hamamatsu Photonics Kk | Methode und Vorrichtung zum Nachweis einer Spannung. |
US4910454A (en) * | 1989-05-23 | 1990-03-20 | The University Of Rochester | System for electrical signal sampling with ultrashort optical pulses |
DE69232905T2 (de) * | 1991-08-05 | 2003-08-21 | Koninkl Philips Electronics Nv | Elektrooptische Messanordnung zum Messen eines elektrischen Signals in einem elektronischen Bauteil |
JPH0798329A (ja) * | 1993-09-28 | 1995-04-11 | Hamamatsu Photonics Kk | E−oプローブ |
JP3787185B2 (ja) * | 1995-04-28 | 2006-06-21 | アヴェンティス・リサーチ・ウント・テクノロジーズ・ゲーエムベーハー・ウント・コー・カーゲー | 配線基板の配線の欠陥を検出する装置 |
DE19654504C2 (de) * | 1996-12-18 | 2003-08-21 | X Fab Semiconductor Foundries | Verfahren und Vorrichtung zum Prüfen integrierter Schaltkreise |
DE19707325B8 (de) * | 1997-02-12 | 2006-06-01 | X-Fab Semiconductor Foundries Ag | Verfahren zum Prüfen integrierter Schaltkreise |
US6252222B1 (en) * | 2000-01-13 | 2001-06-26 | Schlumberger Technologies, Inc. | Differential pulsed laser beam probing of integrated circuits |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4242635A (en) * | 1979-01-26 | 1980-12-30 | The United States Of America As Represented By The Secretary Of The Air Force | Apparatus and method for integrated circuit test analysis |
FR2458827A1 (fr) * | 1979-06-13 | 1981-01-02 | Thomson Csf | Dispositif electrooptique a birefringence electrique comportant un polymere polarise |
US4428873A (en) * | 1980-08-30 | 1984-01-31 | Kureha Kagaku Kogyo Kabushiki Kaisha | Electrooptical element |
US4446425A (en) * | 1982-02-12 | 1984-05-01 | The University Of Rochester | Measurement of electrical signals with picosecond resolution |
US4618819A (en) * | 1984-03-27 | 1986-10-21 | The University Of Rochester | Measurement of electrical signals with subpicosecond resolution |
DE3889986T2 (de) * | 1987-07-13 | 1994-09-15 | Hamamatsu Photonics Kk | Anordnung eines Spannungsdetektors. |
-
1988
- 1988-06-20 FR FR888808230A patent/FR2633055B2/fr not_active Expired - Lifetime
- 1988-07-22 EP EP88401901A patent/EP0306359B1/de not_active Expired - Lifetime
- 1988-07-22 DE DE3853389T patent/DE3853389T2/de not_active Expired - Fee Related
- 1988-07-30 KR KR1019880009662A patent/KR890002671A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
EP0306359A3 (en) | 1990-12-19 |
EP0306359B1 (de) | 1995-03-22 |
FR2633055B2 (fr) | 1991-01-04 |
DE3853389T2 (de) | 1995-11-16 |
KR890002671A (ko) | 1989-04-11 |
FR2633055A2 (fr) | 1989-12-22 |
EP0306359A2 (de) | 1989-03-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |