DE3852214T2 - Kammer ohne elektromagnetisches Echo mit einer inneren Oberfläche zum Reflektieren der elektromagnetischen Wellen und einem in der Kammer eingesetzten kleinen Ball zum Abschwächen der elektromagnetischen Wellen. - Google Patents

Kammer ohne elektromagnetisches Echo mit einer inneren Oberfläche zum Reflektieren der elektromagnetischen Wellen und einem in der Kammer eingesetzten kleinen Ball zum Abschwächen der elektromagnetischen Wellen.

Info

Publication number
DE3852214T2
DE3852214T2 DE3852214T DE3852214T DE3852214T2 DE 3852214 T2 DE3852214 T2 DE 3852214T2 DE 3852214 T DE3852214 T DE 3852214T DE 3852214 T DE3852214 T DE 3852214T DE 3852214 T2 DE3852214 T2 DE 3852214T2
Authority
DE
Germany
Prior art keywords
chamber
electromagnetic waves
electromagnetic
attenuate
reflect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE3852214T
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English (en)
Other versions
DE3852214D1 (de
Inventor
Masanori Kogo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokin Corp
Original Assignee
Tokin Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokin Corp filed Critical Tokin Corp
Publication of DE3852214D1 publication Critical patent/DE3852214D1/de
Application granted granted Critical
Publication of DE3852214T2 publication Critical patent/DE3852214T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/10Radiation diagrams of antennas
    • G01R29/105Radiation diagrams of antennas using anechoic chambers; Chambers or open field sites used therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/18Screening arrangements against electric or magnetic fields, e.g. against earth's field
DE3852214T 1987-06-03 1988-06-03 Kammer ohne elektromagnetisches Echo mit einer inneren Oberfläche zum Reflektieren der elektromagnetischen Wellen und einem in der Kammer eingesetzten kleinen Ball zum Abschwächen der elektromagnetischen Wellen. Expired - Lifetime DE3852214T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987085710U JPH0217515Y2 (de) 1987-06-03 1987-06-03

Publications (2)

Publication Number Publication Date
DE3852214D1 DE3852214D1 (de) 1995-01-12
DE3852214T2 true DE3852214T2 (de) 1995-05-18

Family

ID=13866384

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3852214T Expired - Lifetime DE3852214T2 (de) 1987-06-03 1988-06-03 Kammer ohne elektromagnetisches Echo mit einer inneren Oberfläche zum Reflektieren der elektromagnetischen Wellen und einem in der Kammer eingesetzten kleinen Ball zum Abschwächen der elektromagnetischen Wellen.

Country Status (5)

Country Link
US (1) US4931798A (de)
EP (1) EP0294205B1 (de)
JP (1) JPH0217515Y2 (de)
CA (1) CA1311825C (de)
DE (1) DE3852214T2 (de)

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CA2011740A1 (en) * 1989-04-07 1990-10-07 Glen Connell Microwave heatable materials
FR2648958B1 (fr) * 1989-06-23 1993-07-23 Excem Sa Dispositif d'absorption de champ electromagnetique radiofrequence
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US5910787A (en) * 1998-02-09 1999-06-08 Mcdonnell Douglas Corporation Integrated projector-low radar cross-section (RCS) source support pylon and low RCS measurement system employing same
US5936568A (en) * 1998-02-09 1999-08-10 Mcdonnell Douglas Corporation Low radar cross-section (RCS) support pylon and low RCS measurement system employing same
US6008753A (en) * 1998-02-09 1999-12-28 Mcdonnell Douglas Corporation Low radar cross-section (RCS) measurement chamber and associated measurement system
US6294896B1 (en) 1998-09-11 2001-09-25 Keith S. Champlin Method and apparatus for measuring complex self-immitance of a general electrical element
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US7688246B2 (en) * 2005-05-10 2010-03-30 Fuji Xerox Co., Ltd. Radio wave absorber, electromagnetic field measurement system and radiated immunity system
SE528829C2 (sv) * 2005-06-17 2007-02-27 Amc Centurion Ab Antenneffektivitetmätningsmetod och system därför
EP1955084A1 (de) * 2005-11-30 2008-08-13 Astrium GmbH Hochfrequenzmesshalle zur vermessung von grossen messobjekten
US10674570B2 (en) 2006-02-21 2020-06-02 Goji Limited System and method for applying electromagnetic energy
US8653482B2 (en) 2006-02-21 2014-02-18 Goji Limited RF controlled freezing
WO2007096877A2 (en) 2006-02-21 2007-08-30 Rf Dynamics Ltd. Electromagnetic heating
US7830296B2 (en) * 2007-07-11 2010-11-09 Finisar Corporation Anechoic structures for absorbing electromagnetic interference in a communications module
WO2009041513A1 (ja) * 2007-09-28 2009-04-02 Anritsu Corporation 放射電力測定方法、放射電力測定用結合器及び放射電力測定装置
DE112009001121T5 (de) * 2008-05-09 2011-03-10 Anritsu Corp., Atsugi-shi Verfahren zur Messsung einer abgestrahlten Leistung, Koppler zur Messung einer abgestrahlten Leistung, und Vorrichtung zur Messung einer abgestrahlten Leistung
KR101009630B1 (ko) * 2008-11-04 2011-01-21 한국전자통신연구원 안테나 방사 성능 측정 장치 및 그 설계 방법
US20120097665A1 (en) * 2008-11-10 2012-04-26 Alexander Bilchinsky Device and method for controlling energy
US7940204B1 (en) * 2009-05-28 2011-05-10 Orbit Advanced Technologies, Inc. Absorber assembly for an anechoic chamber
JP5657016B2 (ja) 2009-11-10 2015-01-21 ゴジ リミテッド エネルギーを制御するための装置および方法
US8462039B2 (en) * 2009-12-09 2013-06-11 Electronics And Telecommunications Research Institute Indoor electromagnetic environment implementing structure and a constructing method thereof
CN103039123B (zh) 2010-05-03 2015-09-30 高知有限公司 空间受控能量递送
CN103163339B (zh) * 2011-12-09 2016-12-21 鸿富锦精密工业(深圳)有限公司 电波暗室
CN106160893B (zh) * 2015-04-10 2019-06-14 深圳市通用测试系统有限公司 无线终端的测试系统及用于其的控制方法
CN106161703B (zh) * 2015-04-10 2019-11-22 深圳市通用测试系统有限公司 无线终端的测试系统及用于其的控制方法
CN106161704B (zh) * 2015-04-10 2019-07-12 深圳市通用测试系统有限公司 无线终端的测试系统
CN106291145B (zh) * 2015-05-12 2019-03-01 深圳市通用测试系统有限公司 无线终端的测试系统
CN106936524B (zh) * 2015-12-31 2023-03-31 深圳市通用测试系统有限公司 无线终端的测试系统
CN107543975B (zh) * 2017-07-06 2021-04-23 北京交通大学 非全屏蔽式动车整车电磁辐射发射测试装置
DE102018217173A1 (de) * 2018-10-08 2020-04-09 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Reflektorsystem in einem radarzielsimulator zum testen einer funktionsfähigkeit eines radarsensors und verfahren zum testen einer funktionsfähigkeit eines radarsensors

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US3165742A (en) * 1961-09-19 1965-01-12 Melpar Inc Antenna range simulator
DE1261912B (de) * 1962-03-29 1968-02-29 Siemens Ag Kastenfoermiger abgeschirmter Messraum zur Messung von elektromagnetischen oder akustischen Wellen
CA1100625A (en) * 1977-04-01 1981-05-05 Leland H. Hemming Plane wave lens
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US4521780A (en) * 1981-10-19 1985-06-04 Preikschat F K Target simulation system
JPS6064499A (ja) * 1983-09-19 1985-04-13 三菱電機株式会社 電波無反射室
US4695694A (en) * 1986-02-14 1987-09-22 Fusion Systems Corporation Structure for minimizing microwave leakage
US4809003A (en) * 1988-05-23 1989-02-28 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Almond test body

Also Published As

Publication number Publication date
EP0294205B1 (de) 1994-11-30
JPH0217515Y2 (de) 1990-05-16
CA1311825C (en) 1992-12-22
DE3852214D1 (de) 1995-01-12
US4931798A (en) 1990-06-05
EP0294205A2 (de) 1988-12-07
EP0294205A3 (en) 1989-10-18
JPS63193899U (de) 1988-12-14

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Legal Events

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8327 Change in the person/name/address of the patent owner

Owner name: NEC TOKIN CORP., SENDAI, MIYAGI, JP