DE3786748D1 - Programmierbare logische anordnung. - Google Patents
Programmierbare logische anordnung.Info
- Publication number
- DE3786748D1 DE3786748D1 DE8787307947T DE3786748T DE3786748D1 DE 3786748 D1 DE3786748 D1 DE 3786748D1 DE 8787307947 T DE8787307947 T DE 8787307947T DE 3786748 T DE3786748 T DE 3786748T DE 3786748 D1 DE3786748 D1 DE 3786748D1
- Authority
- DE
- Germany
- Prior art keywords
- logical arrangement
- programmable logical
- programmable
- arrangement
- logical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318516—Test of programmable logic devices [PLDs]
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Logic Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB868626517A GB8626517D0 (en) | 1986-11-06 | 1986-11-06 | Testing programmable logic arrays |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3786748D1 true DE3786748D1 (de) | 1993-09-02 |
DE3786748T2 DE3786748T2 (de) | 1994-03-31 |
Family
ID=10606885
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE87307947T Expired - Fee Related DE3786748T2 (de) | 1986-11-06 | 1987-09-09 | Programmierbare logische Anordnung. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4780627A (de) |
EP (1) | EP0266874B1 (de) |
DE (1) | DE3786748T2 (de) |
GB (1) | GB8626517D0 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63217821A (ja) * | 1987-03-06 | 1988-09-09 | Toshiba Corp | 半導体集積回路 |
US5033048A (en) * | 1988-04-01 | 1991-07-16 | Digital Equipment Corporation | Memory selftest method and apparatus same |
US5017809A (en) * | 1989-10-23 | 1991-05-21 | Advanced Micro Devices, Inc. | Method and apparatus for program verification of a field programmable logic device |
US5073909A (en) * | 1990-07-19 | 1991-12-17 | Motorola Inc. | Method of simulating the state of a linear feedback shift register |
US5228045A (en) * | 1990-08-06 | 1993-07-13 | Ncr Corporation | Test driver for connecting a standard test port integrated circuit chip to a controlling computer |
JP3129761B2 (ja) * | 1991-05-02 | 2001-01-31 | 株式会社東芝 | Plaのテスト容易化回路 |
US6762618B1 (en) * | 2002-10-11 | 2004-07-13 | Lattice Semiconductor Corporation | Verify scheme for a multi-level routing structure |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4103182A (en) * | 1976-09-01 | 1978-07-25 | Hewlett-Packard Company | Programmable transfer gate array |
DE3009945A1 (de) * | 1979-03-15 | 1980-09-18 | Nippon Electric Co | Integrierter, logischer schaltkreis mit funktionspruefung |
DE3135368A1 (de) * | 1981-09-07 | 1983-03-31 | Siemens AG, 1000 Berlin und 8000 München | Verfahren und anordnung zur funktionspruefung einer programmierbare logikanordnung |
GB2121997B (en) * | 1982-06-11 | 1985-10-09 | Int Computers Ltd | Testing modular data processing systems |
US4525714A (en) * | 1982-12-03 | 1985-06-25 | Honeywell Information Systems Inc. | Programmable logic array with test capability in the unprogrammed state |
US4546473A (en) * | 1983-05-06 | 1985-10-08 | International Business Machines Corporation | Random pattern self test design |
US4598401A (en) * | 1984-05-03 | 1986-07-01 | Siemens Corporate Research & Support, Inc. | Circuit testing apparatus employing signature analysis |
GB8411733D0 (en) * | 1984-05-09 | 1984-06-13 | Gen Electric Co Plc | Integrated circuit testing arrangements |
US4713605A (en) * | 1984-05-17 | 1987-12-15 | Advanced Micro Devices, Inc. | Linear feedback shift register for circuit design technology validation |
JPH0766040B2 (ja) * | 1984-06-08 | 1995-07-19 | 株式会社アドバンテスト | プログラマブルロジツクアレイ試験器 |
GB8507611D0 (en) * | 1985-03-23 | 1985-05-01 | Int Computers Ltd | Testing programmable logic arrays |
US4672610A (en) * | 1985-05-13 | 1987-06-09 | Motorola, Inc. | Built in self test input generator for programmable logic arrays |
US4635261A (en) * | 1985-06-26 | 1987-01-06 | Motorola, Inc. | On chip test system for configurable gate arrays |
US4644192A (en) * | 1985-09-19 | 1987-02-17 | Harris Corporation | Programmable array logic with shared product terms and J-K registered outputs |
-
1986
- 1986-11-06 GB GB868626517A patent/GB8626517D0/en active Pending
-
1987
- 1987-09-09 EP EP87307947A patent/EP0266874B1/de not_active Expired - Lifetime
- 1987-09-09 DE DE87307947T patent/DE3786748T2/de not_active Expired - Fee Related
- 1987-09-30 US US07/102,717 patent/US4780627A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0266874B1 (de) | 1993-07-28 |
DE3786748T2 (de) | 1994-03-31 |
EP0266874A2 (de) | 1988-05-11 |
EP0266874A3 (en) | 1990-06-13 |
GB8626517D0 (en) | 1986-12-10 |
US4780627A (en) | 1988-10-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |