DE3777066D1 - Pruefeinrichtung. - Google Patents

Pruefeinrichtung.

Info

Publication number
DE3777066D1
DE3777066D1 DE8787308237T DE3777066T DE3777066D1 DE 3777066 D1 DE3777066 D1 DE 3777066D1 DE 8787308237 T DE8787308237 T DE 8787308237T DE 3777066 T DE3777066 T DE 3777066T DE 3777066 D1 DE3777066 D1 DE 3777066D1
Authority
DE
Germany
Prior art keywords
signals
test device
port network
characterising
microwave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8787308237T
Other languages
English (en)
Inventor
Christopher Malcolm Potter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Marconi Instruments Ltd
Original Assignee
Marconi Instruments Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Marconi Instruments Ltd filed Critical Marconi Instruments Ltd
Application granted granted Critical
Publication of DE3777066D1 publication Critical patent/DE3777066D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Polishing Bodies And Polishing Tools (AREA)
  • Glass Compositions (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Constitution Of High-Frequency Heating (AREA)
  • Plasma Technology (AREA)
  • Debugging And Monitoring (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Saccharide Compounds (AREA)
DE8787308237T 1986-10-21 1987-09-17 Pruefeinrichtung. Expired - Fee Related DE3777066D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8625154A GB2196745B (en) 1986-10-21 1986-10-21 Test arrangement

Publications (1)

Publication Number Publication Date
DE3777066D1 true DE3777066D1 (de) 1992-04-09

Family

ID=10606063

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787308237T Expired - Fee Related DE3777066D1 (de) 1986-10-21 1987-09-17 Pruefeinrichtung.

Country Status (6)

Country Link
US (1) US4777429A (de)
EP (1) EP0265073B1 (de)
JP (1) JPS63115070A (de)
AT (1) ATE73237T1 (de)
DE (1) DE3777066D1 (de)
GB (1) GB2196745B (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0321808A1 (de) * 1987-12-23 1989-06-28 BBC Brown Boveri AG Verfahren zum Messen eines Wellenwiderstandes und einer Ausbreitungskonstante eines Zweitors
US4958294A (en) * 1988-04-01 1990-09-18 Wavetek Microwave, Inc. Swept microwave power measurement system and method
JP2716193B2 (ja) * 1989-03-15 1998-02-18 ハウス食品株式会社 フルーツゼリー及びその製造方法
GB9006983D0 (en) * 1990-03-28 1990-05-23 Secr Defence Microwave testing
GB2281127A (en) * 1993-08-05 1995-02-22 Bcf Designs Ltd Method and apparatus for testing frequency-dependant electrical circuits
EP0841756A3 (de) * 1996-11-07 2001-11-28 Nokia Mobile Phones Ltd. Verbesserte Korrelatorschaltung für eine Sechs-Tor-Schaltung
GB2328027B (en) 1997-06-10 1999-12-08 Bcf Designs Ltd Method and apparatus for estimating the component values of low-pass frequency-dependent electrical circuits
GB9712051D0 (en) * 1997-06-10 1997-08-06 Bcf Designs Ltd Method and apparatus for testing frequency-dependent electrical circuits
US6421624B1 (en) * 1999-02-05 2002-07-16 Advantest Corp. Multi-port device analysis apparatus and method and calibration method thereof
DE69932705T2 (de) 1999-06-16 2007-08-16 Sony Deutschland Gmbh Empfänger mit N Toren
US7061251B2 (en) * 2004-01-15 2006-06-13 Bae Systems Information And Electronic Systems Integration Inc. Method and apparatus for transmission line and waveguide testing
WO2005069883A2 (en) * 2004-01-15 2005-08-04 Bae Systems Information And Electronic Systems Integration Inc. Method and apparatus for transmission line and waveguide testing
US7924025B2 (en) * 2005-07-25 2011-04-12 University Of Florida Research Foundation, Inc. System, device, and method for embedded S-parameter measurement
KR100956503B1 (ko) * 2005-09-01 2010-05-07 가부시키가이샤 무라타 세이사쿠쇼 피검체의 산란 계수의 측정방법 및 측정장치
US7671605B2 (en) * 2008-01-17 2010-03-02 Agilent Technologies, Inc. Large signal scattering functions from orthogonal phase measurements
US8874391B2 (en) * 2009-06-05 2014-10-28 Bae Systems Information And Electronic Systems Integration Inc. Distance-to-fault measurement system capable of measuring complex reflection coefficients
NO331964B1 (no) 2010-07-02 2012-05-14 Sinvent As Forenklet reflektometer for vektor nettverksanalysator

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2100526B (en) * 1981-05-21 1985-04-24 Secr Defence Improvements in or relating to impedance matching devices
US4521728A (en) * 1982-08-23 1985-06-04 Renato Bosisio Method and a six port network for use in determining complex reflection coefficients of microwave networks
GB8413339D0 (en) * 1984-05-24 1984-06-27 Secr Defence Six-port reflectometer

Also Published As

Publication number Publication date
GB2196745A (en) 1988-05-05
GB2196745B (en) 1990-05-16
GB8625154D0 (en) 1986-11-26
ATE73237T1 (de) 1992-03-15
EP0265073A1 (de) 1988-04-27
US4777429A (en) 1988-10-11
JPS63115070A (ja) 1988-05-19
EP0265073B1 (de) 1992-03-04

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee