DE3687348D1 - Zeitaequivalentes pseudozufalls-abtastsystem. - Google Patents
Zeitaequivalentes pseudozufalls-abtastsystem.Info
- Publication number
- DE3687348D1 DE3687348D1 DE8686308662T DE3687348T DE3687348D1 DE 3687348 D1 DE3687348 D1 DE 3687348D1 DE 8686308662 T DE8686308662 T DE 8686308662T DE 3687348 T DE3687348 T DE 3687348T DE 3687348 D1 DE3687348 D1 DE 3687348D1
- Authority
- DE
- Germany
- Prior art keywords
- pseudo random
- scan system
- time equivalent
- random scan
- equivalent pseudo
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/255—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with counting of pulses during a period of time proportional to voltage or current, delivered by a pulse generator with fixed frequency
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/22—Circuits therefor
- G01R13/32—Circuits for displaying non-recurrent functions such as transients; Circuits for triggering; Circuits for synchronisation; Circuits for time-base expansion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/22—Circuits therefor
- G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
-
- G—PHYSICS
- G04—HOROLOGY
- G04F—TIME-INTERVAL MEASURING
- G04F5/00—Apparatus for producing preselected time intervals for use as timing standards
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/858,424 US4678345A (en) | 1986-05-01 | 1986-05-01 | Equivalent time pseudorandom sampling system |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3687348D1 true DE3687348D1 (de) | 1993-02-04 |
DE3687348T2 DE3687348T2 (de) | 1993-07-08 |
Family
ID=25328291
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8686308662T Expired - Fee Related DE3687348T2 (de) | 1986-05-01 | 1986-11-06 | Zeitaequivalentes pseudozufalls-abtastsystem. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4678345A (de) |
EP (1) | EP0244537B1 (de) |
JP (1) | JPS62261963A (de) |
DE (1) | DE3687348T2 (de) |
Families Citing this family (47)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4799165A (en) * | 1986-03-03 | 1989-01-17 | Tektronix, Inc. | Level detecting waveform sampling system |
JPH0772707B2 (ja) * | 1986-04-03 | 1995-08-02 | 日産自動車株式会社 | 信号記憶装置 |
US4809189A (en) * | 1986-10-09 | 1989-02-28 | Tektronix, Inc. | Equivalent time waveform data display |
US4908784A (en) * | 1987-08-04 | 1990-03-13 | Wave Technologies, Inc. | Method and apparatus for asynchronous time measurement |
US4808936A (en) * | 1988-03-25 | 1989-02-28 | Tektronix, Inc. | Continuously variable clock delay circuit |
US5027298A (en) * | 1989-06-29 | 1991-06-25 | Genrad, Inc. | Low-dead-time interval timer |
US4996474A (en) * | 1989-07-31 | 1991-02-26 | Hewlett-Packard Company | Digital gate generation for a signal measurement instrument |
US5150337A (en) * | 1990-02-21 | 1992-09-22 | Applied Magnetics Corporation | Method and apparatus for measuring time elapsed between events |
EP0444875B1 (de) * | 1990-03-02 | 1997-05-14 | Hewlett-Packard Company | Verfahren und Anordnung zur Vergrösserung des Durchsatzes in Zufallsfolge zyklischer Digitalisierungssysteme |
US5122996A (en) * | 1990-08-09 | 1992-06-16 | Tektronix, Inc. | Real-time, uninterrupted time-interval to voltage converter |
US5566139A (en) * | 1993-09-20 | 1996-10-15 | The United States Of America As Represented By The United States National Aeronautics And Space Administration | Picosecond resolution sampling time interval unit |
JPH08201449A (ja) * | 1995-01-24 | 1996-08-09 | Advantest Corp | スペクトラムアナライザ |
JP3406439B2 (ja) * | 1995-10-24 | 2003-05-12 | 株式会社アドバンテスト | 可変遅延回路の遅延時間測定装置 |
US5764551A (en) * | 1996-10-15 | 1998-06-09 | The United States Of America As Represented By The Secretary Of The Army | Fast high-signal-to-noise ratio equivalent time processor |
US5812830A (en) * | 1996-11-14 | 1998-09-22 | Hewlett-Packard Company | Debug system with raw mode trigger capability |
US5959479A (en) * | 1997-09-11 | 1999-09-28 | Hewlett-Packard Company | Sampling timebase system |
JP3597389B2 (ja) * | 1997-10-20 | 2004-12-08 | 富士通株式会社 | 時刻制御装置 |
US6128754A (en) * | 1997-11-24 | 2000-10-03 | Schlumberger Technologies, Inc. | Tester having event generation circuit for acquiring waveform by supplying strobe events for waveform acquisition rather than using strobe events specified by the test program |
US6181267B1 (en) | 1998-09-30 | 2001-01-30 | Agilent Technologies Inc. | Internally triggered equivalent-time sampling system for signals having a predetermined data rate |
US6295315B1 (en) * | 1999-04-20 | 2001-09-25 | Arnold M. Frisch | Jitter measurement system and method |
FR2824976B1 (fr) * | 2001-05-16 | 2003-08-15 | Nortel Networks Ltd | Procede pour rendre compte de la distribution temporelle d'une succession d'evenements |
US6856924B2 (en) * | 2003-02-25 | 2005-02-15 | Agilent Technologies, Inc. | Mixer-based timebase for sampling multiple input signal references asynchronous to each other |
US6700516B1 (en) | 2003-02-25 | 2004-03-02 | Agilent Technologies, Inc. | Mixer-based timebase for signal sampling |
US7132766B2 (en) * | 2003-03-25 | 2006-11-07 | Rockwell Automation Technologies, Inc. | Method and apparatus for providing a switching signal in the presence of noise |
US20040195919A1 (en) * | 2003-04-02 | 2004-10-07 | Gasperi Michael Lee | Method and apparatus for providing a switching signal in the presence of noise |
US7409617B2 (en) * | 2004-09-30 | 2008-08-05 | Credence Systems Corporation | System for measuring characteristics of a digital signal |
US7627790B2 (en) * | 2003-08-21 | 2009-12-01 | Credence Systems Corporation | Apparatus for jitter testing an IC |
CZ294292B6 (cs) * | 2003-09-04 | 2004-11-10 | Petr Ing. Csc. Pánek | Zařízení pro měření časových intervalů |
US7708133B2 (en) * | 2003-11-07 | 2010-05-04 | Hewlett-Packard Development Company, L.P. | Flexible member tensioning |
US7284141B2 (en) * | 2004-02-05 | 2007-10-16 | Anritsu Company | Method of and apparatus for measuring jitter and generating an eye diagram of a high speed data signal |
DE102005035473A1 (de) * | 2005-07-28 | 2007-02-01 | Rohde & Schwarz Gmbh & Co. Kg | Verfahren und System zur digitalen Triggerung für Oszilloskope |
DE102005036855B4 (de) * | 2005-08-04 | 2016-11-17 | Rohde & Schwarz Gmbh & Co. Kg | Verfahren und System zur Triggerung von digitalisierten Signalen |
US20070248191A1 (en) * | 2006-04-25 | 2007-10-25 | Telefonaktiebolaget Lm Ericsson (Publ) | Baseband sample selection |
US7649492B2 (en) * | 2007-05-25 | 2010-01-19 | Niitek, Inc. | Systems and methods for providing delayed signals |
US7652619B1 (en) * | 2007-05-25 | 2010-01-26 | Niitek, Inc. | Systems and methods using multiple down-conversion ratios in acquisition windows |
US9316729B2 (en) * | 2007-05-25 | 2016-04-19 | Niitek, Inc. | Systems and methods for providing trigger timing |
US7675454B2 (en) * | 2007-09-07 | 2010-03-09 | Niitek, Inc. | System, method, and computer program product providing three-dimensional visualization of ground penetrating radar data |
US7804290B2 (en) * | 2007-09-14 | 2010-09-28 | Infineon Technologies, Ag | Event-driven time-interval measurement |
US8207885B2 (en) * | 2007-09-19 | 2012-06-26 | Niitek, Inc. | Adjustable pulse width ground penetrating radar |
US7986591B2 (en) * | 2009-08-14 | 2011-07-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Ultra high resolution timing measurement |
US8502522B2 (en) | 2010-04-28 | 2013-08-06 | Teradyne, Inc. | Multi-level triggering circuit |
US8531176B2 (en) | 2010-04-28 | 2013-09-10 | Teradyne, Inc. | Driving an electronic instrument |
US8098181B2 (en) | 2010-04-28 | 2012-01-17 | Teradyne, Inc. | Attenuator circuit |
US8542005B2 (en) | 2010-04-28 | 2013-09-24 | Teradyne, Inc. | Connecting digital storage oscilloscopes |
CN102565484B (zh) * | 2010-12-31 | 2015-12-02 | 北京普源精电科技有限公司 | 具有精细触发功能的数字示波器 |
GB2566437B (en) | 2017-07-26 | 2022-12-07 | Sezanne Marine Ltd | Systems and methods for acoustic and/or electromagnetic imaging |
CN111756376B (zh) * | 2020-06-24 | 2023-08-15 | 苏州瑞迈斯科技有限公司 | 信号采样装置、系统及方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL168944C (nl) * | 1969-05-26 | Tektronix Inc | Inrichting voor het weergeven van een periodiek optredend elektrisch signaal op het beeldscherm van een kathodestraaloscillograaf. | |
US4165459A (en) * | 1978-01-16 | 1979-08-21 | Rca Corporation | Time interval measurement |
US4164648A (en) * | 1978-06-23 | 1979-08-14 | Hewlett-Packard Company | Double vernier time interval measurement using triggered phase-locked oscillators |
US4213134A (en) * | 1979-02-26 | 1980-07-15 | The University Of Akron | Circuit and method for the recorder display of high frequency periodic signals |
US4383166A (en) * | 1980-03-31 | 1983-05-10 | Hewlett-Packard Company | Automatic echo-chamber for measuring single time intervals by replication and averaging |
US4507740A (en) * | 1981-09-08 | 1985-03-26 | Grumman Aerospace Corporation | Programmable signal analyzer |
JPS58144760A (ja) * | 1982-02-24 | 1983-08-29 | Hitachi Ltd | 位相差有無検出装置 |
-
1986
- 1986-05-01 US US06/858,424 patent/US4678345A/en not_active Expired - Lifetime
- 1986-11-06 EP EP86308662A patent/EP0244537B1/de not_active Expired - Lifetime
- 1986-11-06 DE DE8686308662T patent/DE3687348T2/de not_active Expired - Fee Related
-
1987
- 1987-04-29 JP JP62106161A patent/JPS62261963A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
US4678345A (en) | 1987-07-07 |
EP0244537A2 (de) | 1987-11-11 |
JPS62261963A (ja) | 1987-11-14 |
EP0244537B1 (de) | 1992-12-23 |
EP0244537A3 (en) | 1990-05-09 |
DE3687348T2 (de) | 1993-07-08 |
JPH0463345B2 (de) | 1992-10-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |