DE3681818D1 - Verfahren und vorrichtung fuer die dimensionale analyse an tubularobjekten in fortlaufender produktion. - Google Patents

Verfahren und vorrichtung fuer die dimensionale analyse an tubularobjekten in fortlaufender produktion.

Info

Publication number
DE3681818D1
DE3681818D1 DE8686106192T DE3681818T DE3681818D1 DE 3681818 D1 DE3681818 D1 DE 3681818D1 DE 8686106192 T DE8686106192 T DE 8686106192T DE 3681818 T DE3681818 T DE 3681818T DE 3681818 D1 DE3681818 D1 DE 3681818D1
Authority
DE
Germany
Prior art keywords
dimensional analysis
flaw detection
continuous production
tubular products
tubular objects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8686106192T
Other languages
English (en)
Inventor
Morris Taylor
Ira L Morgan
Hunter D Ellinger
Forrest F Hopkins
Thomas Stephens
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SCIENT MEASUREMENT SYSTEMS I L
Original Assignee
SCIENT MEASUREMENT SYSTEMS I L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SCIENT MEASUREMENT SYSTEMS I L filed Critical SCIENT MEASUREMENT SYSTEMS I L
Application granted granted Critical
Publication of DE3681818D1 publication Critical patent/DE3681818D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement Of Radiation (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
DE8686106192T 1985-05-09 1986-05-06 Verfahren und vorrichtung fuer die dimensionale analyse an tubularobjekten in fortlaufender produktion. Expired - Fee Related DE3681818D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/732,301 US4725963A (en) 1985-05-09 1985-05-09 Method and apparatus for dimensional analysis and flaw detection of continuously produced tubular objects

Publications (1)

Publication Number Publication Date
DE3681818D1 true DE3681818D1 (de) 1991-11-14

Family

ID=24942998

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686106192T Expired - Fee Related DE3681818D1 (de) 1985-05-09 1986-05-06 Verfahren und vorrichtung fuer die dimensionale analyse an tubularobjekten in fortlaufender produktion.

Country Status (6)

Country Link
US (1) US4725963A (de)
EP (1) EP0201849B1 (de)
AT (1) ATE68260T1 (de)
AU (1) AU588593B2 (de)
CA (1) CA1238989A (de)
DE (1) DE3681818D1 (de)

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US6925145B2 (en) * 2003-08-22 2005-08-02 General Electric Company High speed digital radiographic inspection of piping
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DE102004034502A1 (de) * 2004-07-16 2006-02-09 Siemens Ag Verfahren zur Rekonstruktion von Schnittbildern aus Detektormessdaten eines Tomographiegerätes
US20060025390A1 (en) * 2004-07-28 2006-02-02 Roby Russell R Treatment of hormone allergy and related symptoms and disorders
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US7481579B2 (en) * 2006-03-27 2009-01-27 Jordan Valley Applied Radiation Ltd. Overlay metrology using X-rays
US20070274447A1 (en) * 2006-05-15 2007-11-29 Isaac Mazor Automated selection of X-ray reflectometry measurement locations
US7406153B2 (en) * 2006-08-15 2008-07-29 Jordan Valley Semiconductors Ltd. Control of X-ray beam spot size
WO2008039056A1 (en) * 2006-09-25 2008-04-03 Röntgen Technische Dienst Arrangement and method for non destructive measurement of wall thickness and surface shapes of objects with inner surface
IL180482A0 (en) * 2007-01-01 2007-06-03 Jordan Valley Semiconductors Inspection of small features using x - ray fluorescence
CN100462051C (zh) * 2007-05-24 2009-02-18 上海交通大学 多源螺旋ct并行重建系统
US7680243B2 (en) * 2007-09-06 2010-03-16 Jordan Valley Semiconductors Ltd. X-ray measurement of properties of nano-particles
US7706912B2 (en) * 2007-11-30 2010-04-27 Caterpillar Inc. Orifice formation control system
US20110029114A1 (en) * 2009-07-29 2011-02-03 General Electric Company Method, system and computer program product for producing a test article having embedded features for nondestructive evaluation
US8243878B2 (en) 2010-01-07 2012-08-14 Jordan Valley Semiconductors Ltd. High-resolution X-ray diffraction measurement with enhanced sensitivity
US8687766B2 (en) 2010-07-13 2014-04-01 Jordan Valley Semiconductors Ltd. Enhancing accuracy of fast high-resolution X-ray diffractometry
US8437450B2 (en) 2010-12-02 2013-05-07 Jordan Valley Semiconductors Ltd. Fast measurement of X-ray diffraction from tilted layers
US8781070B2 (en) 2011-08-11 2014-07-15 Jordan Valley Semiconductors Ltd. Detection of wafer-edge defects
US9390984B2 (en) 2011-10-11 2016-07-12 Bruker Jv Israel Ltd. X-ray inspection of bumps on a semiconductor substrate
JP2015501435A (ja) 2011-11-02 2015-01-15 ジョンソン、マッセイ、パブリック、リミテッド、カンパニーＪｏｈｎｓｏｎ Ｍａｔｔｈｅｙ Ｐｕｂｌｉｃｌｉｍｉｔｅｄ Ｃｏｍｐａｎｙ スキャン方法及び装置
JP5919949B2 (ja) * 2012-03-28 2016-05-18 住友電気工業株式会社 ケーブル解析システム、ケーブル解析方法及びコンピュータプログラム
US9389192B2 (en) 2013-03-24 2016-07-12 Bruker Jv Israel Ltd. Estimation of XRF intensity from an array of micro-bumps
US9551677B2 (en) 2014-01-21 2017-01-24 Bruker Jv Israel Ltd. Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)
US9632043B2 (en) 2014-05-13 2017-04-25 Bruker Jv Israel Ltd. Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRF
US9726624B2 (en) 2014-06-18 2017-08-08 Bruker Jv Israel Ltd. Using multiple sources/detectors for high-throughput X-ray topography measurement
FR3022668B1 (fr) * 2014-06-19 2016-07-15 Centre Nat Rech Scient Systeme de tomographie dynamique dit "4d"
US9244024B1 (en) * 2014-08-01 2016-01-26 Ihi Southwest Technologies, Inc. Apparatus and method for digital radiographic inspection of pipes
US9829448B2 (en) 2014-10-30 2017-11-28 Bruker Jv Israel Ltd. Measurement of small features using XRF
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EA035901B1 (ru) * 2016-07-12 2020-08-28 Ю.Эс. СТИЛ ТЬЮБЬЮЛАР ПРОДАКТС, ИНК. Способы и системы измерения и контроля трубных изделий
HUP1600469A2 (en) * 2016-07-27 2018-01-29 Peter Teleki Method for determining the geometric parameters and/or material state of a specimen based on in-situ radiographic imaging
EP3764089A1 (de) * 2019-07-11 2021-01-13 Direct Conversion AB Röntgenstrahlenschweissnahtinspektion
CN112730483A (zh) * 2021-02-24 2021-04-30 中国计量大学 一种电缆无损检测装置
CA3228246A1 (en) 2021-08-13 2023-02-16 Bryan R. Duerfeldt Radiography inspection and fail-safe mechanism for pipe traversing robots

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JPS6042401B2 (ja) * 1979-09-26 1985-09-21 富士電機株式会社 管状材の管壁厚み測定方法
FR2512553A1 (fr) * 1981-09-10 1983-03-11 Commissariat Energie Atomique Systeme de controle non destructif de la structure interne d'objets

Also Published As

Publication number Publication date
AU5732086A (en) 1986-11-13
CA1238989A (en) 1988-07-05
EP0201849A3 (en) 1988-07-20
US4725963A (en) 1988-02-16
EP0201849B1 (de) 1991-10-09
EP0201849A2 (de) 1986-11-20
AU588593B2 (en) 1989-09-21
ATE68260T1 (de) 1991-10-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee