DE3587229T2 - Integriertes schaltungsgeraet. - Google Patents

Integriertes schaltungsgeraet.

Info

Publication number
DE3587229T2
DE3587229T2 DE19853587229 DE3587229T DE3587229T2 DE 3587229 T2 DE3587229 T2 DE 3587229T2 DE 19853587229 DE19853587229 DE 19853587229 DE 3587229 T DE3587229 T DE 3587229T DE 3587229 T2 DE3587229 T2 DE 3587229T2
Authority
DE
Germany
Prior art keywords
integrated circuit
circuit device
integrated
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19853587229
Other languages
English (en)
Other versions
DE3587229D1 (de
Inventor
Akira Kanuma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of DE3587229D1 publication Critical patent/DE3587229D1/de
Application granted granted Critical
Publication of DE3587229T2 publication Critical patent/DE3587229T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Information Transfer Systems (AREA)
  • Memory System (AREA)
  • Communication Control (AREA)
DE19853587229 1984-08-28 1985-08-22 Integriertes schaltungsgeraet. Expired - Fee Related DE3587229T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59178635A JPS6155747A (ja) 1984-08-28 1984-08-28 デ−タ転送制御回路を備えたデイジタル集積回路

Publications (2)

Publication Number Publication Date
DE3587229D1 DE3587229D1 (de) 1993-05-06
DE3587229T2 true DE3587229T2 (de) 1993-07-08

Family

ID=16051905

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19853587229 Expired - Fee Related DE3587229T2 (de) 1984-08-28 1985-08-22 Integriertes schaltungsgeraet.

Country Status (3)

Country Link
EP (1) EP0173257B1 (de)
JP (1) JPS6155747A (de)
DE (1) DE3587229T2 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6964828B2 (en) 2001-04-27 2005-11-15 3M Innovative Properties Company Cathode compositions for lithium-ion batteries

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5352029A (en) * 1976-10-22 1978-05-12 Fujitsu Ltd Arithmetic circuit unit
US4127768A (en) * 1977-01-03 1978-11-28 Honeywell Information Systems Inc. Data processing system self-test enabling technique
US4355389A (en) * 1977-03-15 1982-10-19 Tokyo Shibaura Electric Co., Ltd. Microprogrammed information processing system having self-checking function
JPS6029980B2 (ja) * 1978-06-13 1985-07-13 富士通株式会社 テスト・モ−ド設定機能をもつワンチツプ・マイクロ・コンピユ−タ
US4467420A (en) * 1981-03-20 1984-08-21 Fujitsu Limited One-chip microcomputer
JPS58127255A (ja) * 1982-01-25 1983-07-29 Toshiba Corp マイクロコンピユ−タのテスト回路
JPS58154054A (ja) * 1982-03-10 1983-09-13 Hitachi Ltd 外部記憶装置制御用回路

Also Published As

Publication number Publication date
DE3587229D1 (de) 1993-05-06
EP0173257A2 (de) 1986-03-05
JPS6155747A (ja) 1986-03-20
EP0173257A3 (en) 1988-07-20
EP0173257B1 (de) 1993-03-31

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee