DE3485749D1 - Laser mit stabilisierter externer passiver kavitaet. - Google Patents

Laser mit stabilisierter externer passiver kavitaet.

Info

Publication number
DE3485749D1
DE3485749D1 DE8484113707T DE3485749T DE3485749D1 DE 3485749 D1 DE3485749 D1 DE 3485749D1 DE 8484113707 T DE8484113707 T DE 8484113707T DE 3485749 T DE3485749 T DE 3485749T DE 3485749 D1 DE3485749 D1 DE 3485749D1
Authority
DE
Germany
Prior art keywords
laser
cavity
mirrors
passive cavity
passive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8484113707T
Other languages
English (en)
Inventor
Robert G Knollenberg
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Particle Measuring Systems Inc
Original Assignee
Particle Measuring Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Particle Measuring Systems Inc filed Critical Particle Measuring Systems Inc
Application granted granted Critical
Publication of DE3485749D1 publication Critical patent/DE3485749D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/05Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
    • H01S3/08Construction or shape of optical resonators or components thereof
    • H01S3/081Construction or shape of optical resonators or components thereof comprising three or more reflectors
    • H01S3/082Construction or shape of optical resonators or components thereof comprising three or more reflectors defining a plurality of resonators, e.g. for mode selection or suppression
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/13Stabilisation of laser output parameters, e.g. frequency or amplitude
    • H01S3/139Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0205Investigating particle size or size distribution by optical means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G01N2021/391Intracavity sample

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Lasers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Laser Surgery Devices (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
DE8484113707T 1983-11-17 1984-11-13 Laser mit stabilisierter externer passiver kavitaet. Expired - Lifetime DE3485749D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/552,689 US4594715A (en) 1983-11-17 1983-11-17 Laser with stabilized external passive cavity

Publications (1)

Publication Number Publication Date
DE3485749D1 true DE3485749D1 (de) 1992-07-02

Family

ID=24206377

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484113707T Expired - Lifetime DE3485749D1 (de) 1983-11-17 1984-11-13 Laser mit stabilisierter externer passiver kavitaet.

Country Status (6)

Country Link
US (1) US4594715A (de)
EP (1) EP0142815B1 (de)
JP (1) JP2554614B2 (de)
AT (1) ATE76704T1 (de)
CA (1) CA1228148A (de)
DE (1) DE3485749D1 (de)

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US4798465B2 (en) * 1986-04-14 1994-08-30 Particle Measuring Syst Particle size detection device having high sensitivity in high molecular scattering environment
DE3930642C2 (de) * 1988-09-13 1999-09-23 Particle Measuring Syst Hochempfindlicher Teilchengrößendetektor mit Rauschunterdrückung
US5153671A (en) * 1990-05-11 1992-10-06 Boc Health Care, Inc. Gas analysis system having buffer gas inputs to protect associated optical elements
US5245405A (en) * 1990-05-11 1993-09-14 Boc Health Care, Inc. Constant pressure gas cell
US5135304A (en) * 1990-05-11 1992-08-04 Boc Health Care, Inc. Gas analysis system having buffer gas inputs to protect associated optical elements
JP3564705B2 (ja) * 1992-03-02 2004-09-15 ソニー株式会社 レーザ光発生装置
US5315603A (en) * 1993-01-11 1994-05-24 The United States Of America As Represented By The Secretary Of The Air Force Backscatter absorption for laser diodes
US5726753A (en) * 1996-02-26 1998-03-10 Research Electro-Optics, Inc. Intracavity particle detection using optically pumped laser media
US5751422A (en) * 1996-02-26 1998-05-12 Particle Measuring Systems, Inc. In-situ particle detection utilizing optical coupling
US5642193A (en) * 1996-03-08 1997-06-24 Met One, Inc. Particle counter employing a solid-state laser with an intracavity view volume
US5920388A (en) * 1996-10-15 1999-07-06 Research Electro-Optics, Inc. Small particle characteristic determination
US5946092A (en) * 1998-02-27 1999-08-31 Pacific Scientific Instruments Company Dual laser heterodyne optical particle detection technique
US7796255B2 (en) * 2007-03-23 2010-09-14 Particle Measuring Systems, Inc. Optical particle sensor with exhaust-cooled optical source
US8154724B2 (en) 2007-12-04 2012-04-10 Particle Measuring Systems, Inc. Two-dimensional optical imaging methods and systems for particle detection
US8800383B2 (en) 2009-08-24 2014-08-12 Particle Measuring Systems, Inc. Flow monitored particle sensor
US10352844B2 (en) 2013-03-15 2019-07-16 Particles Plus, Inc. Multiple particle sensors in a particle counter
US11579072B2 (en) 2013-03-15 2023-02-14 Particles Plus, Inc. Personal air quality monitoring system
US10983040B2 (en) 2013-03-15 2021-04-20 Particles Plus, Inc. Particle counter with integrated bootloader
US9677990B2 (en) 2014-04-30 2017-06-13 Particles Plus, Inc. Particle counter with advanced features
ITRM20130128U1 (it) 2013-07-23 2015-01-24 Particle Measuring Systems S R L Dispositivo per il campionamento microbico dell'aria
WO2015148148A1 (en) 2014-03-14 2015-10-01 Particle Measuring Systems, Inc. Pressure-based airflow sensing in particle impactor systems
US9631222B2 (en) 2014-03-14 2017-04-25 Particle Measuring Systems, Inc. Filter and blower geometry for particle sampler
CN111247418A (zh) 2017-10-26 2020-06-05 粒子监测系统有限公司 粒子测量系统和方法
US11320360B2 (en) 2018-08-31 2022-05-03 Particle Measuring Systems, Inc. Fluid refractive index optimizing particle counter
CN112639444A (zh) 2018-09-04 2021-04-09 粒子监测系统有限公司 检测生产设备和表面上的纳米粒子
US10855047B1 (en) 2018-11-06 2020-12-01 United States Of America As Represented By The Secretary Of The Air Force Passively cavity-dumped laser apparatus, system and methods
US11385161B2 (en) 2018-11-12 2022-07-12 Particle Measuring Systems, Inc. Calibration verification for optical particle analyzers
US11181455B2 (en) 2018-11-12 2021-11-23 Particle Measuring Systems, Inc. Calibration verification for optical particle analyzers
US10908059B2 (en) 2018-11-16 2021-02-02 Particle Measuring Systems, Inc. Slurry monitor coupling bulk size distribution and single particle detection
JP7436473B2 (ja) 2018-11-16 2024-02-21 パーティクル・メージャーリング・システムズ・インコーポレーテッド ロボット制御製造バリアシステムのための粒子サンプリングシステム及び方法
CN113692529A (zh) 2019-04-25 2021-11-23 粒子监测系统有限公司 用于轴上粒子检测和/或差分检测的粒子检测系统和方法
JP2022550418A (ja) 2019-10-07 2022-12-01 パーティクル・メージャーリング・システムズ・インコーポレーテッド 抗菌粒子検出器
US10997845B2 (en) 2019-10-07 2021-05-04 Particle Measuring Systems, Inc. Particle detectors with remote alarm monitoring and control
IT201900020248A1 (it) 2019-11-04 2021-05-04 Particle Measuring Systems S R L Dispositivo di monitoraggio mobile per aree a contaminazione controllata
KR20220099954A (ko) 2019-11-22 2022-07-14 파티클 머슈어링 시스템즈, 인크. 간섭 입자 검출 및 작은 크기의 입자들 검출을 위한 고급 시스템 및 방법
TWI829492B (zh) 2020-01-21 2024-01-11 美商粒子監測系統有限公司 撞擊器及用於對來自一流體流之生物顆粒取樣之方法
US11988591B2 (en) 2020-07-01 2024-05-21 Particles Plus, Inc. Modular optical particle counter sensor and apparatus

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3406289A (en) * 1965-11-10 1968-10-15 Univ Iowa State Res Found Inc Laser small-particle detector and method
US3534289A (en) * 1967-02-06 1970-10-13 Xerox Corp Laser system with optical discriminator
US3718868A (en) * 1970-07-20 1973-02-27 Univ Case Western Reserve I{11 {11 {11 {11 INVERTED LAMB DIP STABILIZED He-Ne LASER
BE789352A (fr) * 1971-09-27 1973-01-15 Siemens Ag Procede pour la stabilisation de la frequence d'un laser
US3833308A (en) * 1973-08-01 1974-09-03 Mead Corp Binder fixture
JPS5229912A (en) * 1975-09-03 1977-03-07 Hitachi Ltd Slipping detection system for induction motor
JPS5837712B2 (ja) * 1975-09-23 1983-08-18 三洋電機株式会社 キタイレ−ザソウチ
JPS5424277A (en) * 1977-07-26 1979-02-23 Mitsubishi Heavy Ind Ltd Wet desulfurizing method for exhaust combustion gas
GB2057181B (en) * 1979-08-16 1983-08-24 Plessey Co Ltd Gas laser arrangements

Also Published As

Publication number Publication date
EP0142815A3 (en) 1987-10-14
JPS60160190A (ja) 1985-08-21
ATE76704T1 (de) 1992-06-15
CA1228148A (en) 1987-10-13
EP0142815A2 (de) 1985-05-29
EP0142815B1 (de) 1992-05-27
JP2554614B2 (ja) 1996-11-13
US4594715A (en) 1986-06-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee